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公开(公告)号：US20090093968A1
公开(公告)日：2009-04-09
申请号：US11995632
申请日：2006-07-13
Applicant: Ryoko Kawamata , Mie Takahashi
Inventor： Ryoko Kawamata , Mie Takahashi
CPC classification number: G01N21/78 , G01N21/8483 , G01N33/543 , G01N33/54366 , G01N2201/121
Abstract: In an analysis device for measuring a target substance in a liquid sample, highly precise measurement cannot be realized because reliability of measurement is degraded due to influences of properties of the liquid sample and an analysis element.There is provided an analysis device comprising a signal measurement unit for measuring a signal based on a reaction of the target substance in the liquid sample, a parameter collection unit for collecting a parameter that indicates a degree of influence on a measurement error from the liquid sample developed on a channel on the analysis element, an algorithm holding unit for previously holding an algorithm comprising a relationship among the parameter, the signal, and a true value of the target substance, and an arithmetic processing unit for arithmetically processing an analysis value of the target substance from the signal on the basis of the parameter, and the arithmetic processing unit reads out the algorithm, and obtains an analysis value of the target substance with the measurement error of the target substance being corrected, on the basis of the parameter obtained in the parameter collection unit by using the read algorithm.
Abstract translation: 在用于测量液体样品中的目标物质的分析装置中，由于液体样品和分析元件的性质的影响，测量的可靠性降低，不能实现高精度的测量。 提供了一种分析装置，包括：信号测量单元，用于基于液体样品中的目标物质的反应测量信号;参数收集单元，用于收集指示来自液体样品的测量误差的影响程度的参数 在分析元件上的通道上开发的算法保持单元，用于预先保持包括目标物质的参数，信号和真实值之间的关系的算法的算法保持单元，以及用于对所述目标物质的真实值进行算术处理的算术处理单元 根据参数从信号中获取目标物质，算术处理单元读出该算法，并根据获得的参数获得目标物质的测量误差被校正的目标物质的分析值 参数采集单元通过使用读取算法。
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公开(公告)号：TWI593955B
公开(公告)日：2017-08-01
申请号：TW104121950
申请日：2015-07-07
Applicant: 政美應用股份有限公司 , CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
Inventor： 蔡政道 , TSAI, CHENG-TAO
CPC classification number: G01N21/9501 , G01B11/25 , G01B21/045 , G01N21/93 , G01N2201/121
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公开(公告)号：TW201608231A
公开(公告)日：2016-03-01
申请号：TW104121950
申请日：2015-07-07
Applicant: 政美應用股份有限公司 , CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
Inventor： 蔡政道 , TSAI, CHENG-TAO
CPC classification number: G01N21/9501 , G01B11/25 , G01B21/045 , G01N21/93 , G01N2201/121
Abstract: 本發明係關於一種光偏折檢測模組，包含一檢測載台、一面光源、至少二掃描攝影機及一矯正標準面。檢測載台用以承載待測物，面光源係設置於檢測載台上方，提供一平面光朝檢測載台照射。至少二掃描攝影機係設置於面光源之相對側。矯正標準面係鄰設於檢測載台。其中，當面光源朝檢測載台照射平面光後，平面光將會被待測物之表面及矯正標準面反射，至少二掃描攝影機於接收被待測物之表面及矯正標準面所反射之平面光後，適可由一處理器進行一數值分析，以獲得相關檢測數據並進行誤差校正作業。
Abstract in simplified Chinese: 本发明系关于一种光偏折检测模块，包含一检测载台、一面光源、至少二扫描摄影机及一矫正标准面。检测载台用以承载待测物，面光源系设置于检测载台上方，提供一平面光朝检测载台照射。至少二扫描摄影机系设置于面光源之相对侧。矫正标准面系邻设于检测载台。其中，当面光源朝检测载台照射平面光后，平面光将会被待测物之表面及矫正标准面反射，至少二扫描摄影机于接收被待测物之表面及矫正标准面所反射之平面光后，适可由一处理器进行一数值分析，以获得相关检测数据并进行误差校正作业。
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公开(公告)号：US12111270B2
公开(公告)日：2024-10-08
申请号：US17725917
申请日：2022-04-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Juntaek Oh , Jinwoo Ahn , Kijoo Hong , Youngkyu Park , Eunsoo Hwang
CPC classification number: G01N21/9501 , G01N21/21 , G01N21/55 , G01N2201/121
Abstract: A method of inspecting a wafer comprising measuring an intensity of an incident light and storing the measurement as stored incident light intensity, irradiating the incident light to the wafer, measuring an intensity of a reflected light from the wafer and storing the measurement as stored reflected light intensity, and correcting the stored reflected light intensity based on a difference between the stored incident light intensity and a reference intensity of a reference incident light.
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115.发明授权公开(公告)号：US12066433B2
公开(公告)日：2024-08-20
申请号：US17686802
申请日：2022-03-04
Applicant: SYSMEX CORPORATION , OSAKA UNIVERSITY , NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Inventor： Masaya Okada , Yuki Shimaoka , Shigeki Iwanaga , Kazuki Bando , Katsumasa Fujita , Yasunori Nawa , Satoshi Fujita
IPC: G01N21/65 , G01N21/25 , G01N21/31 , G01N33/543 , G01N33/58 , G01N33/68 , G06N3/08 , G16C20/20 , G16C20/70
CPC classification number: G01N33/54353 , G01N21/255 , G01N21/314 , G01N21/658 , G01N33/54346 , G01N33/588 , G01N33/6812 , G06N3/08 , G16C20/20 , G01N2201/121 , G01N2201/1296 , G16C20/70
Abstract: Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.
