公开(公告)号：EP4029432A1

公开(公告)日：2022-07-20

申请号：EP20862734.9

申请日：2020-08-31

Applicant: TOPCON CORPORATION

Inventor： LIU Jonathan ,  SHIMIZU Hitoshi ,  TSUKADA Hisashi

IPC: A61B3/135

Abstract: The slit lamp microscope according to an exemplary embodiment comprises a scanning unit and a data processing unit. The scanning unit scans an anterior segment of an eye under examination with slit light to collect a plurality of sectional images. The data processing unit generates cloudiness distribution information which shows the distribution of clouded parts in the lens of the eye under examination on the basis of the plurality of sectional images collected by the scanning unit.

公开(公告)号：EP4094675A1

公开(公告)日：2022-11-30

申请号：EP20915808.8

申请日：2020-07-10

Applicant: TOPCON CORPORATION

Inventor： SUZUKI Masaya ,  NAKAJIMA Masashi ,  SHIMIZU Hitoshi

IPC: A61B3/12

Abstract: This ophthalmic device includes a light source, an illumination optical system, an optical scanner, an imaging optical system, and a control unit. The illumination optical system generates slit-shaped illumination light using light from the light source. The optical scanner deflects and guides the illumination light to the fundus of an eye being examined. The imaging optical system guides return light of the illumination light from the fundus to an image sensor. The control unit controls the image sensor in a rolling shutter manner. The illumination optical system comprises: a slit having a slit-shaped opening that can be positioned substantially optically conjugate with the fundus; an iris aperture that is positioned between the light source and the slit and can be positioned substantially optically conjugate with the iris of the eye being examined; and an optical element that is positioned between the light source and the iris aperture and deflects light from the light source.

公开(公告)号：EP4170427A1

公开(公告)日：2023-04-26

申请号：EP21826892.8

申请日：2021-05-13

Applicant: TOPCON CORPORATION

Inventor： SHIMIZU Hitoshi ,  OMORI Kazuhiro ,  TSUKADA Hisashi

IPC: G03B35/02 ,  G02B21/06 ,  G02B21/36 ,  A61B3/135 ,  H04N13/388

Abstract: A slit lamp microscope 1 according to an exemplary embodiment includes a scanning unit (lighting system 2, imaging system 3, and movement mechanism 6), an image group evaluation unit 81 (data processing unit 8), and a control unit 7. The scanning unit scans, with slit light, an anterior eye part of an eye E being inspected, and collects an image group. The image group evaluation unit 81 evaluates the quality of the image group collected by the scanning unit. The control unit 7 selectively executes two or more prescribed controls in accordance with the quality evaluation result acquired by a first evaluation unit. For example, the control unit 7 performs a control for applying a new scan to the anterior eye part when the quality is evaluated to be unsatisfactory, and performs a control for transmitting the image group to an external device when the quality is evaluated to be satisfactory.

公开(公告)号：EP3942995A1

公开(公告)日：2022-01-26

申请号：EP20773788.3

申请日：2020-03-05

Applicant: TOPCON CORPORATION

Inventor： SHIMIZU Hitoshi ,  OHMORI Kazuhiro

IPC: A61B3/135 ,  G02B21/00

Abstract: The slit lamp microscope according to an exemplary embodiment comprises an illumination system and an imaging system. The illumination system radiates slit light to the anterior ocular segment of a subject eye. The imaging system includes an optical system for guiding light from the anterior ocular segment irradiated by the slit light, and an imaging element for receiving light guided by the optical system on an imaging plane. An object plane which includes the focus of the illumination system displaced by the refractive index of the tissue of the anterior ocular segment, a principal plane of the optical system, and the imaging plane are arranged so as to satisfy the Scheimpflug condition.