公开(公告)号：US20220034956A1

公开(公告)日：2022-02-03

申请号：US17337954

申请日：2021-06-03

Applicant: CHROMA ATE INC.

Inventor： WEI-CHIH CHEN ,  BEN-MOU YU ,  YI-YEN LIN

IPC: G01R31/26 ,  G01R31/28 ,  G01N21/95

Abstract: A wafer inspection system and a wafer inspection equipment thereof are provided. The wafer inspection system includes a susceptor device, probe card, and bridge module. The susceptor device includes a susceptor unit for placing a wafer under test. The probe card includes a probing portion and conducting portion. The conducting portion is disposed at the periphery of the probing portion and has a contact surface. The bridge module includes transmission units extended upward, positioned adjacent to a wafer placement area, and coupled to the susceptor unit. When the probing portion comes into contact with a testing point of the wafer, the contact surface of the conducting portion gets coupled to the transmission units to transmit a test signal to the probe card via the transmission units and conducting portion and thus form a test loop. Thus, the test loop path can be shortened and the accuracy of signal transmission and inspection can be enhanced.

公开(公告)号：US11073852B2

公开(公告)日：2021-07-27

申请号：US17091007

申请日：2020-11-06

Applicant: CHROMA ATE INC.

Inventor： Chun-Sheng Hung ,  Hsiang-Yu Wu ,  Chi-Chiao Cheng ,  Chien-Hsing Huang

IPC: G05F1/46 ,  G01R31/385 ,  G01R1/20

Abstract: An electronic load apparatus is provided and adapted to allow an enhanced driving circuit to be disposed between a voltage-dividing circuit and power components to ensure the driving capability of the power components not coupled to a control circuit to thereby adjust a response voltage quickly, shorten a response time period and thus increase overall response speed, suppress transient voltage variation and thus preclude a signal delay otherwise arising from a load circuit, allow the power components series-connected in an electronic load apparatus to be driven quickly, reduce the risk of damaging the power components, and enhance the stability and reliability of the electronic load apparatus.

公开(公告)号：US20210200251A1

公开(公告)日：2021-07-01

申请号：US17091007

申请日：2020-11-06

Applicant: CHROMA ATE INC.

Inventor： Chun-Sheng Hung ,  Hsiang-Yu Wu ,  Chi-Chiao Cheng ,  Chien-Hsing Huang

IPC: G05F1/46

Abstract: An electronic load apparatus is provided and adapted to allow an enhanced driving circuit to be disposed between a voltage-dividing circuit and power components to ensure the driving capability of the power components not coupled to a control circuit to thereby adjust a response voltage quickly, shorten a response time period and thus increase overall response speed, suppress transient voltage variation and thus preclude a signal delay otherwise arising from a load circuit, allow the power components series-connected in an electronic load apparatus to be driven quickly, reduce the risk of damaging the power components, and enhance the stability and reliability of the electronic load apparatus.

公开(公告)号：US10989660B2

公开(公告)日：2021-04-27

申请号：US16260743

申请日：2019-01-29

Applicant: CHROMA ATE INC.

Inventor： Chien-Hsun Chu ,  Lan-Sheng Yang

IPC: G01N21/64 ,  C12Q1/6816 ,  C12Q1/686

Abstract: An automatic fluorescence detection system includes a base and an optical assembly. The base has a detecting region. The optical assembly includes a fluorescent image-capturing device, an illumination device and a field lens. The illumination device includes a first annular illumination module and a second annular illumination module surrounding a center axis of the fluorescent image-capturing device. Lights emitted by the first annular illumination module and the second annular illumination module travel along a light-traveling path to project onto the detecting region. A distance between the first annular illumination module and the center axis is smaller than that between the second annular illumination module and the center axis. The field lens is disposed in correspondence with the detecting region. Spacing between the field lens and the detecting region is ranged from 15.0 cm to 30.0 cm.

公开(公告)号：US10948518B2

公开(公告)日：2021-03-16

申请号：US16417833

申请日：2019-05-21

Applicant: Chroma Ate Inc.

Inventor： Chien-Ming Chen ,  Meng-Kung Lu ,  Yung-Chih Chen

IPC: G01R1/04

Abstract: A test apparatus for testing electronic device comprises a lower base, an upper base and a pressing force generating module disposed between the upper and lower bases. The lower base having a chip socket for receiving a plurality of probes, and a test socket plate having a first guiding device, each of the probes has a spring force stored therein. The upper base having a second guiding device coupled to the first guiding device. When an electronic device is placed in the chip socket, and the upper base is slidably moved with respect to the lower base by the cooperative actions between the first and second guiding devices, so that the pressing force generating module is in alignment with the electronic device for applying a pressing force on the electronic device, and the pressing force being greater than the sum of the spring forces generated by the plurality of probes.

