SENSOR APPARATUS TO DETERMINE A VALUE OF A CHEMICAL PARAMETER BASED ON A COLOR SHADE AND METHODS THEREOF
    112.
    发明申请
    SENSOR APPARATUS TO DETERMINE A VALUE OF A CHEMICAL PARAMETER BASED ON A COLOR SHADE AND METHODS THEREOF 有权
    用于确定基于颜色沙哑的化学参数的值的传感器装置及其方法

    公开(公告)号:US20160091433A1

    公开(公告)日:2016-03-31

    申请号:US14497384

    申请日:2014-09-26

    Abstract: Apparatus and methods may provide for determining a value of chemical parameter. One or more light emitters may be positioned within a housing to emit light through an aperture of the housing. The emitted light may illuminate a color area of a structure that is separable from the housing, such as a test strip, a printed color reference, and so on. A color sensor may be positioned within the housing to capture reflected light and to convert the reflected light to an initial digitized color space that may be usable to determine a color shade of a color area. The reflected light may, for example, be captured independently at least of a dimension (e.g., predetermined size, shape, etc.) of the color area.

    Abstract translation: 装置和方法可以提供用于确定化学参数的值。 一个或多个光发射器可以定位在壳体内以通过壳体的孔发光。 发射的光可以照亮可与壳体分离的结构的颜色区域,例如测试条,印刷的颜色基准等。 颜色传感器可以定位在壳体内以捕获反射光并将反射光转换成可用于确定颜色区域的色调的初始数字化颜色空间。 反射光可以例如至少独立地捕捉颜色区域的尺寸(例如,预定尺寸,形状等)。

    Chemical characterization of surface features
    113.
    发明授权
    Chemical characterization of surface features 有权
    表面特征的化学特征

    公开(公告)号:US09297751B2

    公开(公告)日:2016-03-29

    申请号:US14032192

    申请日:2013-09-19

    Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

    Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列,其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置,其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

    Monochromator Comprising Vibration Resistant Moveable Optical Elements
    114.
    发明申请
    Monochromator Comprising Vibration Resistant Moveable Optical Elements 有权
    包含抗振动移动光学元件的单色器

    公开(公告)号:US20160018261A1

    公开(公告)日:2016-01-21

    申请号:US14732170

    申请日:2015-06-05

    Abstract: A monochromator has at least one optical grating which is rotatable in relation to incident light of a source of light, a drive unit to rotate the optical grating by a connected drive rod around a longitudinal axis, and a control unit to control the drive unit and thereby the rotation of the optical grating. The drive unit further has a first damping element with at least one electrical conductive surface, and a second damping element which provides at least one magnetic field having a magnetic axis which penetrates the electrical conductive surface. One of the first and second damping elements is fixed to the drive rod and is rotatable along with the drive rod around the longitudinal axis thereof in relation to the other one of the second or first damping element.

    Abstract translation: 单色仪具有至少一个相对于光源的入射光可旋转的光栅;驱动单元,用于通过连接的驱动杆围绕纵轴旋转光栅;以及控制单元,用于控制驱动单元和 从而光栅的旋转。 驱动单元还具有带有至少一个导电表面的第一阻尼元件和提供至少一个具有穿过导电表面的磁轴的磁场的第二阻尼元件。 第一和第二阻尼元件中的一个被固定到驱动杆,并且可以与驱动杆一起围绕其纵向轴线相对于第二或第一阻尼元件中的另一个旋转。

    Methods and systems for optically characterizing a turbid material using a structured incident beam
    116.
    发明授权
    Methods and systems for optically characterizing a turbid material using a structured incident beam 有权
    使用结构化入射光束光学表征混浊物质的方法和系统

    公开(公告)号:US08634077B2

    公开(公告)日:2014-01-21

    申请号:US13122062

    申请日:2009-10-01

    Abstract: Methods and systems for optically characterizing a turbid sample are provided. A structured light beam is impinged on the sample. The sample includes an embedded region. A reflected light image of the structured light beam is detected from the sample. A measured reflectance image of the structured light beam for the sample is determined based on the reflected light image and a reflectance standard. The following parameters are determined: absorption coefficients ÿa, scattering coefficient ÿs and anisotropy factor g of the sample from the reflectance image. A size parameter of the embedded region is estimated based on the absorption coefficients ÿa, scattering coefficient ÿs and/or anisotropy factor g of the sample from the measured reflectance image.

