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    利用单个发光粒子检测的光分析方法
    1.
    发明授权
    利用单个发光粒子检测的光分析方法 有权

    公开(公告)号：CN103119421B

    公开(公告)日：2015-04-08

    申请号：CN201180045547.8

    申请日：2011-09-16

    Applicant: 奥林巴斯株式会社

    Inventor： 田边哲也

    IPC: G01N21/64

    CPC classification number: G01N21/85 ,  G01N15/1434 ,  G01N21/6452 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/1087 ,  G02B21/0052 ,  G02B21/0076 ,  G02B21/008

    Abstract: 提供如下一种方法：在使用了共焦显微镜或多光子显微镜的光测量的扫描分子计数法中，避免由于多个发光粒子暂时包含在光检测区域内而发光粒子的检测个数的精度恶化。在本发明的光分析技术中，在一边通过变更共焦显微镜或多光子显微镜的光学系统的光路使光检测区域的位置在样本溶液内移动一边在测量光的强度而生成的光强度数据中，在以选择性地将具有超过阈值的强度的信号检测为表示发光粒子的光的信号的方式个别检测表示发光粒子的光的信号时，设定阈值使得选择性地检测表示来自包含在光检测区域内的比该光检测区域狭小的区域中的发光粒子的光的信号。

    利用单个发光粒子检测的光分析方法
    3.
    发明公开
    利用单个发光粒子检测的光分析方法 有权

    公开(公告)号：CN103119421A

    公开(公告)日：2013-05-22

    申请号：CN201180045547.8

    申请日：2011-09-16

    Applicant: 奥林巴斯株式会社

    Inventor： 田边哲也

    IPC: G01N21/64

    CPC classification number: G01N21/85 ,  G01N15/1434 ,  G01N21/6452 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/1087 ,  G02B21/0052 ,  G02B21/0076 ,  G02B21/008

    Abstract: 提供如下一种方法：在使用了共焦显微镜或多光子显微镜的光测量的扫描分子计数法中，避免由于多个发光粒子暂时包含在光检测区域内而发光粒子的检测个数的精度恶化。在本发明的光分析技术中，在一边通过变更共焦显微镜或多光子显微镜的光学系统的光路使光检测区域的位置在样本溶液内移动一边在测量光的强度而生成的光强度数据中，在以选择性地将具有超过阈值的强度的信号检测为表示发光粒子的光的信号的方式个别检测表示发光粒子的光的信号时，设定阈值使得选择性地检测表示来自包含在光检测区域内的比该光检测区域狭小的区域中的发光粒子的光的信号。

    APPARATUS AND PROCESS FOR DETECTING AND COUNTING FLUORESCENT PARTICLES CARRIED ON A SOLID SUPPORT
    4.
    发明申请
    APPARATUS AND PROCESS FOR DETECTING AND COUNTING FLUORESCENT PARTICLES CARRIED ON A SOLID SUPPORT 审中-公开
    用于检测和计数支持固体支持的荧光颗粒的装置和方法

    公开(公告)号：WO1989008834A1

    公开(公告)日：1989-09-21

    申请号：PCT/FR1989000095

    申请日：1989-03-08

    Applicant: CHEMUNEX ,  VAN HOEGAERDEN, Michel

    Inventor： CHEMUNEX

    IPC: G01N21/64

    CPC classification number: G01N21/6456 ,  G01N15/1468 ,  G01N15/1475 ,  G01N21/6428 ,  G01N2021/0162 ,  G01N2201/1053 ,  G01N2201/1087

    Abstract: Device for detecting and counting particles which are fluorescent or made fluorescent, carried by a solid support, and a process for detecting said particles by means of said device. The device for detecting and counting particles which are normally present or may be contained in the form of contaminants in a liquid or gas fluid, or in a product in particular a food or hygenic product, by fluorimetry, comprises a light source (10), means for focusing(12) a beam from said light source and at least one means for detecting (40) the fluorescent light emitted by the particles present (60), and also comprises: a support (50) suitable for collecting particles which are naturally fluorescent or have been made fluorescent by means of at least one suitable stain chosen from the group which comprises the vital stains, the stains with a positive viability and fluorescent substances carried by antibodies and/or nucleic probes; means for scanning (21, 31, 35) the totality of the support surface to be analysed by said light beam; and a microprocessor (45) provided with at least one means for recording and counting simultaneously electrical signals transmitted by the detection device(s) (40) and the scanning system (21, 31, 35).

    TRANSMISSION RAMAN SPECTROSCOPY
    6.
    发明申请
    TRANSMISSION RAMAN SPECTROSCOPY 审中-公开
    传输拉曼光谱

    公开(公告)号：WO2016142699A1

    公开(公告)日：2016-09-15

    申请号：PCT/GB2016/050630

    申请日：2016-03-08

    Applicant: RENISHAW PLC

    Inventor： SMITH, Timothy ,  BLACKWELL-WHITEHEAD, Richard, John

    IPC: G01N21/65 ,  G01J3/44 ,  G01J3/06 ,  G02B21/00

    CPC classification number: G01J3/44 ,  G01J3/06 ,  G01J2003/064 ,  G01N21/65 ,  G01N2201/103 ,  G01N2201/1045 ,  G01N2201/1087 ,  G02B21/002

    Abstract: This invention concerns a transmission Raman spectroscopy apparatus comprising a light source (101) for generating a light profile (110) on a sample (102), a photodetector (103) having at least one photodetector element (103a), collection optics (104) arranged to collect Raman scattered light transmitted through the sample (102) and direct the Raman light onto the at least one photodetector element (103a) and a support (109) for supporting the sample (102). The support (102) and light source (101) are arranged such that the light profile (110) can be moved relative to the sample (102) in order that the at least one photodetector element (103 a) receives Raman scattered light generated for different locations of the light profile (110) on the sample (102).

