ELECTRONIC DIE TESTING DEVICE AND METHOD

    公开(公告)号:US20230036484A1

    公开(公告)日:2023-02-02

    申请号:US17869301

    申请日:2022-07-20

    Abstract: A testing device for electronic dies includes a first support part and a second support part configured to be removably assembled with each other. The first and second support parts together define at least one housing where at least one electronic die can be arranged to be tested. The electronic die has a first surface with contacting elements. The at least one housing includes a first portion. This at least one housing is arranged to enable the at least one electronic die to occupy a first position in the housing where the first surface is spaced apart from the first portion, and is further arrange to enable the at least one electronic die to occupy a second position in the housing where the first surface bears against the first portion.

    Interrupt controller and method of managing an interrupt controller

    公开(公告)号:US11550744B2

    公开(公告)日:2023-01-10

    申请号:US17229307

    申请日:2021-04-13

    Abstract: In accordance with an embodiment, an electronic device includes: an interrupt controller having an input for receiving a controller clock signal, and an output, the interrupt controller configured to deliver an output interrupt signal on the output when the controller clock signal is active, and a control circuit comprising, an input interface for receiving at least one interrupt signal from at least one item of equipment external to the device, a clock input for receiving an external clock signal, and a first controller connected to the input interface and to the clock input, the first controller configured to automatically generate the controller clock signal from the external clock signal from when the at least one interrupt signal is asserted until a delivery of a corresponding output interrupt signal.

    Switched-mode power supply with bypass mode

    公开(公告)号:US11509223B2

    公开(公告)日:2022-11-22

    申请号:US17200498

    申请日:2021-03-12

    Inventor: Patrik Arno

    Abstract: In an embodiment, an SMPS comprises a half-bridge, and a driver configured to drive the half-bridge based on a PWM signal. The SMPS further comprising a first circuit coupled between the output of the driver and a control terminal of a high-side transistor of the half-bridge, wherein the first circuit is configured to maintain the first transistor on when the PWM signal has a duty cycle that is substantially 100%.

    Voltage control device
    94.
    发明授权

    公开(公告)号:US11480988B2

    公开(公告)日:2022-10-25

    申请号:US15364454

    申请日:2016-11-30

    Inventor: Patrik Arno

    Abstract: A device for controlling a first voltage with a second voltage includes a first terminal of application of the second voltage and a second terminal for supplying the first voltage. A comparator has a first input terminal connected to the first terminal and has a second input terminal receiving information representative of the first voltage. At least one first current source of programmable intensity is connected to the second input terminal of the comparator.

    BANDGAP CIRCUIT
    97.
    发明申请

    公开(公告)号:US20220317719A1

    公开(公告)日:2022-10-06

    申请号:US17707321

    申请日:2022-03-29

    Abstract: A band-gap circuit for generating a bandgap reference signal includes a first bipolar transistor and a second bipolar transistor of a same type among PNP and NPN types. The first and second bipolar transistors are configured to generate a current varying proportionally with the temperature. A capacitor is connected between a base and an emitter of one or both of the first and second bipolar transistors.

    SECURED DEBUG
    98.
    发明申请

    公开(公告)号:US20220317184A1

    公开(公告)日:2022-10-06

    申请号:US17709053

    申请日:2022-03-30

    Abstract: In an embodiment a method for debugging a processing device includes generating, by a monotonic counter of the processing device, a first count value, transmitting, by the monotonic counter, the first count value to a debug access control circuit, comparing, by the debug access control circuit of the processing device, the first count value with one or more reference values and authorizing or preventing debug access, by the debug access control circuit, based on the comparison.

    POWER SUPPLY SYSTEM
    100.
    发明申请

    公开(公告)号:US20220271663A1

    公开(公告)日:2022-08-25

    申请号:US17650463

    申请日:2022-02-09

    Abstract: A power supply system includes a voltage application source, and a switched mode power supply having an output coupled to the voltage application source through a first path and through a second path different from the first path. A first node is coupled to the output of the switched mode power supply, the switched mode power supply being configured to couple the first node to the voltage application source through the first path in a first operating mode and through the second path in a different second operating mode. A digital regulator is coupled to the first node. A digital circuit is coupled to an output of the digital regulator. An analog regulator is coupled to the first node and an analog circuit coupled to an output of the analog regulator.

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