MULTIIWAVELENGTH PHOTOMETRIC SYSTEM
    111.
    发明专利

    公开(公告)号:JPS5368292A

    公开(公告)日:1978-06-17

    申请号:JP14413676

    申请日:1976-11-30

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To make possible taking measures flexibly with the apparatus being held fixed for the purpose of measuring various specimens and achieve the elimination of laboriousness by beforehand selecting and fixing a multiplicity of wavelengths (3 or more) and multiplying and adding a suitable coefficient to the absorbancy measured with every wavelength.

    SPECTROPHOTOMETER
    112.
    发明专利

    公开(公告)号:JPS52119376A

    公开(公告)日:1977-10-06

    申请号:JP3644776

    申请日:1976-03-31

    Applicant: SHIMADZU CORP

    Inventor: TSUNASAWA YOSHIO

    Abstract: PURPOSE:To minimize stray light and prevent error of measurement by equipping optical diaphragm to adjust the section of flux of light by altitude.

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