公开(公告)号：US10910627B2

公开(公告)日：2021-02-02

申请号：US16156111

申请日：2018-10-10

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang Hsu ,  Kuo-Yen Hsu ,  Kuan-Chen Chen ,  Chuan-Tse Lin

IPC: H01M4/04 ,  H01M10/44 ,  H01M10/6563 ,  H01M10/613 ,  H01M10/48 ,  H01M10/647 ,  H01M10/6566 ,  H01M10/6556 ,  H01M10/04 ,  H01M10/42 ,  H01M2/10

Abstract: The disclosure is related to a battery formation system and probe supporting structure thereof. The battery formation system includes a base, a holder, a probe supporting structure and at least one probe. The base is adaptive to bear at least one battery, and the holder is located on one side of the base. The probe supporting structure is disposed on the holder. The probe supporting structure has an air flow passage and at least one air discharge channel connected to each other, and an extension direction of the air flow passage intersects an extension direction of the at least one air discharge channel. The at least one probe is disposed on the probe supporting structure, and a probing end of the at least one probe and an air outlet of the at least one air discharge channel are located at a same side of the probe supporting structure.

公开(公告)号：US20200209603A1

公开(公告)日：2020-07-02

申请号：US16719386

申请日：2019-12-18

Applicant: CHROMA ATE INC.

Inventor： Shih-Yao PAN ,  Yu-Yen WANG ,  Tsung-Hsien OU ,  Kuo-Wei HUANG

IPC: G02B21/02 ,  G02B21/36

Abstract: A separate microscopy system, applied to observe a specimen positioned on a stage and further to image the specimen on an imaging device, includes an ocular-lens unit, an adjustment unit and an objective-lens unit. The ocular-lens unit has an ocular-lens optical axis, and is manipulated to make the ocular-lens optical axis perpendicular to the stage. The adjustment unit is assembled to a side of the ocular-lens unit close to the stage. The objective-lens unit has an objective-lens optical axis, and is assembled to a side of the adjustment unit close to the stage. The objective-lens unit is manipulated to be adjusted by the adjustment unit to make the ocular-lens optical axis, the objective-lens optical axis and the imaging device co-axially and perpendicular to the stage, such that the specimen can be imaged at an imaging center position of the imaging device. In addition, an adjusting method thereof is also provided.

公开(公告)号：US20200166445A1

公开(公告)日：2020-05-28

申请号：US16676458

申请日：2019-11-07

Applicant: CHROMA ATE INC.

Inventor： Cheng-Ting TSAI ,  Lan-Sheng YANG ,  Shao-En CHUNG

IPC: G01N13/00

Abstract: A condensing system is used to generate a condensing layer on a surface of a test object. The condensing system includes airflow generating device and a passage device. The airflow generating device is used to generate condensing airflow. The condensing airflow has a dew point higher than a temperature of the surface of the test object. The passage device is connected to the airflow generating device, and the condensing airflow flows from the airflow generating device into the passage device. The passage device includes a flow-uniforming module. The flow-uniforming module includes at least one uniforming board. Each of the at least one uniforming board has at least a first hole.

公开(公告)号：US20190257753A1

公开(公告)日：2019-08-22

申请号：US16260743

申请日：2019-01-29

Applicant: CHROMA ATE INC.

Inventor： Chien-Hsun CHU ,  Lan-Sheng YANG

IPC: G01N21/64 ,  C12Q1/686 ,  C12Q1/6816

Abstract: An automatic fluorescence detection system includes a base and an optical assembly. The base has a detecting region. The optical assembly includes a fluorescent image-capturing device, an illumination device and a field lens. The illumination device includes a first annular illumination module and a second annular illumination module surrounding a center axis of the fluorescent image-capturing device. Lights emitted by the first annular illumination module and the second annular illumination module travel along a light-traveling path to project onto the detecting region. A distance between the first annular illumination module and the center axis is smaller than that between the second annular illumination module and the center axis. The field lens is disposed in correspondence with the detecting region. Spacing between the field lens and the detecting region is ranged from 15.0 cm to 30.0 cm.

公开(公告)号：US10291116B2

公开(公告)日：2019-05-14

申请号：US15674278

申请日：2017-08-10

Applicant: CHROMA ATE INC.

Inventor： Tsz-Lang Chen ,  Ming-Chieh Lin ,  Wen-Min Yang

IPC: G05F1/10 ,  H02M3/10 ,  H02M1/08 ,  G05F1/00 ,  H02M1/00

Abstract: An output control method for a controller includes the following steps. At each of detection time points, the controller detects a detection voltage value and a detection current value of a load. In a voltage control mode, the controller generates a setting parameter to control the power amplifier according to part of the detection voltage values. In a current control mode, the controller generates the setting parameter to control the power amplifier according to part of the detection current values. When the controller switches to the voltage control mode or the current control mode, the controller determines a ratio between the detection current value and the detection voltage value at one of the detection time points and the setting parameter is generated according to the ratio. Therefore, the bandwidth is substantially the same no matter if the controller operates in the voltage control mode or the current control mode.