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Patent Agency Ranking
116.发明公开公开(公告)号：US20240219296A1
公开(公告)日：2024-07-04
申请号：US18605163
申请日：2024-03-14
Inventor： YI-SHENG TING , YU-TSUNG CHEN
IPC: G01N21/25 , G01N21/359 , G01N21/39 , H05B45/18
CPC classification number: G01N21/255 , G01N21/359 , G01N21/39 , H05B45/18 , G01N2201/0694 , G01N2201/121 , G01N2201/125
Abstract: A light emitting apparatus has light emitting units. The light emitting units can be respectively provided with current densities, so that the light emitted by each of the light emitting unit has a light intensity, wherein the current densities are different from each other, or partial of the current densities are different from each other. A number of the light emitting units can be larger than or equal to four, all of the four lighting frequencies of the four light emitting units are different from each other, or partial of the four lighting frequencies of the four light emitting units are identical to each other, and the light emitting apparatus and the object under test rotate relative to each other. A light emitting method, a spectrum detection method and a lighting correction method are also illustrated for increasing SNR, correcting the light intensity or the spectrum signal.
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公开(公告)号：US20240094122A1
公开(公告)日：2024-03-21
申请号：US18370034
申请日：2023-09-19
Applicant: SICK AG
Inventor： Thomas BEYER , Julian EDLER
CPC classification number: G01N21/39 , G01J3/4338 , G01N2201/121 , G01N2201/1273
Abstract: The invention relates to a method for measuring a concentration of a gas in a gas mixture, said method comprising that: a light beam modulated in a ramp shape and/or in a step shape in its wavelength and additionally periodically modulated, in particular in its wavelength, is transmitted from a light source, in particular a laser, into a measurement zone; the modulated light beam passes through a gas mixture in the measurement zone and is detected as reception light by a detector, wherein the reception light is converted by the detector into a detector signal; a derivative signal is determined based on the detector signal by performing a transformation of the detector signal into the frequency range, in particular by a Fourier transform of the detector signal, wherein an evaluation of the detector signal transformed into the frequency range is performed, in particular only, for an n-fold of the frequency of the modulated light beam in order to obtain the derivative signal; and at least two measurement values of a phase of the derivative signal are determined and a correction function is calculated based on the determined measurement values of the phase of the derivative signal in order to correct the derivative signal with the correction function.
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118.发明公开公开(公告)号：US20230280338A1
公开(公告)日：2023-09-07
申请号：US18015463
申请日：2021-07-09
Applicant: VIDYA HOLDINGS LTD
Inventor： Marko Dorrestijn , David R. Klug , Vladimir Turek , Stefan Leo Van Workum
IPC: G01N33/543 , G01N21/63
CPC classification number: G01N33/54373 , G01N21/63 , G01N2201/121
Abstract: An apparatus for creating and correcting a two dimensional intensity map of one or more assay spots in a detection zone is provided. The apparatus comprising, a locator for affirming the location of the detection zone; a total internal reflection excitation device comprising a light source for illuminating the one or more assay spots in the detection zone; a detector configured to receive light that is emitted, reflected or scattered from the one or more assay spots and to create a two dimensional intensity map of the one or more assay spots comprising a two dimensional array of quantitative pixel values; and a processor configured to correct the intensity map to remove noise through analysis of corresponding pixel values from an earlier intensity map; wherein the analysis includes curve fitting.
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公开(公告)号：US11678823B2
公开(公告)日：2023-06-20
申请号：US16609051
申请日：2018-04-30
Applicant: INDIGO DIABETES NV
IPC: A61B5/1459 , A61B5/00 , G01N21/27 , A61B5/145 , A61B5/1495
CPC classification number: A61B5/1459 , A61B5/6861 , G01N21/274 , A61B5/1495 , A61B5/14532 , A61B5/14546 , G01N2201/121
Abstract: A sensing system comprises a photonics integrated circuit partially encapsulated by an encapsulation material and the photonics integrated circuit comprising a first integrated sensor accessible to a target analyte and being positioned in a part of the photonics integrated circuit not being encapsulated by an encapsulation material, and a second integrated sensor accessible to a reference substance and being positioned in a part of the photonics integrated circuit that is encapsulated by an encapsulation material. The sensing system is further adapted to, when in use, comprise the reference substance but less or no target analyte between the second integrated sensor and the encapsulation material as compared to the amount of target analyte being present at the first integrated sensor.
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公开(公告)号：US20190186995A1
公开(公告)日：2019-06-20
申请号：US16270202
申请日：2019-02-07
Applicant: Phoseon Technology, Inc.
Inventor： Lowell Brunson , John Christopher Freitag , Theresa Thompson
CPC classification number: G01J3/42 , G01J3/0208 , G01J3/021 , G01J3/027 , G01J3/0275 , G01J3/0286 , G01J3/0291 , G01J3/10 , G01J3/28 , G01J3/2803 , G01J3/4406 , G01J2003/102 , G01J2003/2866 , G01J2003/425 , G01N21/05 , G01N21/274 , G01N21/64 , G01N30/74 , G01N2021/6491 , G01N2030/621 , G01N2030/746 , G01N2201/0639 , G01N2201/0695 , G01N2201/121 , G02B5/283 , G02B19/0028 , G02B19/0047 , G02B27/1006 , G02B27/14
Abstract: Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
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