Abstract:
PURPOSE: A gas sensor structure including a diamond film and a method for measuring gas by using the same are provided to effectively detect gas for a long period of time. CONSTITUTION: A diamond film gas sensor structure includes a plurality of diamond film detection layers(12), a reference sensor(14), a motor driving section(30), and a control unit. The diamond film detection layers(12) are aligned on an upper surface of a silicon wafer. The reference sensor generates a predetermined standard resistant rate. The motor driving section(30) drives the silicon wafer. The control unit measures a resistant rate of the diamond film detection layers(12) and operates the motor driving section(30). The control unit compares the resistance rate of the diamond film detection layers(12) with the standard resistant rate of the reference sensor.
Abstract:
PURPOSE: A magnetron sputtering evaporation source having high evaporation rate is provided which improves cooling efficiency through change of cooling method, improves evaporation ratio and target efficiency by changing intensity and shape of a line of magnetic force and enables sputtering to be performed even at high vacuum. CONSTITUTION: In a magnetron sputtering evaporation source comprising a target(17) that is a material to be evaporated, a target holder(14) for supporting the target, and a plurality of permanent magnets(11,11',11") for forming a line of magnetic force(18) on the surface of the target, the magnetron sputtering evaporation source comprises a magnetic substance disk(16) for enlarging intensity of the line of magnetic force as making the line of magnetic force in a flat shape; and a cooling water line(13) installed with being contacted with the inner circumferential surface of the target holder to cool the target holder, wherein the magnetic substance disk is pure iron, wherein the magnetic substance disk is positioned between the respective permanent magnets, and wherein the magnetic substance disk is positioned in the target holder.
Abstract:
PURPOSE: A pickup device for detecting a metallic member by using a Hall sensor is provided to prevent electronic noise and to improve productivity by reducing malfunction of the pickup device. CONSTITUTION: A pickup device is horizontally installed over a conveyer in order to effectively detect a metallic member. The pickup device includes a Hall device(36) and an excite coil(33) which is coaxially aligned with respect to the HALL device(36) at a peripheral portion of the Hall device(36). The Hall device(36) is driven by a static current source. The excite coil(33) is driven by a power source based on a signal generated from a pulse generator. In order to measure a value of a secondary magnetic field, a ferro magnetic member is attached to a rear surface of the HALL device(36).
Abstract:
PURPOSE: A structure of a PH sensor detecting electrode and a method for forming the same are provided to simplify manufacturing processes and achieve a uniform article by forming the PH sensor detecting electrode using ion implantation. CONSTITUTION: A PH sensor detecting electrode includes a detecting electrode(12) and a reference electrode. A negative ion layer(26) is formed at a lower portion of the detecting electrode(12) by implanting ions into the lower portion of the detecting electrode(12). In order to prevent the negative ions from spreading towards a silicon wafer(20), a trench(22) is formed at a lower end of the silicon wafer(20) adjacent to the negative ion layer(26). The trench(22) is filled with a wall structure(24) including Si3N4 through a chemical vapor deposition process.
Abstract translation:目的:提供PH传感器检测电极的结构及其形成方法,以通过使用离子注入形成PH传感器检测电极来简化制造工艺并实现均匀的制品。 构成:PH传感器检测电极包括检测电极(12)和参考电极。 通过将离子注入检测电极(12)的下部,在检测电极(12)的下部形成负离子层(26)。 为了防止负离子朝向硅晶片(20)扩散,在邻近负离子层(26)的硅晶片(20)的下端形成有沟槽(22)。 沟槽(22)通过化学气相沉积工艺填充包括Si 3 N 4的壁结构(24)。
Abstract:
PURPOSE: A sensor for measuring hydrogen ion concentration having an insulation layer between electrodes is provided to obtain complete chemical and electrical insulation between a detecting electrode and a reference electrode, thereby improving the accuracy of measurement and the productivity. CONSTITUTION: A sensor for measuring hydrogen ion concentration having an insulation layer between electrodes includes a semiconductor wafer base having a measurement groove(12) and a reference groove(14) each opening the lower part; a detecting electrode(16) placed on the surface of the measurement groove and a reference electrode(18) placed on the surface of the reference groove; an insulation layer(30) coated under the lower surface of the base for chemical and electric insulation between the electrodes, and having through holes(30a) each communicating with the lower hole(12a,14a) of each groove; a sensing membrane(32) attached to the insulation layer to close the through hole communicating with the lower hole of the measurement groove; a porous member(34) attached to the insulation layer to close the through hole communicating with the lower hole of the reference groove; a filling solution(24) filled in each groove, contacting with each electrodes, and independently contacting with the sensing membrane and the porous member; and a sealing member(28) preventing the filling solution filled in each groove from evaporating and drying.
