IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING

    公开(公告)号:EP3381045A1

    公开(公告)日:2018-10-03

    申请号:EP16869126.9

    申请日:2016-11-21

    Abstract: An ion mirror is disclosed comprising an ion entrance electrode section (62) at the ion entrance to the ion mirror, an energy focussing electrode section (66) for reflecting ions back along a longitudinal axis towards said ion entrance, and a spatial focussing electrode section (64) arranged between the ion entrance electrode section (62) and the energy focussing electrode section (66) for spatially focussing the ions. One or more DC voltage supply is provided to apply a DC potential to the ion entrance electrode section (62) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the energy focussing electrode section (66). The ion mirror further comprises: (i) at least one first transition electrode (68) arranged between said ion entrance electrode section (62) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one first transition electrode that is intermediate the DC potential applied to the ion entrance electrode section (62) and the DC potential applied to the spatial focussing electrode section (64); and (ii) at least one second transition electrode (69) arranged between said energy focussing electrode section (66) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one second transition electrode (69) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the ion entrance electrode section (62).

    Multireflection time-of-flight mass spectrometer
    92.
    发明授权
    Multireflection time-of-flight mass spectrometer 有权
    飞行时间质谱仪,多次反射

    公开(公告)号:EP2610893B1

    公开(公告)日:2017-02-01

    申请号:EP13161735.9

    申请日:2008-12-22

    CPC classification number: H01J49/406 H01J49/061 H01J49/405

    Abstract: The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof. Apparatus for carrying out the method is also disclosed.

    MULTIREFLECTION TIME-OF-FLIGHT MASS SPECTROMETER
    93.
    发明授权
    MULTIREFLECTION TIME-OF-FLIGHT MASS SPECTROMETER 有权
    多重反射时间质谱仪

    公开(公告)号:EP2232525B1

    公开(公告)日:2014-04-16

    申请号:EP08865251.6

    申请日:2008-12-22

    CPC classification number: H01J49/406 H01J49/061 H01J49/405

    Abstract: The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof. Apparatus for carrying out the method is also disclosed.

    MASS ANALYSER AND METHOD OF MASS ANALYSIS
    94.
    发明公开
    MASS ANALYSER AND METHOD OF MASS ANALYSIS 审中-公开
    MERANANYSYSOR UND VERFAHREN ZUR MASSENANALYSE

    公开(公告)号:EP2681759A1

    公开(公告)日:2014-01-08

    申请号:EP11764713.1

    申请日:2011-09-28

    Abstract: An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.

    Abstract translation: 用于质量分析的静电离子阱包括第一电极阵列和与第一电极阵列间隔开的第二电极阵列。 第一和第二电极阵列可以是由平行条形电极或同心圆形或部分圆形导电环形成的平面阵列。 阵列的电极被提供有基本相同的电压图案,由此阵列之间的空间中的电位分布使得在飞行方向上等离子地反射离子,使得它们在空间中经历周期性的振荡运动 基本上位于阵列之间。 放大器电路用于检测具有与经历周期性振荡运动的离子的质荷比相关的频率分量的图像电流。

    MASS SPECTROMETRY METHOD AND DEVICE FOR IMPLEMENTING SAME
    95.
    发明公开
    MASS SPECTROMETRY METHOD AND DEVICE FOR IMPLEMENTING SAME 审中-公开
    马萨诸塞州立大学杜塞尔多夫实验室

    公开(公告)号:EP2615622A2

    公开(公告)日:2013-07-17

    申请号:EP11803847.0

    申请日:2011-07-08

    CPC classification number: H01J49/405 G01N30/72 H01J49/406 H01J49/408

    Abstract: The invention relates to an electronic analytical technique for determining the composition and structure of substances and, more specifically, to the field of analyzers comprising at least one mass spectrometer, and can be used in medicine, biology, the oil and gas industry, metallurgy, power engineering, geochemistry, hydrology and ecology. The technical result is that of increasing the resolving power of the mass spectrometer and the sensitivity, accuracy and speed with which the composition and structure of substances are measured, while at the same time increasing the functional capabilities and reducing the geometric dimensions and the mass of substance analyzers. In the mass spectrometry method, an ion flux is generated and controlled using a single-flux, off-axis method; in parallel, using a multi-flux method; using a three-dimensional field with a middle meridian surface, including a reflecting three-dimensional type and a reflecting two-zone type, or using multiple reflection arrays. Embodiments of devices for implementing the method are proposed, as are principle ion optical systems which make it possible to produce different types of mass spectrometers with lower material consumption and smaller geometric dimensions.

