公开(公告)号：EP4029432A1

公开(公告)日：2022-07-20

申请号：EP20862734.9

申请日：2020-08-31

Applicant: TOPCON CORPORATION

Inventor： LIU Jonathan ,  SHIMIZU Hitoshi ,  TSUKADA Hisashi

IPC: A61B3/135

Abstract: The slit lamp microscope according to an exemplary embodiment comprises a scanning unit and a data processing unit. The scanning unit scans an anterior segment of an eye under examination with slit light to collect a plurality of sectional images. The data processing unit generates cloudiness distribution information which shows the distribution of clouded parts in the lens of the eye under examination on the basis of the plurality of sectional images collected by the scanning unit.

公开(公告)号：EP4170427A1

公开(公告)日：2023-04-26

申请号：EP21826892.8

申请日：2021-05-13

Applicant: TOPCON CORPORATION

Inventor： SHIMIZU Hitoshi ,  OMORI Kazuhiro ,  TSUKADA Hisashi

IPC: G03B35/02 ,  G02B21/06 ,  G02B21/36 ,  A61B3/135 ,  H04N13/388

Abstract: A slit lamp microscope 1 according to an exemplary embodiment includes a scanning unit (lighting system 2, imaging system 3, and movement mechanism 6), an image group evaluation unit 81 (data processing unit 8), and a control unit 7. The scanning unit scans, with slit light, an anterior eye part of an eye E being inspected, and collects an image group. The image group evaluation unit 81 evaluates the quality of the image group collected by the scanning unit. The control unit 7 selectively executes two or more prescribed controls in accordance with the quality evaluation result acquired by a first evaluation unit. For example, the control unit 7 performs a control for applying a new scan to the anterior eye part when the quality is evaluated to be unsatisfactory, and performs a control for transmitting the image group to an external device when the quality is evaluated to be satisfactory.