Abstract:
PROBLEM TO BE SOLVED: To provide a laser device that more facilitates synchronizing the laser device with a droplet stream of a fuel material. SOLUTION: The laser device 65 includes a seed laser 67, one or more amplifiers 79, 81, 83, 85, a detector 87, and one or more optical elements 71, 73, 75, 77 for guiding a radiation emitted by the seed laser 67 towards a plasma generation site 90. The optical elements guide an amplified spontaneous emission radiation which has been emitted by the seed laser 67 and has been reflected from a droplet 93 of a fuel material towards the detector. The detector 87 triggers the generation of a laser radiation pulse by the seed laser 67 when the reflected amplified spontaneous emission radiation is detected. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method and/or apparatus for increasing the time taken to allow fuel droplets to pass through a laser beam pulse. SOLUTION: A radiation source is configured so as to generate radiation. The radiation source includes: a fuel droplet generator, configured so as to generate the flow of fuel droplets to be guided to a plasma generating portion; a laser which is a laser configured to generate a laser beam to be guided to the plasma generating portion and in which an angle between a direction of movement of the flow of droplets and a direction of the laser beam is smaller than 90°C; and a collector configured so as to condense the radiation generated by plasma formed by the plasma forming portion, when the radiation beam collides with the droplets. The collector is configured so as to substantially reflect the radiation along an optical axis of the radiation source. The laser beam is guided to the plasma generating portion through an aperture provided on the collector. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a system that efficiently and effectively eliminate energy loss in a lithographic apparatus where a related component is locally cooled by evaporation of a supplied liquid and may be deformed and change in quality to possibly cause defocusing and lens aberrations during immersion lithography in which the part between a projection system and a substrate is filled with an immersion liquid so as to increase a numerical aperture. SOLUTION: A schedule table 34 is prepared which contains information regarding time when the supplied liquid 11 is most apt to evaporate, the position, speed, acceleration, etc. of the substrate, and a liquid evaporation controller 30 heats at least part of the substrate W by a heater or sends humidifying air according to the schedule table 34 to prevent local evaporation. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To disclose a table in which measures are taken to seal between the table and an edge of an object, in use, supported on the table. SOLUTION: In particular, a capillary passage is formed between the object on the table and the table itself. A meniscus pinning feature and/or the presence of an overpressure at the radially inward side of the capillary passage holds the liquid in the passage and helps prevent it from advancing further radially inwardly. The features to perform this function may be associated with or formed in a member surrounding the object. The member may be thermally decoupled from a part of the table. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an inexpensive constitution of a double facet illumination system in which an illumination mode thereof can be variably controlled, and to provide a method for controlling the illumination mode in such an illumination system. SOLUTION: An illumination system IL of a lithographic apparatus includes a first optical element 100 comprising first raster elements 110 that divide radiation beam into a plurality of radiation channels, and a second optical element 160 to receive the plurality of radiation channels, the second optical element 160 comprising second raster elements 150. For each of the radiation channels, a raster element of the first raster elements is associated with respective raster elements of the second raster elements to provide a continuous beam path from the first optical element to an object plane. A filter SF is provided in a path through which the radiation beam has passed to create a desired spatial intensity distribution in a pupil of the illumination system IL. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To increase the stable operating range of active damping. SOLUTION: A lithographic apparatus comprises an illumination system, configured to condition a radiation beam and a support constructed to support a patterning device. The lithographic apparatus further comprises a substrate table constructed to hold a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate. An active damping system is provided to dampen a vibration of at least part of the projection system. The active damping system comprises a combination of a sensor to measure the position quantity of the projection system, and an actuator to exert a force on the projection system with the dependence on a signal provided by the sensor. The active damping system is connected to a damping mass, with the damping mass being connected to the projection system. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion lithographic apparatus in which the generation of bubbles in immersion liquid is reduced. SOLUTION: The immersion lithographic projection apparatus has a liquid confinement structure configured to at least partly confine liquid to a space between a projection system and a substrate, the confinement structure has a buffer surface, and the buffer surface, when in use, is positioned in close proximity to a plane substantially comprising the upper surface of the substrate and of a substrate table holding the substrate to define a passage having a flow resistance. A recess is provided in the buffer surface, the recess, when in use, is normally full of the immersion liquid to achieve rapid filling of a gap between the substrate and substrate table as the gap moves under the buffer surface. The recess may be annular or radial and a plurality of recesses may be provided. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To enable an effective control of optical performance of an immersion lithographic projection system. SOLUTION: An immersion lithographic apparatus includes a lens having optical properties which can be adjusted by an adjusting device formed from an immersion liquid filled up between a final element of the projection system and a substrate. The adjusting device is arranged to adjust the properties of the liquid lens such as the shape, composition, refractive index or absorption index as a function of space or time in order to change the imaging performance of the immersion lithographic apparatus. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To detect deviation of a patterning device in lithographic equipment. SOLUTION: In the lithographic equipment, a position of a support to a first structure of the lithographic equipment is measured, and a position of the patterning device to a second structure of the lithographic equipment is measured. A correlation between the position of the patterning device and the position of the support is judged from the measured position of the support, the measured position of the patterning device, and mutual positions of the first structure and the second structure. The deviation of the patterning device to the support is obtained from the correlation, by which the deviation of the patterning device to the support is detected, wherein the support is constituted to support the patterning device. The structure may include a projection system to project a radiation beam which is patterned by the patterning device. The projection system can be connected with a frame such as a metrology frame of the lithographic equipment. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography system capable of improving precision of an image projected on a substrate and reducing idle time. SOLUTION: A lithography apparatus is equipped with a connection system for positioning a patterning means against a reticle stage 25. This lithography projection apparatus has an operation cycle including: a projection phase where the projection system projects a patterned beam on a target part of a substrate and the reticle stage 25 supports the patterning means 1; and an exchange phase where the patterning means is exchanged and the connection system positions the patterning means against the reticle stage. The lithography apparatus is characterized in that the connection system is separated with a distance from the patterning means during the projection phase, thereby the projection image of higher precision is obtained. COPYRIGHT: (C)2008,JPO&INPIT