SHEET DEFECT INSPECTING DEVICE AND SHEET MANUFACTURING METHOD

    公开(公告)号:JP2002310924A

    公开(公告)日:2002-10-23

    申请号:JP2001118397

    申请日:2001-04-17

    Abstract: PROBLEM TO BE SOLVED: To provide a sheet defect inspecting device with high accuracy in distinguishing defects capable of highly accurately determining the size of defects, especially pinhole, membrane, and air bubble defects which occur on a sheet, highly accurately distinguishing the defects, and reducing over detection of the defects. SOLUTION: In the defect inspecting device for detecting defect signals from among signals outputted from a light receiving part, a light source is arranged on one surface side of the sheet transferred by a sheet transfer means, and the light receiving part with an image pickup element is arranged on the other surface side. A plate for correcting the quantity of light is provided between the light source and the sheet.

Patent Agency Ranking