    Abstract translation: 本发明涉及一种透射拉曼光谱仪，包括用于在样品（102）上产生光谱（110）的光源（101），具有至少一个光电检测器元件（103a）的光电检测器（103a），收集光学器件（104） 布置成收集透射通过样品（102）的拉曼散射光并将拉曼光引导到至少一个光电检测器元件（103a）上，以及用于支撑样品（102）的支撑件（109）。 支撑件（102）和光源（101）被布置成使得光轮廓（110）能够相对于样品（102）移动，以使得至少一个光电检测器元件（103a）接收生成的拉曼散射光， 样品（102）上的光谱（110）的不同位置。

    System and method for combined Raman and LIBS detection with targeting
    7.
    发明授权
    System and method for combined Raman and LIBS detection with targeting 有权
    用于组合拉曼和LIBS检测与靶向的系统和方法

    公开(公告)号：US08553210B2

    公开(公告)日：2013-10-08

    申请号：US13209688

    申请日：2011-08-15

    Applicant: Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

    Inventor： Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

    IPC: G01N21/00

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/44 ,  G01J3/443 ,  G01N21/35 ,  G01N21/6402 ,  G01N21/6456 ,  G01N21/65 ,  G01N21/658 ,  G01N21/718 ,  G01N2021/6423 ,  G01N2201/0221 ,  G01N2201/06113 ,  G01N2201/08 ,  G01N2201/101 ,  G01N2201/1087

    Abstract: A system and method for locating and identifying unknown samples. A targeting mode may be utilized to scan regions of interest for potential unknown materials. This targeting mode may interrogate regions of interest using SWIR and/or fluorescence spectroscopic and imaging techniques. Unknown samples detected in regions of interest may be further interrogated using a combination of Raman and LIBS techniques to identify the unknown samples. Structured illumination may be used to interrogate an unknown sample. Data sets generated during interrogation may be compared to a reference database comprising a plurality of reference data sets, each associated with a known material. The system and method may be used to identify a variety of materials including: biological, chemical, explosive, hazardous, concealment, and non-hazardous materials.

    Abstract translation: 用于定位和识别未知样品的系统和方法。 可以利用定位模式来扫描潜在未知材料的感兴趣区域。 这种瞄准模式可以使用SWIR和/或荧光光谱和成像技术来询问感兴趣的区域。 可以使用拉曼和LIBS技术的组合进一步询问在感兴趣区域中检测到的未知样品，以识别未知样品。 结构化照明可用于询问未知样品。 在询问期间生成的数据集可以与包括多个参考数据集的参考数据库进行比较，每个参考数据集与已知的资料相关联。 该系统和方法可用于识别各种材料，包括：生物，化学，爆炸，危险，隐蔽和非危险材料。

    Particle detection method including comparison between sequential scans
    10.
    发明授权
    Particle detection method including comparison between sequential scans 失效
    粒子检测方法，包括顺序扫描的比较

    公开(公告)号：US4766324A

    公开(公告)日：1988-08-23

    申请号：US83695

    申请日：1987-08-07

    Applicant: Soheil Saadat ,  Jiri Pecen ,  Armand P. Neukermans ,  George J. Kren

    Inventor： Soheil Saadat ,  Jiri Pecen ,  Armand P. Neukermans ,  George J. Kren

    IPC: G01N21/88 ,  G01N15/14 ,  G01N21/94 ,  G01N21/956 ,  H01L21/66 ,  G01N21/00

    CPC classification number: G01N21/94 ,  G01N15/1468 ,  G01N2021/8867 ,  G01N2201/1087

    Abstract: A particle detection method for matching particles detected in two scans of a surface taken at different times in which particles having a light scattering intensity above a collection threshold are first detected and the measured position and scattering intensity therefor stored in a computer memory. Corresponding first and second measured positions from the respective first and second scans are determined by forming a triangle from selected first detected particles and finding those second detected particles which form a variant triangle with matching perimeter and area. From these matching first and second particles a transformation is found for mapping first measured positions to corresponding second positions and vice versa. Areas around corresponding positions of particles having a scattering intensity above a display threshold are examined for matching particles. If not found, the area is reexamined at a reduced threshold. Matching particles are considered to be the same, while unmatched particles are considered to be either added or removed. The method provides an accurate count of particles for process contamination analysis.

    Abstract translation: 一种颗粒检测方法，用于匹配在不同时间拍摄的表面的两次扫描中检测到的颗粒，其中首先检测具有高于采集阈值的光散射强度的颗粒，并将其测量的位置和散射强度存储在计算机存储器中。 通过从所选择的第一检测到的粒子形成三角形并找到形成具有匹配的周长和面积的变形三角形的那些第二检测到的粒子来确定来自相应的第一和第二扫描的相应的第一和第二测量位置。 从这些匹配的第一和第二颗粒中，找到用于将第一测量位置映射到对应的第二位置的变换，反之亦然。 检查具有高于显示阈值的散射强度的颗粒的相应位置周围的区域以匹配颗粒。 如果没有找到，则会以降低的阈值重新检查该区域。 认为匹配的颗粒是相同的，而不匹配的颗粒被认为是添加或去除。 该方法提供了用于过程污染分析的颗粒的精确计数。

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