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    Temperature control for light-emitting diode stabilization
    112.
    发明申请
    Temperature control for light-emitting diode stabilization 审中-公开
    温度控制用于发光二极管稳定

    公开(公告)号：US20110159549A1

    公开(公告)日：2011-06-30

    申请号：US12895848

    申请日：2010-09-30

    Applicant: Mark F. Oldham ,  Vinod L. Mirchandani

    Inventor： Mark F. Oldham ,  Vinod L. Mirchandani

    IPC: C12P19/34 ,  H01J7/24

    CPC classification number: G01N21/64 ,  F21K9/00 ,  F21K9/64 ,  F21V29/54 ,  F21V29/677 ,  F21V29/74 ,  F21Y2115/10 ,  G01J3/0286 ,  G01J3/10 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/0638 ,  G01N2201/1211 ,  G05D23/1919 ,  G05D23/20

    Abstract: A system is provided that includes a light-emitting diode (LED); a temperature sensor in thermal contact with the LED and capable of measuring an operating temperature and generating an operating temperature signal; and a temperature regulating system capable of receiving the operating temperature signal and regulating the operating temperature based on the operating temperature signal. A method for stabilizing the temperature of an LED is provided. A method is provided that includes providing a system comprising an LED, a reaction region, and a sample in the reaction region; generating excitation beams with the LED; directing excitation beams to the sample; detecting an optical property of the sample to obtain detection data; measuring the- operating temperature of the light emitting diode; and adjusting the detection data of an excitation beam characteristic shift related to the operating temperature, when the LED is operated at the operating temperature to generate the excitation beams.

    Abstract translation: 提供一种包括发光二极管（LED）的系统; 与LED热接触的温度传感器，能够测量工作温度并产生工作温度信号; 以及能够基于工作温度信号接收工作温度信号和调节工作温度的温度调节系统。 提供了一种用于稳定LED的温度的方法。 提供了一种方法，其包括在反应区域中提供包括LED，反应区域和样品的系统; 用LED产生激励光束; 将激发光束引导到样品; 检测样品的光学特性以获得检测数据; 测量发光二极管的工作温度; 并且当LED在工作温度下操作以产生激发光束时，调整与工作温度相关的激发光束特性偏移的检测数据。

    Defect inspecting apparatus
    113.
    发明授权
    Defect inspecting apparatus 失效
    缺陷检查装置

    公开(公告)号：US07733475B2

    公开(公告)日：2010-06-08

    申请号：US12428065

    申请日：2009-04-22

    Applicant: Shuichi Chikamatsu ,  Minori Noguchi ,  Kenji Aiko

    Inventor： Shuichi Chikamatsu ,  Minori Noguchi ,  Kenji Aiko

    IPC: G01N21/00

    CPC classification number: G01N21/9501 ,  G01N21/94 ,  G01N2021/8822 ,  G01N2201/1211 ,  G01N2201/1218

    Abstract: A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.

    Abstract translation: 本发明的缺陷检查装置解决了在缺陷检查装置中，由于通过减小检测像素尺寸来提高微观缺陷的检测灵敏度，焦点深度变浅，成像高度由于环境变化而变化， 缺陷的检测灵敏度变得不稳定。 该装置包括XY台，其承载要检查的基板并沿预定方向扫描;以及机构，其具有以倾斜方式照射被检查基板上的缺陷的系统，并且通过设置在所述检测光学系统上的检测光学系统检测所述缺陷 上部，其实时校正成像的高度以改变温度和大气压力，以便将成像保持在最佳状态。

    Defect inspecting apparatus
    114.
    发明授权
    Defect inspecting apparatus 失效
    缺陷检查装置

    公开(公告)号：US07535561B2

    公开(公告)日：2009-05-19

    申请号：US11717651

    申请日：2007-03-14

    Applicant: Shuichi Chikamatsu ,  Minori Noguchi ,  Kenji Aiko

    Inventor： Shuichi Chikamatsu ,  Minori Noguchi ,  Kenji Aiko

    IPC: G01N21/00

    CPC classification number: G01N21/9501 ,  G01N21/94 ,  G01N2021/8822 ,  G01N2201/1211 ,  G01N2201/1218

    Abstract: A defect inspecting apparatus of the invention solves a problem that in a defect inspecting apparatus, because of improving detection sensitivity of a microscopic defect by reducing a detection pixel size, a focal depth becomes shallow, a height of imaging is varied due to environmental change and the detection sensitivity of a defect becomes unstable. This apparatus comprises an XY stage, which carries a substrate to be inspected and scans in a predetermined direction, and a mechanism having a system of irradiating a defect on the inspected substrate at a slant and detecting the defect by a detection optical system disposed on the upper side, which corrects a height of imaging in real time for change in temperature and barometric pressure in order to keep the imaging in a best condition.

