公开(公告)号：US20170132778A1

公开(公告)日：2017-05-11

申请号：US15341806

申请日：2016-11-02

Applicant: ACEMACH CO.,LTD

Inventor： CHIH-CHIANG CHANG

IPC: G06T7/00 ,  G01B11/14 ,  G01N21/956 ,  H04N5/225 ,  H04N5/232

CPC classification number: G06T7/0004 ,  G01B11/14 ,  G01N21/956 ,  G01N2021/95676 ,  G01N2201/025 ,  G06T7/337 ,  G06T2207/30148 ,  H04N5/2256 ,  H04N5/2257 ,  H04N5/23203

Abstract: A mask inspection device and method thereof are provided. In the mask inspection device, an image capturing module is controlled to capture an image of the object to be inspected, and when the captured image does not match a predetermined correction image, a horizontal position of the bearing module which holds the object is adjusted; when the captured image matches the predetermined correction image, a light emission element projects a spot light towards the object, and the image capturing module captures an image in a mask region of the object, so as to produce a mask inspection image. The mask inspection information can be obtained from a two-dimensional image of the mask inspection image, and an abnormal image of the mask inspection image is inspected to generate mask abnormal information.

公开(公告)号：US09612194B2

公开(公告)日：2017-04-04

申请号：US14131035

申请日：2012-07-09

Applicant: Michael A. Davis ,  Andrew E. Carlson ,  David O. Winkowski ,  John V. Viega ,  Alan D. Kersey ,  Mark R. Fernald

Inventor： Michael A. Davis ,  Andrew E. Carlson ,  David O. Winkowski ,  John V. Viega ,  Alan D. Kersey ,  Mark R. Fernald

IPC: G01N21/27 ,  H04N5/33 ,  G01N21/31 ,  G01N33/24 ,  G01N21/3563 ,  G01G19/08 ,  G01N21/84 ,  G06T7/00

CPC classification number: G01N21/27 ,  G01G19/08 ,  G01N21/31 ,  G01N21/3563 ,  G01N21/84 ,  G01N33/241 ,  G01N2201/025 ,  G01N2201/08 ,  G01N2201/12 ,  G06T7/00 ,  G06T2207/30181 ,  H04N5/332

Abstract: Apparatus is provided featuring a signal processor or signal processing module configured to receive signaling containing information about images of an ore sample; and determine information about a Bitumen Content of the ore sample based at least partly on the signaling, including for use in real time ore blend management in a bitumen recovery process related to mined oil sands. The ore sample may be an ore face, and the signaling may contain information about the images of the ore face. The signal processor or signal processing module may be configured to determine a real time ore face ore grade visualization based at least partly on the signaling, and provide corresponding signaling containing information about the real time ore face ore grade visualization, including a composite overlay image.

公开(公告)号：US09500556B2

公开(公告)日：2016-11-22

申请号：US13656123

申请日：2012-10-19

Applicant: Picarro, Inc.

Inventor： Chris W. Rella ,  Eric R. Crosson ,  Sze Meng Tan

IPC: G06F15/00 ,  G01M3/20 ,  G01N21/3504 ,  G01N21/39 ,  G01M3/38 ,  G01N21/03

CPC classification number: G01M3/20 ,  G01M3/38 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/0314 ,  G01N2201/025

Abstract: Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. These methods can be practiced individually or in any combination.

Abstract translation: 提供了从移动平台改进的气体泄漏检测。 可以进行自动水平空间尺度分析，以区分泄漏与被测气体的背景水平。 可以通过使用同位素比率和/或化学示踪剂来提供源识别，以区分气体泄漏与测量气体的其他来源。 多点测量结合多点测量结果的空间分析可以提供泄漏源距离估计。 这些方法可以单独或以任何组合实施。

公开(公告)号：US20160281150A1

公开(公告)日：2016-09-29

申请号：US15077182

申请日：2016-03-22

Applicant: Illumina, Inc. ,  Illumina Cambridge Limited

Inventor： Stephen Rawlings ,  Venkatesh Mysore Nagaraja Rao ,  Beng Keong Ang ,  Nitin Udpa