Abstract:
PURPOSE: A sensor measuring hydrogen ion concentration is provided to easily handle the sensor and simply carry out the sensor while maintaining accurate measurement and extending the life, thereby improving the productivity and application. CONSTITUTION: A sensor measuring hydrogen ion concentration includes a semiconductor wafer base(20) having a measurement groove(22) and a reference groove(24) each opening the lower part; a measurement electrode(26) placed on the surface of the measurement groove and connected to a voltmeter(36) for measuring excited voltage; a reference electrode(28) placed on the surface of the reference groove and connected to the voltmeter; a sensing membrane(30) closing the lower hole of the measurement groove and contacting with a solution to be measured; an agar(32) closing the lower hole of the reference groove and contacting with the solution to be measured; a filling solution(34) filled in each groove, contacting with each electrode, and independently contacting with the sensing membrane and the agar; and a sealing member(38) applied on the base for preventing the solution filled in each groove from evaporating and drying.
Abstract:
PURPOSE: An eliminating apparatus for a plating layer of a welded part for a shaper steel of shipbuilding using a shot blast is provided to peel a plated layer of the welded part continuously by spraying compressed air with polishing power. CONSTITUTION: An eliminating apparatus for a plating layer of a welded part comprises a body(10); a vacuum pump(20); a dust collector(30); a polishing powder recovery tank(40); a polishing powder supply unit(50); a compressed air supply pump(60) and a static pressure air tank(70). A part of a shaper steel(4) is inserted inside of the body. An end plated portion of the body is polished by compressed air with polishing powder. The vacuum pump draws polishing powder of the body. Contaminated dust in polishing powder is collected to the dust collector. The polishing powder recovery tank stores polishing powder removed with contaminant. The polishing powder supply unit transfers polishing powder of the recovery tank to a shot blast nozzle in the body. The compressed air supply pump produces and supplies compressed air to the polishing powder supply unit. The static pressure air tank supplies transformed compressed air to an air curtain nozzle(18) of the body. Thereby, a surface of the welded part is clean than usual method and separate contacting components is not used during manufacturing process.
Abstract:
PURPOSE: A method for forming a Ta coating film by sputtering is provided which easily forms a β-phase having a high activity by controlling substrate temperature and substrate bias voltage using a nonequilibrium magnetron sputtering evaporation source as a sputtering evaporation source. CONSTITUTION: In a method for forming a Ta coating film on the surface of a Ti material using a sputtering evaporation source, the method for forming the Ta coating film by sputtering comprises the process of forming the Ta coating film on the surface of the Ti material by controlling substrate temperature of the Ti material and substrate bias voltage respectively so that a ratio of X ray diffraction peak to a phase of the Ta coating film(β/α) becomes 1 or more using a nonequilibrium magnetron sputtering evaporation source as a sputtering evaporation source(2), wherein a bias voltage is not impressed to the substrate(4), the substrate is floated, and the ratio of X ray diffraction peak(β/α) is represented in a ratio of magnitudes of β peak and α peak.
Abstract:
PURPOSE: A sensor for measuring hydrogen ion concentration having a temperature sensor and an apparatus for measuring hydrogen ion concentration having the sensor are provided to easily use the sensor and reduce the size of the sensor by detecting temperature as well as hydrogen ion concentration. CONSTITUTION: An apparatus for measuring hydrogen ion concentration includes a sensor measuring hydrogen ion concentration having a temperature sensor(28); an amplifier(34) amplifying the hydrogen ion concentration measured by the sensor; a collective amplifier(36) collecting the amplified hydrogen ion concentration value for amplifying; a differential amplifier(42) directly connected to the temperature sensor for receiving an actual temperature value detected by the temperature sensor and receiving the temperature value through a detecting circuit(32), so that the differential amplifier differentiates and amplifies each temperature value; a CPU(38) calculating and outputting the corrected hydrogen ion concentration value and the temperature value by using the amplified hydrogen ion concentration value and the temperature value; and a display(40) visually providing the output value output from the CPU.
Abstract:
PURPOSE: A sensor for measuring hydrogen ion concentration having an insulation layer between electrodes is provided to obtain complete chemical and electrical insulation between a detecting electrode and a reference electrode, thereby improving the accuracy of measurement and the productivity. CONSTITUTION: A sensor for measuring hydrogen ion concentration having an insulation layer between electrodes includes a semiconductor wafer base having a measurement groove(12) and a reference groove(14) each opening the lower part; a detecting electrode(16) placed on the surface of the measurement groove and a reference electrode(18) placed on the surface of the reference groove; an insulation layer(30) coated under the lower surface of the base for chemical and electric insulation between the electrodes, and having through holes(30a) each communicating with the lower hole(12a,14a) of each groove; a sensing membrane(32) attached to the insulation layer to close the through hole communicating with the lower hole of the measurement groove; a porous member(34) attached to the insulation layer to close the through hole communicating with the lower hole of the reference groove; a filling solution(24) filled in each groove, contacting with each electrodes, and independently contacting with the sensing membrane and the porous member; and a sealing member(28) preventing the filling solution filled in each groove from evaporating and drying.