公开(公告)号：EP4170427A1

公开(公告)日：2023-04-26

申请号：EP21826892.8

申请日：2021-05-13

Applicant: TOPCON CORPORATION

Inventor： SHIMIZU Hitoshi ,  OMORI Kazuhiro ,  TSUKADA Hisashi

IPC: G03B35/02 ,  G02B21/06 ,  G02B21/36 ,  A61B3/135 ,  H04N13/388

Abstract: A slit lamp microscope 1 according to an exemplary embodiment includes a scanning unit (lighting system 2, imaging system 3, and movement mechanism 6), an image group evaluation unit 81 (data processing unit 8), and a control unit 7. The scanning unit scans, with slit light, an anterior eye part of an eye E being inspected, and collects an image group. The image group evaluation unit 81 evaluates the quality of the image group collected by the scanning unit. The control unit 7 selectively executes two or more prescribed controls in accordance with the quality evaluation result acquired by a first evaluation unit. For example, the control unit 7 performs a control for applying a new scan to the anterior eye part when the quality is evaluated to be unsatisfactory, and performs a control for transmitting the image group to an external device when the quality is evaluated to be satisfactory.