IPC: C12Q1/68

CPC classification number: C12Q1/6837 ,  B01L3/5027 ,  B01L7/52 ,  B01L9/52 ,  B01L9/527 ,  B01L2300/0654 ,  B01L2300/0816 ,  B01L2300/0822 ,  B01L2300/0877 ,  C12Q1/6869 ,  G01N21/13 ,  G01N21/253 ,  G01N21/6452 ,  G01N35/04 ,  G01N35/1095 ,  G01N2035/00356 ,  G01N2035/00752 ,  G01N2035/0091 ,  G01N2201/025 ,  G02B21/34

Abstract: Method includes positioning a first carrier assembly on a system stage. The carrier assembly includes a support frame having an inner frame edge that defines a window of the support frame. The first carrier assembly includes a first substrate that is positioned within the window and surrounded by the inner frame edge. The first substrate has a sample thereon. The method includes detecting optical signals from the sample of the first substrate. The method also includes replacing the first carrier assembly on the system stage with a second carrier assembly on the system stage. The second carrier assembly includes the support frame and an adapter plate held by the support frame. The second carrier assembly has a second substrate held by the adapter plate that has a sample thereon. The method also includes detecting optical signals from the sample of the second substrate

Abstract translation: 方法包括将第一载体组件定位在系统平台上。 载体组件包括具有限定支撑框架的窗口的内框架边缘的支撑框架。 第一载体组件包括位于窗内并被内框架边缘包围的第一基板。 第一衬底上具有样品。 该方法包括从第一衬底的样品检测光信号。 该方法还包括用系统级上的第二载体组件替换系统平台上的第一载体组件。 第二托架组件包括支撑框架和由支撑框架保持的适配器板。 第二载体组件具有由适配器板保持的第二基板，其上具有样品。 该方法还包括检测来自第二基板的样品的光信号

公开(公告)号：US20160187255A1

公开(公告)日：2016-06-30

申请号：US14909732

申请日：2015-06-16

Applicant: CHINA UNIVERSITY OF PETROLEUM (EAST CHINA)

Inventor： Ying SONG ,  Yongqiang YANG ,  Longwei QIU ,  Yuming ZHAO ,  Weichao YANG ,  Ying QI ,  Andrei STEPASHKO

IPC: G01N21/41 ,  G01N21/87

CPC classification number: G01N21/4133 ,  G01N21/87 ,  G01N33/38 ,  G01N2201/025

Abstract: An automatic observation apparatus for detecting mineral samples comprises a base (1), a supporting arm (2), a sample fixing device (3), a stepper motor (4), a high-definition camera (5) and a control system (6). A refractometer is fixed on the base (1). A vertical through hole is formed at the top end of the supporting arm (2), and a lifting rod (211) penetrates through the vertical through hole and is matched with the vertical through hole in shape. A cavity is formed at the top end of the supporting arm (2), a gear (216) is mounted in the cavity, and the gear (216) is meshed with a rack (215) of the lifting rod (211). The sample fixing device (3) is a right-hexagonal-prism shell with the top end sealed, a spring (312) is arranged in a vertical hole of the sample fixing device, a sample locating head fixing device (314) is arranged at the lower end of the spring (312), a blind hole is formed in the lower end of the sample locating head fixing device (314), and a sample locating head (316) is matched with the blind hole in the lower end of the sample locating head fixing device (314). The apparatus can conveniently and efficiently fix samples, stray light interference is avoided, mineral samples can be rotated to be observed from different angles, and mineral sample detection accuracy is improved.