    Abstract translation: 本发明涉及一种用于确定物质的组成和结构的电子分析技术,更具体地涉及包括至少一种质谱仪的分析仪领域,并且可以用于医药,生物学,石油和天然气工业,冶金, 电力工程,地球化学,水文和生态学。 技术结果是提高了质谱仪的分辨率,测量物质组成和结构的灵敏度,精度和速度,同时增加了功能性能,降低了几何尺寸和质量 物质分析仪 在质谱法中,使用单通量离轴法生成离子通量并进行控制; 并行使用多通量法; 使用具有中间子午线表面的三维场,包括反射三维型和反射两区型,或使用多个反射阵列。 提出了用于实现该方法的装置的实施例,原理离子光学系统也可以生产具有较低材料消耗和较小几何尺寸的不同类型的质谱仪。

    Multireflection time-of-flight mass spectrometer

    公开(公告)号:EP2610894A2

    公开(公告)日:2013-07-03

    申请号:EP13161743.3

    申请日:2008-12-22

    CPC classification number: H01J49/406 H01J49/061 H01J49/405

    Abstract: The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof.
    Apparatus for carrying out the method is also disclosed.

    TANDEM TIME OF FLIGHT MASS SPECTROMETER AND METHOD OF USE
    98.
    发明授权
    TANDEM TIME OF FLIGHT MASS SPECTROMETER AND METHOD OF USE 有权
    TANDEM FLUZEITMASSENSPEKTROMETER和程序

    公开(公告)号:EP1522087B1

    公开(公告)日:2011-03-09

    申请号:EP03726518.8

    申请日:2003-04-29

    CPC classification number: H01J49/406 H01J49/004

    Abstract: To provide comprehensive (i.e. rapid and sensitive) MS-MS analysis, the inventor employs a time-nested separation, using two time-of-flight (TOF) mass spectrometers. Parent ions are separated in a slow and long TOF1, operating at low ion energy (1 to l00eV), and fragment ions are mass analyzed in a fast and short TOF2, operating at much higher keV energy. Low energy fragmentation cell between TOF1 and TOF2 is tailored to accelerate fragmentation and dampening steps, mostly by shortening the cell and employing higher gas pressure. Since separation in TOF1 takes milliseconds and mass analysis in TOF2- microseconds, the invention provides comprehensive MS-MS analysis of multiple precursor ions per single ion pulse. Slow separation in TOF1 becomes possible with an introduction of novel TOF1 analyzers. The TOF-TOF could be implemented using a static TOF1, here described on the examples of spiratron, planar and cylindrical multi-pass separators with griddles spatial focusing ion mirrors. Higher performance is expected with the use of novel hybrid TOF 1 analyzers, combining radio frequency (RF) and quadratic DC fields. RF field retains low-energy ions within TOF 1 analyzer, while quadratic DC field improves resolution by compensate for large relative energy spread.

    ION TRAPPING
    99.
    发明授权
    ION TRAPPING 有权
    方法ION夹杂

    公开(公告)号:EP1402562B1

    公开(公告)日:2009-02-11

    申请号:EP02738591.3

    申请日:2002-06-17

    CPC classification number: H01J3/40 H01J49/027 H01J49/406 H01J49/4245

    Abstract: A method for trapping of a plurality of charged particles in a charged particle trap. The trap includes first and second electrode mirrors (2, 3) having a common optical axis (4), the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam (10) having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.

    MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ACCELERATION
    100.
    发明公开
    MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOGONAL ACCELERATION 有权
    多反射时间质谱仪正交加速

    公开(公告)号:EP1949410A1

    公开(公告)日:2008-07-30

    申请号:EP06816588.5

    申请日:2006-10-11

    CPC classification number: H01J49/401 H01J49/406

    Abstract: The disclosed apparatus includes a multi-reflecting time-of-flight mass spectrometer (MR-TOF MS) (11) comprising a pair of grid- free ion mirrors (12), a drift space (13), an orthogonal ion accelerator (14), an optional deflector (15), an ion detector (16), a set of periodic lenses (17), and an edge deflector (18). To improve the duty cycle of the ion injection at a low repetition rate dictated by a long flight in the MR-TOF MS, multiple measures may be taken. The incoming ion beam and the accelerator may be oriented substantially transverse to the ion path in the MR-TOF, while the initial velocity of the ion beam is compensated by tilting the accelerator and steering the beam for the same angle. To further improve the duty cycle of any multi-reflecting or multi-turn mass spectrometer, the beam may be time-compressed by modulating the axial ion velocity with an ion guide. The residence time of the ions in the accelerator may be improved by trapping the beam within an electrostatic trap. Apparatuses with a prolonged residence time in the accelerator provide improvements in both sensitivity and resolution.

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