    Abstract translation: 提供了用于光学表征混浊样品的方法和系统。 结构化光束撞击样品。 样本包括一个嵌入区域。 从样品中检测结构化光束的反射光图像。 基于反射光图像和反射率标准确定样品的结构化光束的测量反射率图像。 确定以下参数:来自反射图像的样品的吸收系数μa,散射系数μs和各向异性因子g。 基于来自测量的反射率图像的样品的吸收系数μa,散射系数μs和/或各向异性因子g来估计嵌入区域的尺寸参数。

    PARTS MANIPULATION, INSPECTION, AND REPLACEMENT SYSTEM AND METHOD
    118.
    发明申请
    PARTS MANIPULATION, INSPECTION, AND REPLACEMENT SYSTEM AND METHOD 有权
    部件操纵,检查和更换系统及方法

    公开(公告)号:US20120205296A1

    公开(公告)日:2012-08-16

    申请号:US13297227

    申请日:2011-11-15

    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a flipper mechanism. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws, a mover, and a rotator. The flipper mechanism turns the devices over and places the devices in a second tray so that another surface of the device can be inspected. A second tray-transfer device moves the second tray from the flipper to a second inspection station. The mover of the flipper mechanism removes the tray from the first inspection surface and places a tray at the second inspection surface.

    Abstract translation: 生产线包括用于监测生产零件质量的检测系统。 用于制造半导体器件的制造线通常检查每个制造的部件。 获得的信息用于解决半导体晶圆厂的制造问题。 用于检查装置的机器视觉系统包括翻转机构。 在第一站检查后,托盘传送装置将托盘从第一检查站移动到翻动机构。 导板机构包括两个钳口,一个动子和一个旋转器。 导板机构将装置转过来并将装置放置在第二托盘中,使得可以检查装置的另一个表面。 第二托盘传送装置将第二托盘从托板移动到第二检查台。 导板机构的移动器从第一检查表面移除托盘,并将托盘放置在第二检查表面。

    INSTALLATION OF OPTICAL INSPECTION OF ELECTRONIC CIRCUITS
    119.
    发明申请
    INSTALLATION OF OPTICAL INSPECTION OF ELECTRONIC CIRCUITS 有权
    电子电路光学检测安装

    公开(公告)号:US20120019650A1

    公开(公告)日:2012-01-26

    申请号:US13190149

    申请日:2011-07-25

    Abstract: An installation of optical inspection of integrated circuits or the like, comprising: a planar conveyor along a first direction of the objects to be analyzed and a photographic system placed above an area of the conveyor and in a fixed position with respect thereto, the photographic system comprising at least one first set of digital cameras each comprising an orthogonal array of pixels, said cameras being aligned in a second direction different from the first one, the cameras being all oriented so that one of the orthogonal directions of their pixel array forms a first angle with the first direction.

    Abstract translation: 集成电路等的光学检查的安装,包括:沿着要分析的物体的第一方向的平面传送器和放置在传送器的区域上方并处于相对于其的固定位置的照相系统,照相系统 包括至少一个第一组数字照相机,每个第一组数字照相机各自包括正交阵列的像素,所述相机在与第一方向不同的第二方向上对准,所述照相机全部定向成使得它们的像素阵列的正交方向之一形成第一 与第一个方向成角度。

    METHOD OF MEASURING MEASUREMENT TARGET
    120.
    发明申请
    METHOD OF MEASURING MEASUREMENT TARGET 有权
    测量目标的方法

    公开(公告)号:US20100290696A1

    公开(公告)日:2010-11-18

    申请号:US12779599

    申请日:2010-05-13

    Abstract: In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.

    Abstract translation: 为了测量PCB上的测量目标,通过使用通过将光栅图案光照射到PCB上拍摄的第一图像来获取PCB的高度信息。 然后,通过使用高度信息,将在PCB上突出大于参考高度的第一区域确定为测量目标。 此后,通过使用通过将光照射到PCB上拍摄的第二图像来获取PCB的颜色信息。 然后,将作为PCB的颜色信息中的测量对象确定的第一区域的第一颜色信息设置为参考颜色信息。 此后,将参考颜色信息与除了第一区域之外的区域的颜色信息进行比较,以判断在除了第一区域之外的区域中是否形成测量对象。 因此,可以精确地测量测量对象。

Patent Agency Ranking