公开(公告)号：EP2799846A4

公开(公告)日：2015-09-02

申请号：EP12863370

申请日：2012-12-26

Applicant: IMAGINEERING INC

Inventor： IKEDA YUJI

IPC: G01N21/68 ,  G01N21/67

CPC classification number: G01N21/68 ,  G01N1/2252 ,  G01N21/67 ,  G01N33/004 ,  G01N33/0062 ,  G01N2021/8578 ,  G01N2201/067

Abstract: The present invention aims at realizing a gas concentration estimation apparatus with versatility wherein the gas concentration estimation apparatus estimates concentration of a target component in an analyte gas by analyzing a light emitted from plasma of the analyte gas. The present invention is directed to a gas concentration estimation apparatus including: a plasma generation device that turns an analyte gas into a plasma state; and an analysis device that analyzes plasma light emitted from the plasma generated by the plasma generation device and estimates concentration of a target component in the analyte gas wherein the analysis device estimates the concentration of the target component based on luminescence intensity of a wavelength component corresponding to luminescence from a predetermined radical within the plasma light, and the predetermined radical is different in atomic structure from the target component and includes an atom or a molecule separated from the target component.

公开(公告)号：EP2537010A1

公开(公告)日：2012-12-26

申请号：EP11745387.8

申请日：2011-02-18

Applicant: Pacific Biosciences Of California, Inc. ,  Fehr, Adrian ,  McCaffrey, Nathaniel Joseph ,  Turner, Stephen

Inventor： FEHR, Adrian ,  MCCAFFREY, Nathaniel, Joseph ,  TURNER, Stephen

IPC: G01J3/40

CPC classification number: C12Q1/6874 ,  B01L3/502707 ,  B01L3/502715 ,  B01L2300/0654 ,  B01L2300/0663 ,  B01L2300/0816 ,  B01L2300/168 ,  B82Y20/00 ,  C12Q1/6825 ,  C12Q1/6869 ,  G01N21/03 ,  G01N21/0303 ,  G01N21/05 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/645 ,  G01N21/6452 ,  G01N21/6454 ,  G01N21/6456 ,  G01N21/648 ,  G01N21/75 ,  G01N21/77 ,  G01N33/54373 ,  G01N2021/0346 ,  G01N2021/6434 ,  G01N2021/6439 ,  G01N2021/6441 ,  G01N2021/6463 ,  G01N2021/757 ,  G01N2021/7786 ,  G01N2201/067 ,  G01N2201/068 ,  G01N2201/08 ,  G02B6/1226 ,  Y10T436/143333

Abstract: A system for measuring analytical reactions comprising a socket (51, 57) which is suitable for holding an optode array chip (40).The socket comprises electrical contacts that mate with electrical contacts on a chip when such a chip is inserted into the socket. The socket furthermore permits fluid from a fluidics system (33) and illumination from an illumination system (53) to be for delivered to a chip when such a chip is inserted into the socket. The socket may be of the clam shell type.

公开(公告)号：EP1724566A4

公开(公告)日：2011-04-06

申请号：EP05720493

申请日：2005-03-10

Applicant: JOY WORLD PACIFIC CO LTD

Inventor： HANAMATSU KENKOH ,  ONO HIROYUKI ,  ODAGIRI HIDEO ,  SAWA TAKAHIRO ,  MIURA KATSUYUKI

IPC: G01N21/35 ,  G01G19/414 ,  G01J3/42 ,  G01N21/27 ,  G01N21/47 ,  G01N33/02

CPC classification number: G01N21/4738 ,  G01G19/4146 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/108 ,  G01J3/1256 ,  G01J3/42 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/02 ,  G01N2021/151 ,  G01N2201/0618 ,  G01N2201/067 ,  G01N2201/0696 ,  G01N2201/1293

