Testing device and testing method with spike protection

    公开(公告)号:US10802070B2

    公开(公告)日:2020-10-13

    申请号:US15955668

    申请日:2018-04-17

    Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

    Clock generating device
    3.
    发明授权

    公开(公告)号:US09647650B2

    公开(公告)日:2017-05-09

    申请号:US14971044

    申请日:2015-12-16

    CPC classification number: H03K5/135 G06F1/04 G06F1/06 H03K2005/00078

    Abstract: A clock generating device includes a first timing delay module, a multiplexer, and a second timing delay module. The multiplexer is electrically connected to the first timing delay module. The second timing delay module is electrically connected to the multiplexer. The first timing delay module generates a plurality of delayed clock signals based on a reference clock signal. The multiplexer outputs a first delayed clock signal and a second delayed clock signal, among the plurality of delayed clock signals, based on a clock generating signal. The second timing delay module generates an output clock signal based on the clock generating signal, the first delayed clock signal and the second delayed clock signal.

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