Abstract:
4D data ultrasound imaging system (100) comprising a matrix (10) of transducer elements (3) suitable for transmitting and for receiving ultrasound signals, said transducer elements (3) being divided into sub-matrixes (21) suitable for receiving in a delayed way a same acoustic signal, a plurality of reception channels (22) with one of said reception channels (22) being associated with one of said transducer elements (3), a beamformer device (109) comprising a plurality of storage cells (111) arranged in re-phasing matrixes (112), each re-phasing matrix (1 12) being associated with a corresponding sub-matrix (21) with each row (Ri) associated with one of said transducer elements (3), said storage cells (111) comprising an input storage stage (In) that is selectively associated with a row (Ri) and a reading output stage (Out) that is selectively associated with a buffer (16); each storage cell (111) that belongs to a same column (Coi) has the input stage (In) that is dynamically activated in sequential times with respect to another storage cell (11 1) of the same column (Coi) for storing the same delayed acoustic signal, said storage cells (1 11) that belong to the same column (Coi) have the output stage (Out) that is simultaneously activated.
Abstract:
An integrated circuit controls a switch of a switching current regulator. The current regulator comprises primary and secondary windings where a first and a second current flow, respectively. The switch is adapted to initiate or interrupt the circulation of the first current in the primary winding. The control integrated circuit comprises a comparator configured to compare a first signal representative of said first current to a second signal and a divider circuit configured to generate said second signal as a ratio of a third signal, proportional to a voltage on the primary winding, with a voltage on a capacitor. The capacitor is charged by a further current controlled by the third signal when the second current is different from zero and is discharged through resistor when the value of said second current is substantially zero.
Abstract:
An integrated control circuit of a switch is described, which is adapted to open or close a current path; said integrated circuit includes a comparator to compare a first signal with a second signal representative of the current flowing through said current path. The comparator outputs a third variable signal between a low logic level and a high logic level according to whether said second signal is lower than said first signal or vice versa; the integrated circuit has a driver to generate a signal to drive said switch in response to the third signal, and is configured to detect a spike on the leading edge of said second signal and to blank said third signal for a first blanking time period which depends on a turn-on delay of said switch and a second blanking period which depends on the duration of said spike on the leading edge of said second signal.
Abstract:
A transmission channel (1) is described of the type comprising at least one high voltage buffer block (4) comprising buffer transistors (MB1, MB2, MB3, MB4) and respective buffer diodes (DB1, DB2, DB3, DB4), being inserted between respective voltage references (HVPO, HVP1, HVMO, HVM1), these buffer transistors (MB1, MB2, MB3, MB4) being also connected to a clamping block (5), in turn comprising clamping transistors (MC1, MC2) connected to at least one output terminal (HVout) of this transmission channel through diodes (DC1, DC2) connected to prevent the body diodes of the clamping transistors (MC1, MC2) from conducting. Advantageously according to the invention, the transmission channel (1) comprises at least one reset circuit (20) comprising diodes (DME1, DME2, DME3, DME4) and being inserted between circuit nodes (XME1, XME2, XME3, XME4, XC1, XC2) of the high voltage buffer block (4) and of the clamping block (5), these circuit nodes (XME1, XME2, XME3, XME4, XC1, XC2) being in correspondence with conduction terminals of the transistors (MB l, MB2, MB3, MB4; MC1, MC2) comprised into the high voltage buffer block (4) and into the clamping block (5).
Abstract:
A MEMS transducer (1) has a micromechanical sensing structure (10) and a package (46). The package (46) is provided with a substrate (45), carrying first electrical-connection elements (47), and with a lid (25), coupled to the substrate to define an internal cavity (24), in which the micromechanical sensing structure (10) is housed. The lid (25) is formed by: a cap layer (20) having a first surface (20a) and a second surface (20b), set opposite to one another, the first surface (20a) defining an external face of the package (46) and the second surface (20b) facing the substrate (45) inside the package (46); and a wall structure (21), set between the cap layer (20) and the substrate (45), and having a coupling face (21a) coupled to the substrate (45). At least a first electrical component (10, 11) is coupled to the second surface (20b) of the cap layer (20), inside the package (46), and the coupling face (21a) of the wall structure (21) carries second electrical-connection elements (30), electrically connected to the first electrical component (10, 11) and to the first electrical-connection elements (47).
Abstract:
An integrated electronic device (1) having a body (9) of semiconductor material and a first antenna (3;3a) which enables magnetic or electromagnetic coupling of the integrated electronic device with a further antenna (3b,3c). The integrated electronic device (1) has a first via (4;4a- 4d;50;50a;53) of magnetic material arranged at least in part inside the body (9), which forms, in use, a communication channel between the first antenna (3;3a) and the further antenna (3b,3c).
Abstract:
The invention relates to a method for an improved checking of repeatability and reproducibility of a measuring chain, in particular for the quality control by means of the semiconductor device testing, wherein testing steps are provided for multiple and different devices to be subjected to measurement through a measuring system comprising at least one concatenation of measuring units between a testing apparatus (ATE) and each device to be subjected to measurement. Advantageously, the method comprises the following steps: checking repeatability and reproducibility of each type of unit that forms part of the measuring chain of the concatenation; then making a correlation between the various measuring chains as a whole to check repeatability and reproducibility, using a corresponding device subjected to measurement.
Abstract:
A regulation and shaping circuit comprising a first input terminal (405) for receiving a first input signal (Vref) with a first frequency; a second input terminal (410) for receiving a second input signal (Vin1) with a second frequency higher than the first frequency; a first circuital branch (420) coupled to the first input terminal and, through first coupling means (Z2) active at the first frequency, to an output terminal (415) for providing an output signal (Vout1); a second circuital branch (425) coupled to the second input terminal and to the output terminal, wherein said second circuital branch comprises a negative feedback circuital loop (430, 435) adapted to control the output signal according to the second input signal.
Abstract:
A control device for a power factor correction device in forced switching power supplies is disclosed; the device for correcting the power factor comprises a converter (20) and said control device (1) is coupled with the converter to obtain from an input alternating line voltage (Vin) a regulated output voltage (Vout). The converter (20) comprises a power transistor (M) and the control device (1) comprises a driving circuit (3, 4, 6, 10) of said power transistor; the driving circuit comprises a timer (130) suitable for setting the switch-off period of said power transistor (M). The timer is coupled with the alternating line voltage (Vin) in input to the converter and is suitable for determining the switch-off period of the power transistor in function of the value of the alternating line voltage (Vin) in input to the converter.
Abstract:
A phase change memory device with memory cells (2) formed by a phase change memory element (3) and a selection switch (4). A reference cell (2a) formed by an own phase change memory element (3) and an own selection switch (4) is associated to a group (7) of memory cells to be read. An electrical quantity of the group of memory cells is compared with an analogous electrical quantity of the reference cell, thereby compensating any drift in the properties of the memory cells.