公开(公告)号：US11269170B2

公开(公告)日：2022-03-08

申请号：US16719386

申请日：2019-12-18

Applicant: CHROMA ATE INC.

Inventor： Shih-Yao Pan ,  Yu-Yen Wang ,  Tsung-Hsien Ou ,  Kuo-Wei Huang

IPC: G02B21/00 ,  G02B21/02 ,  G02B21/36

Abstract: A separate microscopy system, applied to observe a specimen positioned on a stage and further to image the specimen on an imaging device, includes an ocular-lens unit, an adjustment unit and an objective-lens unit. The ocular-lens unit has an ocular-lens optical axis, and is manipulated to make the ocular-lens optical axis perpendicular to the stage. The adjustment unit is assembled to a side of the ocular-lens unit close to the stage. The objective-lens unit has an objective-lens optical axis, and is assembled to a side of the adjustment unit close to the stage. The objective-lens unit is manipulated to be adjusted by the adjustment unit to make the ocular-lens optical axis, the objective-lens optical axis and the imaging device co-axially and perpendicular to the stage, such that the specimen can be imaged at an imaging center position of the imaging device. In addition, an adjusting method thereof is also provided.

公开(公告)号：US11169178B2

公开(公告)日：2021-11-09

申请号：US17023445

申请日：2020-09-17

Applicant: Chroma Ate Inc.

Inventor： Chin-Yi Ouyang ,  Chien-Ming Chen ,  Bo-An Su ,  Yu-Hsuen Wang

IPC: G01R1/04

Abstract: The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.

公开(公告)号：US10903618B2

公开(公告)日：2021-01-26

申请号：US16358812

申请日：2019-03-20

Applicant: Chroma Ate Inc.

Inventor： James E. Hopkins

IPC: H01S5/00 ,  G01R31/26 ,  H01S5/024

Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.

公开(公告)号：US10802070B2

公开(公告)日：2020-10-13

申请号：US15955668

申请日：2018-04-17

Applicant: CHROMA ATE INC.

Inventor： Ching-Hua Chu ,  Cheng-Hsien Chang

IPC: G01R31/28 ,  G01R1/36

Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

公开(公告)号：US10712366B2

公开(公告)日：2020-07-14

申请号：US16222391

申请日：2018-12-17

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang Hsu ,  Kuo-Yen Hsu ,  Chuan-Tse Lin

IPC: G01R1/067

Abstract: An electrical probe includes a probe assembly and a second electrical connection member. The probe assembly includes a needle cylinder, a first electrical connection member, a probe head and a sub-probe. The first electrical connection member and the probe head locate to two opposite sides of the needle cylinder. The first electrical connection member and the probe head electrically connect the needle cylinder. The sub-probe penetrates the probe head, and plugs the needle cylinder to electrically connect a cable but being electrically isolated from the needle cylinder. The sub-probe is located on a side away from the first electrical connection member. When the probe head depresses the object, the needle cylinder drives the first cylinder to a contact position to allow the first electrical connection member to electrically contact the second electrical connection member, and thus the probe head connects the second electrical connection member via the needle cylinder.

公开(公告)号：US10411646B2

公开(公告)日：2019-09-10

申请号：US16013917

申请日：2018-06-20

Applicant: CHROMA ATE INC.

Inventor： Cheng-Ting Tsai ,  Lan-Sheng Yang

IPC: H02S50/10 ,  G02B27/30 ,  H01L31/048 ,  H01L31/0224 ,  H02S50/15

Abstract: A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.

公开(公告)号：US20190067759A1

公开(公告)日：2019-02-28

申请号：US16108081

申请日：2018-08-21

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang HSU ,  Kuo-Yen HSU ,  Kuan-Chen CHEN ,  Chuan-Tse LIN

IPC: H01M10/48 ,  H01M10/42 ,  G01R31/36

CPC classification number: H01M10/482 ,  G01R31/385 ,  H01M2/1016 ,  H01M10/4207 ,  H01M10/4285 ,  H01M10/446 ,  H01M10/484

Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.

公开(公告)号：US20180188132A1

公开(公告)日：2018-07-05

申请号：US15846026

申请日：2017-12-18

Applicant: CHROMA ATE INC.

Inventor： Po-Kai CHENG ,  Chang-Chi YANG ,  Chi-Shu WANG

IPC: G01M3/32 ,  G01R1/067 ,  G01R31/26

CPC classification number: G01M3/3272 ,  G01M3/3263 ,  G01M3/3281 ,  G01R1/0416 ,  G01R1/06722 ,  G01R31/2601 ,  G01R31/2862 ,  G01R31/2881

Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

公开(公告)号：US09494353B2

公开(公告)日：2016-11-15

申请号：US14302442

申请日：2014-06-12

Applicant: CHROMA ATE INC.

Inventor： Ben-Mou Yu ,  Ming-Chieh Lin ,  Ching-Wen Chang ,  Xin-Yi Wu

IPC: F25B21/02 ,  F25B49/00 ,  G05D23/19

CPC classification number: F25B49/00 ,  F25B21/02 ,  G05D23/1919

Abstract: A temperature control equipment is capable of controlling a tested object to a predetermined temperature. The temperature control equipment includes a thermal conducting plate, a temperature regulating module, a carrier plate, and a thermoelectric cooling module. The temperature regulating module is thermally connected to the thermal conducting plate for regulating the thermal conducting plate to a reference temperature. The carrier plate is used to accommodate the tested object. The thermoelectric cooling module is thermally connected between the thermal conducting plate and the carrier plate for controlling the tested object to the predetermined temperature via the carrier plate based on the reference temperature.

Abstract translation: 温度控制设备能够将测试对象控制到预定温度。 温度控制设备包括导热板，温度调节模块，承载板和热电冷却模块。 温度调节模块热连接到用于将导热板调节到参考温度的导热板。 承载板用于容纳被测物体。 热电冷却模块热连接在导热板和承载板之间，用于基于参考温度经由载板将测试对象控制到预定温度。

公开(公告)号：US20150226794A1

公开(公告)日：2015-08-13

申请号：US14617892

申请日：2015-02-09

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN

IPC: G01R31/28 ,  G01R1/04

CPC classification number: G01R31/2893 ,  G01R1/0433 ,  G01R31/2867 ,  G01R31/2887 ,  G01R31/2896 ,  H01L2224/48227 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00012

Abstract: An apparatus for testing a package-on-package semiconductor device comprises a pick and place device for loading a first chip into or unloading the first chip from a test socket and a lifting and rotating arm for moving a chip placement module which receives a second chip to a position between the pick and place device and the test socket. The pick and place device and the chip placement module are lowered, and then a test process is performed. After the test process is completed, the pick and place device and the chip placement module are lifted, and the lifting and rotating arm moves the chip placement module to one side of the pick and place device. Accordingly, a method for testing the semiconductor device could be performed automatically so as to greatly enhance test efficiency and accuracy and to significantly reduce costs.

Abstract translation: 一种用于测试封装封装半导体器件的装置，包括用于将第一芯片从测试插座加载到第一芯片或从其卸载的拾取和放置装置，以及用于移动芯片放置模块的提升和旋转臂，芯片放置模块接收第二芯片 到拾取和放置设备与测试插座之间的位置。 拾取和放置装置和芯片放置模块降低，然后进行测试处理。 测试过程完成后，拾取和放置设备和芯片放置模块被提起，提升和旋转臂将芯片放置模块移动到拾取和放置设备的一侧。 因此，可以自动进行半导体装置的测试方法，大大提高测试效率和精度，并显着降低成本。