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    THERMAL OPTICAL CHUCK
    123.
    发明申请
    THERMAL OPTICAL CHUCK 审中-公开

    公开(公告)号：WO2005121824A3

    公开(公告)日：2005-12-22

    申请号：PCT/US2005/015977

    申请日：2005-05-06

    Applicant: CASCADE MICROTECH, INC. ,  RUMBAUGH, Scott

    Inventor： RUMBAUGH, Scott

    IPC: G01R31/02

    Abstract: An accessible optical path (34) to a lower surface of a heatable device under test is provided by a thermal optical chuck (20) comprising a transparent resistor (38) deposited on transparent plate (36) arranged to supporting the device in a probe station.

    PROBE STATION WITH LOW NOISE CHARACTERISTICS
    127.
    发明申请
    PROBE STATION WITH LOW NOISE CHARACTERISTICS 审中-公开
    低噪声特征的探测站

    公开(公告)号：WO2004044949A2

    公开(公告)日：2004-05-27

    申请号：PCT/US2003/033842

    申请日：2003-10-24

    Applicant: CASCADE MICROTECH, INC. ,  LESHER, Timothy ,  MILLER, Brad ,  COWAN, Clarence, E. ,  SIMMONS, Michael ,  GRAY, Frank ,  McDONALD, Cynthia, L.

    Inventor： LESHER, Timothy ,  MILLER, Brad ,  COWAN, Clarence, E. ,  SIMMONS, Michael ,  GRAY, Frank ,  McDONALD, Cynthia, L.

    IPC: H01L

    CPC classification number: G01R1/18 ,  G01R19/0053 ,  G01R31/2886 ,  G01R31/2889 ,  H01B11/206

    Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    Abstract translation: 电缆包括内部导体，内部电介质和保护导体，其中内部电介质位于内部导体和保护导体之间。 电缆还包括外部电介质和屏蔽导体，其中外部电介质位于保护导体和屏蔽导体之间。 电缆还包括在外部电介质和屏蔽导体之间的适当组合物的附加材料层，用于减少外部电介质和屏蔽导体之间产生的摩擦电流，使其小于外电介质和屏蔽导体直接发生的摩擦电流 相邻。

    MEMBRANE PROBING SYSTEM
    129.
    发明申请
    MEMBRANE PROBING SYSTEM 审中-公开
    膜探测系统

    公开(公告)号：WO2003052435A1

    公开(公告)日：2003-06-26

    申请号：PCT/US2002/026475

    申请日：2002-08-19

    Applicant: CASCADE MICROTECH, INC. ,  SMITH, Kenneth ,  GLEASON, Reed

    Inventor： SMITH, Kenneth ,  GLEASON, Reed

    IPC: G01R31/16

    CPC classification number: G01R1/0735

    Abstract: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.

    Abstract translation: 膜探测组件包括其上承载有导体的探针卡，其中所述导体至少包括位于一对间隔开的保护导体之间的信号导体。 膜组件包括其上具有触点的膜，并且支撑位于一对间隔开的保护导体之间的至少一个信号导体。 探针卡的保护导体在探针卡和膜组件之间的互连附近电互连。 膜组件的保护导体在探针卡和膜组件之间的互连附近电互连。

    CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST
    130.
    发明申请
    CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST 审中-公开

    公开(公告)号：WO2018102259A1

    公开(公告)日：2018-06-07

    申请号：PCT/US2017/063305

    申请日：2017-11-27

    Applicant: CASCADE MICROTECH, INC.

    Inventor： BOCK, Daniel Mark ,  CLEARY, Tim

    IPC: G01R31/302 ,  G01R1/00 ,  G01R1/073

    Abstract: Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (DUT). A contact engine includes a flexible dielectric membrane having a first surface and a second surface and a plurality of probes supported by the flexible dielectric membrane. The plurality of probes are oriented to contact a plurality of contact locations on the DUT. Each probe in the plurality of probes includes a corresponding probe tip that projects from the second surface of the flexible dielectric membrane and is configured to electrically and physically contact a corresponding contact location of the plurality of contact locations. The contact engine further includes at least one membrane antenna supported by the flexible dielectric membrane. A probe head assembly includes the contact engine, A probe system includes the probe head assembly. Associated methods include methods of utilizing the contact engine.

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