Abstract: The invention makes it possible to measure a calorie by using near-infrared rays, thereby realizing calorie measurement of an object to be quickly and easily performed using a non-destructive method. A device of measuring calorie of an object includes an object holding unit (1) including a table (2) on which an inspection-target object (M) is placed; a light source unit (20) that supplies light in near-infrared regions to irradiate the inspection-target object (M) placed on the turning table (2); a light reception unit (30) that receives light reflected from or transmitted though the object (M); and a control unit (40) that calculates the calorie of the object (M) in accordance with the absorbances of the light received by the light reception unit (30). In the control unit (40), the calorie of object (M) is calculated in accordance with a regression expression and the absorbances of the light received by the light reception unit (30). In this case, the regression expression is preliminarily calculated in the manner that near-infrared rays are irradiated on a calorie known sample object (M), and multiple-regression analyses are performed on second derivative spectra at the absorbances of light reflected from or transmitted though the sample object (M).

公开(公告)号：EP2220480A2

公开(公告)日：2010-08-25

申请号：EP08865044.5

申请日：2008-12-11

Applicant: ECOLE NORMALE SUPERIEURE DE LYON ,  Centre National de la Recherche Scientifique

Inventor： BERGUIGA, Lofti ,  ARGOUL, Françoise

IPC: G01N21/55 ,  G01B9/02 ,  G01B9/04 ,  G02B21/00 ,  G01N13/14

CPC classification number: G01N21/553 ,  B82Y20/00 ,  B82Y35/00 ,  G01B9/04 ,  G01N2201/067

Abstract: The present invention relates to a high-resolution scanning surface-plasmon microscope, comprising a coherent light source (LG) and a medium for coupling and confining a surface plasmon, comprising an objective (O, 0M) of large numerical aperture, an immersion oil (Hi) and a glass slide (Gs). A metal layer (Ms) covers one surface of the glass slide (Gs). The microscope also includes a Twyman-Green interferometer operating in heterodyne mode, this being placed between the light source and the coupling medium, and also means (PL1, PL2, EC) for scanning the metal layer using a light beam, and means (PD) for detecting the beam output by the interferometer, said means being connected to means (S, F, DTec, COMP) for processing and forming an image from this beam. In accordance with the invention, at least one polarization converter (CP), for converting a linear polarization of the light beams (L) emitted by the light source (LG) into a radial polarization, is placed between the light source and the interferometer.

公开(公告)号：EP2111542A2

公开(公告)日：2009-10-28

申请号：EP08705972.1

申请日：2008-01-17

Applicant: Cambrius, Inc.

Inventor： BROWN, Gordon, C. ,  BURKA, Michael ,  CRANTON, Brian ,  ERICKSON, David ,  GRASSI, James ,  HAMMOND, Matthew, Patrick ,  SHAFFER, Maximillan, Ben ,  VILLENEUVE, Pierre

IPC: G01N21/65 ,  G01J3/44

CPC classification number: G01N21/65 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/26 ,  G01J3/36 ,  G01J3/44 ,  G01J2003/1269 ,  G01N2021/1793 ,  G01N2021/8416 ,  G01N2201/0245 ,  G01N2201/067

Abstract: An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive analysis without extracting the analyte or analytes from the process. The analyzer can measure one or several solid, liquid, or gaseous analytes, or a mixture thereof.

公开(公告)号：EP0413952B1

公开(公告)日：1994-09-14

申请号：EP90113548.3

申请日：1990-07-16

Applicant: Hartmann & Braun Aktiengesellschaft

Inventor： Zöchbauer, Michael

IPC: G01N21/45 ,  G01J3/26

CPC classification number: G01J3/26 ,  G01J2003/2886 ,  G01N2201/067 ,  G02F1/0147 ,  G02F1/03 ,  G02F1/21 ,  G02F1/216 ,  G02F2001/213

公开(公告)号：EP0452095A1

公开(公告)日：1991-10-16

申请号：EP91303127.4

申请日：1991-04-09

Applicant: Hughes Aircraft Company

Inventor： Drummond, James E. ,  Shih, I-Fu

IPC: G01J3/02

CPC classification number: G01J3/1838 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/2803 ,  G01N21/3504 ,  G01N2201/067

