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1.Method and system for correcting errors in electronic memory devices 有权
Title translation: 在电子存储器纠错方法和装置公开(公告)号:EP1612949B1
公开(公告)日:2010-04-21
申请号:EP04425485.2
申请日:2004-06-30
Applicant: STMicroelectronics Srl
Inventor: Marelli, Alessia , Ravasio, Roberto , Micheloni, Rino
CPC classification number: H03M13/152 , H03M13/1575 , H03M13/3707 , H03M13/6502
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公开(公告)号:EP1750277B1
公开(公告)日:2010-05-19
申请号:EP05425559.1
申请日:2005-07-28
Applicant: STMicroelectronics Srl , Hynix Semiconductor Inc.
Inventor: Bovino, Angelo , Ravasio, Roberto , Micheloni, Rino
CPC classification number: G11C11/5621 , G11C16/20
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3.A circuit for programming a non-volatile memory device with adaptive program load control 有权
Title translation: 用于与自适应负载控制程序的非易失性存储器器件的编程电路公开(公告)号:EP1420415B1
公开(公告)日:2016-01-06
申请号:EP03104130.4
申请日:2003-11-10
Applicant: STMicroelectronics Srl
Inventor: Micheloni, Rino , Ravasio, Roberto
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4.Row decoder for a flash-EEPROM memory device with the possibility of selective erasing of a sub-group of rows of a sector 失效
Title translation: 行译码器对于快闪EEPROM存储器阵列的扇区的行子集的选择性缺失的可能性公开(公告)号:EP0920023B1
公开(公告)日:2010-06-30
申请号:EP97830625.6
申请日:1997-11-26
Applicant: STMicroelectronics Srl
Inventor: Campardo, Giovanni , Micheloni, Rino
CPC classification number: G11C16/08
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5.
公开(公告)号:EP1883076B1
公开(公告)日:2011-12-21
申请号:EP06425536.7
申请日:2006-07-28
Applicant: STMicroelectronics Srl , Hynix Semiconductor Inc.
Inventor: Crippa, Luca , Ravasio, Roberto , Micheloni, Rino
CPC classification number: G11C16/10 , G11C7/18 , G11C11/5628 , G11C16/0483 , G11C16/24 , G11C16/3427
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6.Level shifter for semiconductor memory device implemented with low-voltage transistors 有权
Title translation: 与低电压晶体管实现电平转换器的半导体存储器件公开(公告)号:EP1835507B1
公开(公告)日:2010-08-18
申请号:EP06111337.9
申请日:2006-03-17
Applicant: STMicroelectronics Srl
Inventor: Campardo, Giovanni , Micheloni, Rino
CPC classification number: G11C5/145 , G11C7/1051 , G11C7/1057 , G11C7/1078 , G11C7/1084 , G11C8/08 , G11C16/08 , G11C16/12 , H03K3/356113
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7.Method of fixing read evaluation time in a non volatile nand type memory device 有权
Title translation: 设定评价的读出时间在非易失性NAND存储器装置的方法中,公开(公告)号:EP1901309B1
公开(公告)日:2010-04-28
申请号:EP06425631.6
申请日:2006-09-13
Applicant: STMicroelectronics Srl , Hynix Semiconductor Inc.
Inventor: Crippa, Luca , Ravasio, Roberto , Micheloni, Rino
CPC classification number: G11C29/02 , G11C16/04 , G11C29/023 , G11C29/025 , G11C29/028 , G11C29/50012 , G11C2029/1204
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8.A non-volatile, electrically-programmable memory with a plurality of storage densities and data transfer speeds 有权
Title translation: 具有多个密度和数据传输速率的非易失性的,电可编程存储器公开(公告)号:EP1892720B1
公开(公告)日:2011-07-27
申请号:EP06119479.1
申请日:2006-08-24
Applicant: STMicroelectronics Srl , Hynix Semiconductor Inc.
Inventor: Micheloni, Rino , Ravasio, Roberto
CPC classification number: G11C11/5628 , G11C16/0483 , G11C16/3418 , G11C2211/5641
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9.Multistage regulator for charge-pump boosted voltage applications 有权
Title translation: 在应用电荷泵升压多级控制公开(公告)号:EP1750271B1
公开(公告)日:2011-05-11
申请号:EP05425558.3
申请日:2005-07-28
Applicant: STMicroelectronics Srl , Hynix Semiconductor Inc.
Inventor: Crippa, Luca , Sangalli, Miriam , Ragone, Giancarlo , Micheloni, Rino
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10.Method for replacing failed non-volatile memory cells and corresponding memory device 有权
Title translation: 一种用于替换失效非易失性存储单元和相应的存储器阵列的方法公开(公告)号:EP1403879B1
公开(公告)日:2010-11-03
申请号:EP02425591.1
申请日:2002-09-30
Applicant: STMicroelectronics Srl
Inventor: Campardo, Giovanni , Micheloni, Rino
CPC classification number: G11C29/82 , G11C16/04 , G11C16/16 , G11C29/44 , G11C2029/1208
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