    Abstract translation: 本发明的缺陷检查装置解决了在缺陷检查装置中，由于通过减小检测像素尺寸来提高微观缺陷的检测灵敏度，焦点深度变浅，成像高度由于环境变化而变化， 缺陷的检测灵敏度变得不稳定。 该装置包括XY台，其承载待检查的基板和沿预定方向扫描的机构，以及具有以倾斜方式照射被检查基板上的缺陷的系统的机构，并且通过设置在该检测光学系统上的检测光学系统检测该缺陷 上部，其实时校正成像的高度以改变温度和大气压力，以便将成像保持在最佳状态。

    Method and apparatus for measuring oxygen concentration
    116.
    发明申请
    Method and apparatus for measuring oxygen concentration 失效
    测量氧浓度的方法和装置

    公开(公告)号：US20070212792A1

    公开(公告)日：2007-09-13

    申请号：US11375557

    申请日：2006-03-13

    Applicant: Marvin Havens ,  Darrell Austin ,  Douglas Paul

    Inventor： Marvin Havens ,  Darrell Austin ,  Douglas Paul

    IPC: G01N21/76

    CPC classification number: G01N21/643 ,  G01M3/226 ,  G01M3/38 ,  G01N21/6408 ,  G01N31/225 ,  G01N31/229 ,  G01N2021/6432 ,  G01N2021/6478 ,  G01N2201/0221 ,  G01N2201/1211 ,  Y10T436/20

    Abstract: An apparatus and non-invasive method of measuring oxygen by exciting a luminescent compound disposed in a container and then measuring the intensity of the light emitted by the excited luminescent compound as it relaxes to the ground state. A plot of emission intensity as a function of time results in an exponential decay curve the area of which is inversely proportional to the oxygen concentration. The oxygen concentration can be determined over a wide temperature range by measuring the temperature of the container and the emission intensity and then applying the following equation: [O2]=(ATa(T)2+BTa(T)+CTa)(tau)2+(ATb(T)2+BTb(T)+CTb)(tau)+(ATc(T)2+BTc(T)+CTc) T is the measured temperature; tau is the area of the exponential decay curve; and ATa, BTa, CTa, ATb, BTb, CTb, ATc, BTc, and CTc are coefficients that are specific to the luminescent compound being examined.

    Abstract translation: 一种通过激发设置在容器中的发光化合物测量氧的装置和非侵入性方法，然后测量由激发的发光化合物在其弛豫到基态时发射的光的强度。 作为时间的函数的发射强度的图形导致指数衰减曲线，其面积与氧浓度成反比。 通过测量容器的温度和发射强度可以在较宽的温度范围内确定氧浓度，然后应用以下等式：<？in-line-formula description =“In-line formula”end =“lead”？ （T）2 + B Ta（T）+ C < （T a）Ta（T）2（+）Tb（T）＆lt;＆lt;＆lt; （T）+ C Tb（T）T（T）+（C）T（T） （T）+ C 在线公式描述=“在线公式”end =“tail”？> T是测量温度; tau是指数衰减曲线的面积; 和Ta，Ta，Ta，Ta，Ta，Tb，Tb，Tb， C Tb，C Tc，B Tc和C Tc是对发光化合物特异的系数 被检查

    Gas Sensor Arrangement With Improved Long Term Stability and Measuring Method
    117.
    发明申请
    Gas Sensor Arrangement With Improved Long Term Stability and Measuring Method 失效
    气体传感器布置改进了长期稳定性和测量方法

    公开(公告)号：US20060249681A1

    公开(公告)日：2006-11-09

    申请号：US11380787

    申请日：2006-04-28

    Applicant: Robert Frodl

    Inventor： Robert Frodl

    IPC: G01N21/35

    CPC classification number: G01J3/10 ,  G01N21/3151 ,  G01N21/3504 ,  G01N2201/1211

    Abstract: The present invention relates to a gas sensor arrangement comprising at least one radiation source emitting radiation, a gas measuring chamber which may be filled with a gaseous analyte containing at least one analyte to be measured, and comprising at least one detector device which detects the radiation and generates an output signal indicating the presence and/or the concentration of the analyte. In order to provide an improved gas sensor arrangement of the type mentioned at the outset which ensures, in a particularly simple manner, long-term stable operation of the arrangement even over long periods of time, the control device comprises a power detection unit which may be operated to measure the electrical output consumed by the at least one radiation source.

    Abstract translation: 气体传感器装置技术领域本发明涉及一种气体传感器装置，其包括至少一个发射辐射源的辐射源，气体测量室，其可以填充含有待测量的至少一种分析物的气态分析物，并且包括至少一个检测器 并产生指示分析物的存在和/或浓度的输出信号。 为了提供一种在一开始提到的类型的改进的气体传感器装置，其以特别简单的方式即使在长时间段内长期稳定地运行，这种控制装置包括功率检测单元 操作以测量由至少一个辐射源消耗的电输出。

    Method of compensating for a measuring error and an electronic arrangement to this end
    119.
    发明申请
    Method of compensating for a measuring error and an electronic arrangement to this end 审中-公开
    为此，补偿测量误差和电子布置的方法

    公开(公告)号：US20060173637A1

    公开(公告)日：2006-08-03

    申请号：US11349454

    申请日：2006-04-18

    Applicant: Hans Evald Martin

    Inventor： Hans Evald Martin

    IPC: G01N31/00

    CPC classification number: G01D3/0365 ,  G01D3/036 ,  G01N21/274 ,  G01N21/3504 ,  G01N33/0006 ,  G01N2201/1211

    Abstract: A method and electronic arrangement for measuring errors with the aid of a gas sensor wherein a plurality of measurement valves occurring instantly during mutual sequential measuring cycles are detected. The electronic circuit arrangement has a plurality of circuit arrangements for compensating measurement errors wherein the measurements are affect with a gas sensor.

    Abstract translation: 一种借助于气体传感器测量误差的方法和电子装置，其中检测在相互顺序测量循环期间立即发生的多个测量阀。 电子电路装置具有用于补偿测量误差的多个电路装置，其中测量结果与气体传感器有关。

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