Abstract translation: 用于检测矿物样品的自动观察装置包括基座（1），支撑臂（2），样品固定装置（3），步进马达（4），高清晰度照相机（5）和控制系统 6）。 折射计固定在基座（1）上。 在支撑臂（2）的顶端形成有垂直通孔，提升杆（211）穿过垂直通孔并与垂直通孔形状匹配。 在支撑臂（2）的顶端形成有空腔，齿轮（216）安装在空腔中，齿轮（216）与提升杆（211）的齿条（215）啮合。 样品定影装置（3）是顶端密封的右六边形棱镜壳体，在样品固定装置的垂直孔中设置弹簧（312），样品定位头固定装置（314）布置在 弹簧（312）的下端，在样品定位头固定装置（314）的下端形成有盲孔，并且样品定位头（316）与下端的盲孔匹配 样品定位头固定装置（314）。 该设备可以方便有效地固定样品，避免杂散光干扰，矿物样品可以从不同角度旋转观察，矿物样品检测精度提高。

公开(公告)号：US20160161479A1

公开(公告)日：2016-06-09

申请号：US14538271

申请日：2014-11-11

Applicant: Massachusetts Institute of Technology

Inventor： James Douglas Harper ,  Richard Hart Mathews ,  Bernadette Johnson ,  Martha Susan Petrovick ,  Ann Rundell ,  Frances Ellen Nargi ,  Timothy Stephens ,  Linda Marie Mendenhall ,  Mark Alexander Hollis ,  Albert M. Young ,  Todd H. Rider ,  Eric David Schwoebel ,  Trina Rae Vian

IPC: G01N33/554 ,  G01N33/543 ,  G01N21/07 ,  G01N21/76 ,  G01N21/64

CPC classification number: G01N33/554 ,  G01N15/0205 ,  G01N21/07 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/75 ,  G01N21/76 ,  G01N33/54373 ,  G01N33/54393 ,  G01N33/56983 ,  G01N33/582 ,  G01N2021/6439 ,  G01N2201/025 ,  G01N2201/061 ,  Y10S435/808 ,  Y10S436/805

Abstract: The invention relates to optoelectronic systems for detecting one or more target particles. The system includes a reaction chamber, a specimen collector, an optical detector, and a reservoir containing cells, each of the cells having receptors which are present on the surface of each cell and are specific for the target particle to be detected, where binding of the target particle to the receptors directly or indirectly activates a reporter molecule, thereby producing a measurable optical signal.

公开(公告)号：US20150355016A1

公开(公告)日：2015-12-10

申请号：US14730762

申请日：2015-06-04

Applicant: SAMCO INC.

Inventor： Kiyoshi HASEGAWA ,  Hiroshi KAWAMURA ,  Peter WOOD

IPC: G01J1/02 ,  G01J1/42 ,  G01N21/55

CPC classification number: G01J1/0238 ,  G01J1/4257 ,  G01N21/55 ,  G01N2021/8427 ,  G01N2201/025 ,  G01N2201/1087

Abstract: The present invention provides a light beam measuring instrument that can securely receive light reflected by a sample. The light beam measuring instrument 1 includes an optical axis tilting mechanism 13 that includes a first tilting mechanism 131 and a second tilting mechanism 132. From the optical axis A1 of irradiation light beam emitted from a light beam source 112, the first tilting mechanism 131 tilts the optical axis A1 about the first tilting axis T1. The second tilting mechanism 132 tilts the optical axis A1 about the second tilting axis T2. The light beam measuring instrument 1 can receive the light reflected by the semiconductor chip C by means of operation of the optical axis tilting mechanism 13 even if the light reflected by the semiconductor chip C is tilted. Accordingly, this apparatus can securely perform measurement or inspection using the light beam.

Abstract translation: 本发明提供了一种可以安全地接收由样品反射的光的光束测量仪器。 光束测量仪1包括光轴倾斜机构13，其包括第一倾斜机构131和第二倾斜机构132.从光束源112发射的照射光束的光轴A1，第一倾斜机构131倾斜 围绕第一倾斜轴线T1的光轴A1。 第二倾斜机构132围绕第二倾斜轴T2倾斜光轴A1。 即使由半导体芯片C反射的光倾斜，光束测量仪器1也可以通过光轴倾斜机构13的操作来接收由半导体芯片C反射的光。 因此，该装置可以可靠地执行使用光束的测量或检查。

