91.
    外观设计
    有权

    公开(公告)号:KR3009180260000S

    公开(公告)日:2017-08-08

    申请号:KR3020160053008

    申请日:2016-11-04

    Designer: 김대정

    92.
    外观设计
    有权

    公开(公告)号:KR3009159210000S

    公开(公告)日:2017-07-24

    申请号:KR3020160053420

    申请日:2016-11-07

    Designer: 김대정

    반도체 메모리 장치 및 이의 리프레쉬 방법
    97.
    发明公开
    반도체 메모리 장치 및 이의 리프레쉬 방법 审中-实审
    半导体存储器件及其刷新方法

    公开(公告)号:KR1020140113191A

    公开(公告)日:2014-09-24

    申请号:KR1020130028268

    申请日:2013-03-15

    Abstract: According to the present invention, a semiconductor memory device includes: a normal memory cell block including a plurality of normal memory cells; a redundancy memory cell block including a plurality of redundancy memory cells for replacing repair memory cells of the normal memory cells; a weak cell information storage unit configured to, in response to a refresh command, store information on weak memory cells included in the normal and redundancy memory cell blocks; and a refresh control circuit configured to control memory cells corresponding to a refresh address among the normal memory cells and the redundancy memory cells to be refreshed and to control weak memory cells to be refreshed based on information on at least one weak memory cell stored in the weak cell information storage unit, wherein the weak memory cells are additionally refreshed at least once more than other memory cells by the refresh control circuit during a refresh cycle of the normal memory cells.

    Abstract translation: 根据本发明,半导体存储器件包括:包括多个正常存储单元的正常存储单元块; 冗余存储单元块,包括用于替换正常存储器单元的修复存储单元的多个冗余存储单元; 弱单元信息存储单元,被配置为响应于刷新命令,存储关于包括在正常和冗余存储单元块中的弱存储单元的信息; 以及刷新控制电路,被配置为控制对应于要刷新的正常存储器单元和冗余存储单元中的刷新地址的存储单元,并且基于存储在所述存储单元中的至少一个弱存储器单元的信息来控制要刷新的弱存储器单元 弱小区信息存储单元,其中在正常存储器单元的刷新周期期间,刷新控制电路至少比其他存储器单元刷新弱存储器单元一次。

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