Abstract:
An integrated circuit structure containing dielectrically isolated islands having heat dissipation paths of enhanced thermal conductivity. A semiconductor structure comprises a first layer of crystalline material with a layer comprising polycrystalline diamond formed over the first layer. A layer of polycrystalline silicon is formed over the diamond containing layer and a layer of monocrystalline material is formed over the polycrystalline silicon.
Abstract:
A process of manufacturing a trench-isolated semiconductor structure comprises forming a first 'pad' (e.g. MOS gate) oxide layer on a first surface of a silicon substrate. An oxide etch protective layer of silicon nitride is selectively formed on a first portion of the pad oxide layer so as to overlie a first surface portion of the silicon substrate in which active device regions will be introduced. A second oxide layer is then deposited on the pad oxide layer and on the nitride layer. The dual oxide layer is then patterned to form a trench mask which exposes a second surface portion of the silicon substrate. An etchant is then applied to the structure so as to etch away material from the silicon substrate exposed by the second surface portion and a portion of the second oxide layer, thereby forming a trench in the second surface portion of the silicon substrate. After any remaining portion of the second oxide layer is removed, local oxidation of the structure is perfomed so as to form a third oxide layer in the trench and a field oxide at surface portions of the substrate adjacent to the nitride layer. A layer of polysilicon is non-selectively deposited over the entire structure to fill the oxide-lined trench and then polished down to the nitride layer which serves as a polishing stop. The nitride is then stripped off the pad oxide in preparation for device region processing.
Abstract:
A frequency conversion circuit includes four analog switching elements (46, 48, 52, 54) coupled. Each switching element is logic controlled to open or close, i.e., to have either a high or low conductivity to pass or block analog currents of either polarity. Effectively, a signal received on the dual input (40, 42) may be enabled in inverted or non-inverted form onto the dual output (60, 62), depending on the control of the switches. The circuit may be used for producing a telephone ringing signal from an AC input signal. The circuit is coupled to receive an AC input signal, such as a 60 Hz signal derived from AC line power. The switching elements are alternately opened and closed during a predetermined sequence of half-cycles of the AC input signal. The circuit produces an output signal having a sequence of consecutive positive half-cycles and a sequence of consecutive negative half-cycles. Each switching element preferably includes a MOSFET switch stage providing either high or low impedance between two switch electrodes, a current amplifier (76, 78) for providing a gate voltage to the MOSFET switch stage, and a storage circuit including a capacitor (102) for storing energy while the switching element is open.
Abstract:
A two-step analog-to-digital converter (300) and BiCMOS fabrication method to make the converter. The fabrication method provides pseudosubstrate isolation of digital CMOS devices from analog devices. The converter uses NPN current switching in a flash analog-to-digital converter (306) and in a digital-to-analog converter (310) for low noise operation. CMOS digital error correction (318) and BiCMOS output drivers (320) provide high packing density plus large output load handling. Timing control (330) aggregates switching events and puts them into intervals when noise sensitive operations are inactive. The fabrication method uses a thin epitaxial layer with limited thermal processing to provide NPN and PNP devices with large breakdown and Early voltages. Laser trimmed resistors provide small-long term drift due to dopant stabilization in underlying BPSG and low hydrogen nitride passivation.
Abstract:
Decimation circuitry is provided having a forward shifting data section (14) receiving data samples in order including a plurality of forward decimation registers (17-20) coupled in-line and providing a forward register output. Each forward decimation register operates as a FIFO register having a decimation depth. A backward shifting data section (16) includes a plurality of backward decimation registers (21-23) having a decimation depth coupled in-line and providing a backward register output. One of the backward decimation registers (24) which receives data samples in sequence form one of the forward decimation registers can function as both a LIFO and a FIFO register, when a LIFO register, it operates to reverse blocks of data samples wherein the size of each block corresponds to the decimation rate. Each reversed block is then shifted through the backward shifting data section. Each of the other backward decimation registers operates as FIFO register. The decimation circuitry can be used to form a digital filter cascadable into various sizes.
Abstract:
A telephone test set that performs dry loop testing of telephone lines has a passive speech network, a speakerphone circuit, and an amplifier and a speaker coupled to the speakerphone circuit. The passive speech network and the speakerphone circuit area isolated by the use of latching relays which are switched by a relay driver circuit that provides a short current burst. Line power can be used to power the speakerphone, so as to extend battery life of a battery which can augment the line power as needed.
Abstract:
An improved integrating type A/D converter has a set of analog switches and a control logic unit for selectively connecting a pair of input terminals for an unknown analog input voltage signal with a pair of input leads across a buffer and integrator in order to apply, first in an integrate phase, the analog input signal in a polarity direction that causes the integrator to ramp up in the same direction regardless of the polarity of the analog input signal, and then in a deintegrate phase, reference voltages are applied across the input leads in a direction opposite to the ramp-up direction of the integrator such that a zero crossing signal is output by the comparator. The ramping-up and ramping-down of the integrator in the same direction eliminates rollover error in the A/D reading of inputs of different polarities but of the same magnitude. The invention is particularly useful for monolithic A/D converters using BiMOS technology. The preferred embodiment performs a subdivided measurement of a number of integrate/deintegrate phases of the analog input signal, and a second, residual error measurement using a pair of storage capacitors with capacitances in a predetermined multiplier ratio.
Abstract:
A method including covering the area to be laser trimmed with a first insulative layer (22) having a thickness sufficiently thin that a layer can trim the area through the first insulative layer. An etch stop (26) is formed on the first insulative layer over the aera to be trimmed and covered with a second insulative layer (28). A portion of the second insulative layer is etched to expose the etch stop and a portion of the etch stop is then removed to expose a portion of the first insulative layer and laser trimming is conducted through the exposed first insulative layer. The etch stop is part of a first level of interconnects (24) made of the same material and simultaneously with the etch stop. The area to be trimmed is part of a second level of contacts that interconnect another second material.
Abstract:
A remotely controlled line conditioning apparatus (80) is installed in the terminal (12) where access to the telephone loop (52) to be tested is readily available. The line conditioning apparatus (80) includes a telephone line termination unit (100) and an intelligent control unit (110). The telephone line termination unit has a telephone line access port to which a telephone line pair is selectively coupled, and is operative to controllably impart a selected one of a plurality of electrical signalling conditions to the telephone line pair under test. The control unit has a communication modem (112) through which communication signals containing telephone line conditioning messages are coupled to and from the central office/remote terminal communication link. The control unit also includes a micro-controller (122). Control signals generated by the micro-controller control the operation of the telephone line termination unit which conditions the telephone line pair.