公开(公告)号：US20150276580A1

公开(公告)日：2015-10-01

申请号：US14669801

申请日：2015-03-26

Applicant: Sysmex Corporation

Inventor： Toshikatsu FUKUJU ,  Yusuke MATSUMOTO

IPC: G01N21/13 ,  G01N21/75

CPC classification number: G01N21/13 ,  G01N21/6428 ,  G01N21/75 ,  G01N35/0098 ,  G01N35/025 ,  G01N35/04 ,  G01N2021/135 ,  G01N2035/0406 ,  G01N2035/041 ,  G01N2035/103 ,  G01N2201/022 ,  G01N2201/025

Abstract: An analyzer including a housing with a mutually adjacent first side and a second side, and an annular reagent holding part disposed within the housing is disclosed. An immunoassay method for measuring antigen or antibody of a measurement object contained in a sample and performed by the analyzer is also disclosed.

Abstract translation: 本发明公开了一种分析装置，其包括具有相互相邻的第一侧和第二侧的壳体，以及设置在壳体内的环状试剂保持部。 还公开了一种用于测量样品中包含并由分析仪进行的测量对象的抗原或抗体的免疫测定方法。

公开(公告)号：US20150214090A1

公开(公告)日：2015-07-30

申请号：US14424275

申请日：2013-09-02

Applicant: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD

Inventor： Jian Ping Jin ,  Leng Kheam Lee

IPC: H01L21/683

CPC classification number: H01L21/681 ,  B25J11/0095 ,  B25J15/0616 ,  B25J15/0658 ,  B25J15/0666 ,  G01B11/27 ,  G01N21/9501 ,  G01N2201/025 ,  H01L21/67144 ,  H01L21/67706 ,  H01L21/6838 ,  H01L21/68757 ,  Y10T29/49826

Abstract: A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.

Abstract translation: 提供适于处理晶片和薄膜框架的单个晶片台表面的晶片台结构包括：底盘，其具有通过形成在内部基板表面中或之上的一组脊形成在其中的一组隔室; 设置在所述一组基座托盘隔室内的可硬化流体可渗透隔室材料; 以及一组开口，形成在基托盘内表面中，通过该组开口，硬化的隔室材料可暴露于负压或正压。 基托盘包括第一陶瓷材料（例如瓷器），并且可硬化隔室材料包括第二陶瓷材料。 底盘和隔间材料可以通过标准加工工艺同时加工，从而以基本上相同的速率平坦化基托和硬化隔间材料的暴露的外表面，以形成高度或超平面的晶片台面。

公开(公告)号：US20150124237A1

公开(公告)日：2015-05-07

申请号：US14377110

申请日：2013-02-28

Applicant: SMART APPLICATIONS LIMITED

Inventor： Michael Trevor Zinn ,  Quinton Encombe Woods ,  Petrus Hendrik Buys

IPC: G01N21/954 ,  E04G23/00 ,  G01C19/00

CPC classification number: G01N21/954 ,  E04G23/008 ,  F23J13/00 ,  F23J99/00 ,  F23J2213/60 ,  G01C19/00 ,  G01N2201/023 ,  G01N2201/025 ,  G01N2201/062 ,  G03B37/005

Abstract: The invention relates to an inspection and repair module for an internal side wall of a vertically erected structure, with the module including a carrier for supporting at least one data recording mechanism and being securable to a hoist, and for an inspection and repair module for an internal wall of a conduit with the module including propulsion means comprising a set of driven tracked wheels controllable by a controller carried by the carrier and configured to provide, within a conduit, longitudinal forward and reverse motion.

Abstract translation: 本发明涉及一种用于垂直竖立结构的内侧壁的检查和修理模块，其中该模块包括用于支撑至少一个数据记录机构并可安装在起重机上的托架，以及用于检查和修理模块 具有模块的管道的内壁包括推进装置，该推进装置包括一组驱动的履带轮，该组驱动的履带轮可由载体承载的控制器控制，并配置成在管道内提供纵向前进和后退运动。