Abstract:
Methods are provided for the automated detection of micro-objects in a microfluidic device. In addition, methods are provided for repositioning micro-objects in a microfluidic device. In addition, methods are provided for separating micro-objects in a spatial region of the microfluidic device.
Abstract:
Apparatus and methods may provide for determining a value of chemical parameter. One or more light emitters may be positioned within a housing to emit light through an aperture of the housing. The emitted light may illuminate a color area of a structure that is separable from the housing, such as a test strip, a printed color reference, and so on. A color sensor may be positioned within the housing to capture reflected light and to convert the reflected light to an initial digitized color space that may be usable to determine a color shade of a color area. The reflected light may, for example, be captured independently at least of a dimension (e.g., predetermined size, shape, etc.) of the color area.
Abstract:
Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Abstract:
A monochromator has at least one optical grating which is rotatable in relation to incident light of a source of light, a drive unit to rotate the optical grating by a connected drive rod around a longitudinal axis, and a control unit to control the drive unit and thereby the rotation of the optical grating. The drive unit further has a first damping element with at least one electrical conductive surface, and a second damping element which provides at least one magnetic field having a magnetic axis which penetrates the electrical conductive surface. One of the first and second damping elements is fixed to the drive rod and is rotatable along with the drive rod around the longitudinal axis thereof in relation to the other one of the second or first damping element.
Abstract:
Methods and systems for optically characterizing a turbid sample are provided. A structured light beam is impinged on the sample. The sample includes an embedded region. A reflected light image of the structured light beam is detected from the sample. A measured reflectance image of the structured light beam for the sample is determined based on the reflected light image and a reflectance standard. The following parameters are determined: absorption coefficients ÿa, scattering coefficient ÿs and anisotropy factor g of the sample from the reflectance image. A size parameter of the embedded region is estimated based on the absorption coefficients ÿa, scattering coefficient ÿs and/or anisotropy factor g of the sample from the measured reflectance image.
Abstract:
A system includes a non-uniform grating having a first region with a first refractive index and second regions with a second refractive index. A pattern of the second regions varies with an angular coordinate such that phase shifts of an incident beam created by the grating cause destructive interference that creates an intensity minimum within an output beam from the grating.
Abstract:
Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a flipper mechanism. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws, a mover, and a rotator. The flipper mechanism turns the devices over and places the devices in a second tray so that another surface of the device can be inspected. A second tray-transfer device moves the second tray from the flipper to a second inspection station. The mover of the flipper mechanism removes the tray from the first inspection surface and places a tray at the second inspection surface.
Abstract:
An installation of optical inspection of integrated circuits or the like, comprising: a planar conveyor along a first direction of the objects to be analyzed and a photographic system placed above an area of the conveyor and in a fixed position with respect thereto, the photographic system comprising at least one first set of digital cameras each comprising an orthogonal array of pixels, said cameras being aligned in a second direction different from the first one, the cameras being all oriented so that one of the orthogonal directions of their pixel array forms a first angle with the first direction.
Abstract:
In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.