Abstract: This invention relates to a dispersive holographic spectrometer (12) for analyzing radiation from an infrared source (16). The holographic spectrometer (12) comprises a piezoelectric block (40) having a holographic lens (38) on one face, an array of detectors (36) on another face and a pair of vernier electrodes (32, 34) on opposite faces. Radiation from the source (16) incident upon the holographic lens (38) is dispersed into component wavelengths (44, 46) and directed towards the detector array (36). The holographic lens (38) has a holographic interference pattern recorded on it such that radiation of predetermined wavelength components are dispersed sufficiently enough such that radiation of specific wavelengths falls on different detector elements (48) of the detector array (36). By applying a voltage to the electrodes (32, 38), an electric field is created within the piezoelectric block (40) such that it is either compressed or expanded. This change in the piezoelectric block (40) alters the direction of the radiation from the holographic lens (38) to the detector array (36). Therefore, misalignment of the source (16) with the holographic lens (38) can be compensated for such that piezoelectric adjustment of the block (40) will make the radiation of individual wavelengths fall on the desired detector element (48). Further, radiation from different wavelengths can be directed from one detector element to another. The detector array (36) is self-scanning such that an absorption spectrum can be measured and recorded over a range of frequencies.

Abstract translation: 本发明涉及一种用于分析来自红外源（16）的辐射的色散全息光谱仪（12）。 全息光谱仪（12）包括在一个面上具有全息透镜（38）的压电块（40），在另一个面上的一组检测器（36）和相对的面上的一对游标电极（32,34）。 入射到全息透镜（38）上的来自源极（16）的辐射被分散成分量波长（44,46）并指向检测器阵列（36）。 全息透​​镜（38）具有记录在其上的全息干涉图案，使得预定波长分量的辐射足够分散，使得特定波长的辐射落在检测器阵列（36）的不同检测器元件（48）上。 通过向电极（32,38）施加电压，在压电块（40）内产生电压，使其被压缩或扩大。 压电块（40）中的这种变化改变了从全息透镜（38）到检测器阵列（36）的辐射方向。 因此，源（16）与全息透镜（38）的未对准可以被补偿，使得块（40）的压电调节将使各个波长的辐射落在期望的检测器元件（48）上。 此外，来自不同波长的辐射可以从一个检测器元件引导到另一个。 检测器阵列（36）是自扫描的，使得可以在一个频率范围内测量和记录吸收光谱。

公开(公告)号：EP0409765A3

公开(公告)日：1991-03-27

申请号：EP90710016.8

申请日：1990-07-04

Applicant: Hartmann & Braun Aktiengesellschaft

Inventor： Zöchbauer, Michael

IPC: G01N21/31 ,  G01J3/26

CPC classification number: G01J3/26 ,  G01J2003/2886 ,  G01N21/31 ,  G01N2201/067

Abstract: Die Erfindung betrifft ein interferometrische Einrichtung zum Nachweis einer Substanz mit strukturiertem, insbesondere periodischem oder quasiperiodischem Absorptionsspektrum und besteht aus einer Strahlungsquelle, in deren Strahlengang die zu untersuchende Substanz, ein Interferenzfilter, dessen Dicke den Abstand der Interferenzlinien bestimmt sowie ein Detektor angeordnet sind. Das Interferenzfilter ist ein thermooptisch abstimmbares Filter, welches aus einer Platte aus thermooptisch aktivem Material besteht, deren Stirnseiten teildurchlässig verspiegelt sein können. Eine Verschiebung der Durchlaßcharakteristik des Filters wird mit Hilfe einer Temperaturänderung des Filters erzeugt wird, wobei die Temperaturdifferenz ein Maß für die Verschiebung ist. Die Dicke der Platte ist so gewählt, daß der Abstand der erzeugten Interferenzlinien dem Abstand der Absorptionslinien der zu bestimmenden Substanz entspricht.

Abstract translation: 本发明涉及一种干涉测量设备，用于检测具有结构化，特别是周期性或准周期性吸收光谱的物质，并且包括在被调查其光束路径物质，干涉滤波器，其厚度决定了干扰线和检测器的间距被布置辐射源。 干涉滤光片是一个热光学可调谐滤光片，它由一块热光学活性材料制成，其表面可以是部分透明的镜面。 通过过滤器的温度变化产生过滤器传递特性的变化，温度差是位移的量度。 选择板的厚度使得所产生的干涉线的距离对应于待确定的物质的吸收线的距离。

公开(公告)号：EP0340437A3

公开(公告)日：1991-03-20

申请号：EP89105033.8

申请日：1989-03-21

Applicant: ABB PROCESS AUTOMATION INC.

Inventor： Burk, Gary Neil

IPC: G01N21/47 ,  G01N21/86 ,  G02F1/13

CPC classification number: G01N21/4738 ,  G01N2021/4773 ,  G01N2021/8663 ,  G01N2201/067 ,  G01N2201/0833 ,  G01N2201/128

Abstract: Apparatus (10) and methods for measuring dark and bright reflectances of translucent sheet material (2) are disclosed. The apparatus (10) comprises first optical means for illuminating one side of the sheet material (2) with a source of electromagnetic radiation. A portion of the radiation is transmitted through the sheet material (2) and another portion of the radiation is reflected by the sheet material. The apparatus (10) also comprises optical gating means (30) that is positioned adjacent the other side of the sheet material (2) in a fixed position relative to the first optical means. The optical gating means (30) absorbs substantially all of the transmitted portion of the radiation when switched to a dark state and reflects substantially all of the transmitted portion of the radiation back through the sheet material (2) when switched to a bright state. The apparatus (10) further comprises second optical means for collecting the reflected portion of the radiation and the portion of the trasmitted portion of the radiation reflected by the optical gating means (30) and retransmitted through the sheet material (2) to provide a total reflectance. The total reflectance has a dark reflectance intensity when the optical gating means (30) is in the dark state and a bright reflectance intensity when the optical gating means is in the bright state. The apparatus also comprises sensing means (60), responsive to radiation collected by the second optical means, for providing a dark signal having a magnitude corresponding to the dark reflectance intensity and a bright signal having a magnitude corresponding the the bright reflectance intensity. The dark and bright signals can be incorporated in known formulae to compute values for quality attributes of the sheet material (2) including opacity and color.

公开(公告)号：EP0337054A2

公开(公告)日：1989-10-18

申请号：EP89100386.5

申请日：1989-01-11

Applicant: Hartmann & Braun Aktiengesellschaft

Inventor： Zöchbauer, Michael ,  Fabinski, Walter

IPC: G01J3/26 ,  G01N21/45

CPC classification number: G01N21/31 ,  G01J3/26 ,  G01N2201/067

Abstract: Interferometrische Einrichtung zum Nachweis einer Substanz mit strukturiertem Absorptionsspektrum mit einer Strahlungsquelle (L), in deren Strahlengang die zu untersuchende Substanz (K), ein Interferenzfilter, dessen Dicke den Abstand der Interferenz­linien bestimmt und ein Detektor (D) angeordnet sind. Das Inter­ferenzfilter ist ein elektrisch abstimmbares Filter (E) mit einer Platte aus elektrooptischem Material (P) und teildurch­lässig verspiegelten Stirnseiten (S).

Abstract translation: 一种用于通过具有待检测物质（K）的辐射源（L）检测具有结构化吸收光谱的物质的干涉装置，其厚度确定干涉线的间距的干涉滤光器和其中的检测器（D） 光束路径。 干涉滤光器是包含电光材料板（P）和部分吸收金属化端面（S）的电可调滤光器（E）。 ... ...