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    Rapid throughput surface topographical analysis
    143.
    发明申请
    Rapid throughput surface topographical analysis 审中-公开
    快速吞吐量表面形貌分析

    公开(公告)号：US20030055587A1

    公开(公告)日：2003-03-20

    申请号：US09954449

    申请日：2001-09-17

    Applicant: Symyx Technologies, Inc.

    Inventor： Youqi Wang ,  Qun Fan ,  C. Eric Ramberg ,  Earl Danielson ,  Damian A. Hajduk

    IPC: G06F019/00

    CPC classification number: G01B11/303

    Abstract: A library of materials is screened for characteristics. Accordingly, a library of materials is provided and an electromagnetic wavefront is directed at each member of the library. The electromagnetic wavefront is monitored for a response after the wavefront encounters the at least for sample materials. Thereafter, the response of the electromagnetic wavefront is correlated to a characteristic of the at least four sample materials.

    Abstract translation: 筛选出材料库。 因此，提供了一个材料库，并且电磁波阵面指向图书馆的每个成员。 在波前遇到至少样品材料之后，监测电磁波前的响应。 此后，电磁波前的响应与至少四个样品材料的特性相关。

    Rheometer for rapidly measuring small quantity samples
    145.
    发明申请
    Rheometer for rapidly measuring small quantity samples 失效

    公开(公告)号：US20030033860A1

    公开(公告)日：2003-02-20

    申请号：US10261945

    申请日：2002-10-01

    Applicant: SYMYX TECHNOLOGIES, INC.

    Inventor： Damian Hajduk ,  Eric Carlson ,  Ravi Srinivasan

    IPC: G01N011/10

    CPC classification number: G01N3/24 ,  G01N11/16 ,  G01N2203/0051 ,  G01N2203/0286 ,  G01N2203/0623

    Abstract: The present invention relates to a miniature rheometer, a parallel rheometer, and improved force sensor elements which may advantageously be used in combination with the miniature rheometer and the parallel rheometer. The miniature rheometer is adapted to determine rheological characteristics of materials which are provided in the form of small quantity samples. The miniature rheometer comprises an actuating element, a sensing element and a feedback circuit to provide rebalance of the shear force applied by the sample to the sensing element, which insures an exceptional stiffness in determining the shear strain so as to allow measurements of high accuracy. The parallel rheometer of the present invention allows simultaneous measurements of a plurality of samples so as to allow of a plurality of samples within a short time period. The force sensor element according to the present invention allows simultaneous measurement of a shear force and a normal force applied to the sensor element. Moreover, a rheometer is provided which comprises a force sensor based on stress-optic material.

    Rheometer for rapidly measuring small quantity samples
    146.
    发明申请
    Rheometer for rapidly measuring small quantity samples 失效

    公开(公告)号：US20030024302A1

    公开(公告)日：2003-02-06

    申请号：US10262369

    申请日：2002-10-01

    Applicant: SYMYX TECHNOLOGIES, INC.

    Inventor： Damian Hajduk ,  Eric Carlson ,  Ravi Srinivasan

    IPC: G01N011/10

    CPC classification number: G01N3/24 ,  G01N11/16 ,  G01N2203/0051 ,  G01N2203/0286 ,  G01N2203/0623

    Abstract: The present invention relates to a miniature rheometer, a parallel rheometer, and improved force sensor elements which may advantageously be used in combination with the miniature rheometer and the parallel rheometer. The miniature rheometer is adapted to determine rheological characteristics of materials which are provided in the form of small quantity samples. The miniature rheometer comprises an actuating element, a sensing element and a feedback circuit to provide rebalance of the shear force applied by the sample to the sensing element, which insures an exceptional stiffness in determining the shear strain so as to allow measurements of high accuracy. The parallel rheometer of the present invention allows simultaneous measurements of a plurality of samples so as to allow of a plurality of samples within a short time period. The force sensor element according to the present invention allows simultaneous measurement of a shear force and a normal force applied to the sensor element. Moreover, a rheometer is provided which comprises a force sensor based on stress-optic material.

    Rheometer for rapidly measuring small quantity samples
    147.
    发明申请
    Rheometer for rapidly measuring small quantity samples 失效
    用于快速测量小批量样品的流变仪

    公开(公告)号：US20020194900A1

    公开(公告)日：2002-12-26

    申请号：US10205060

    申请日：2002-07-25

    Applicant: Symyx Technologies, Inc.

    Inventor： Damian Hajduk ,  Eric Carlson ,  Ravi Srinivasan

    IPC: G01N029/02

    CPC classification number: G01N3/24 ,  G01N11/16 ,  G01N2203/0051 ,  G01N2203/0286 ,  G01N2203/0623

    Abstract: The present invention relates to a miniature rheometer, a parallel rheometer, and improved force sensor elements which may advantageously be used in combination with the miniature rheometer and the parallel rheometer. The miniature rheometer is adapted to determine rheological characteristics of materials which are provided in the form of small quantity samples. The miniature rheometer comprises an actuating element, a sensing element and a feedback circuit to provide rebalance of the shear force applied by the sample to the sensing element, which insures an exceptional stiffness in determining the shear strain so as to allow measurements of high accuracy. The parallel rheometer of the present invention allows simultaneous measurements of a plurality of samples so as to allow of a plurality of samples within a short time period. The force sensor element according to the present invention allows simultaneous measurement of a shear force and a normal force applied to the sensor element. Moreover, a rheometer is provided which comprises a force sensor based on stress-optic material.

    Abstract translation: 本发明涉及微型流变仪，平行流变仪和改进的力传感器元件，其可有利地与微型流变仪和平行流变仪组合使用。 微型流变仪适用于确定以少量样品形式提供的材料的流变特性。 微型流变仪包括致动元件，感测元件和反馈电路，以提供由样品施加到感测元件的剪切力的重新平衡，这确保了确定剪切应变的特殊刚度，以便允许高精度的测量。 本发明的并行流变仪允许多个样本的同时测量，以便在短时间内允许多个样本。 根据本发明的力传感器元件允许同时测量施加到传感器元件的剪切力和法向力。 此外，提供了一种流变仪，其包括基于应力光学材料的力传感器。

    Method and apparatus for characterizing materials by using a mechanical resonator
    148.
    发明申请
    Method and apparatus for characterizing materials by using a mechanical resonator 有权

    公开(公告)号：US20020178787A1

    公开(公告)日：2002-12-05

    申请号：US10201181

    申请日：2002-07-23

    Applicant: Symyx Technologies, Inc.

    Inventor： Leonid Matsiev ,  James Bennett ,  Eric McFarland

    IPC: G01N029/02

    CPC classification number: G01H13/00 ,  B01J2219/00704 ,  G01N9/002 ,  G01N9/34 ,  G01N11/16 ,  G01N29/022 ,  G01N29/036 ,  G01N29/30 ,  G01N29/348 ,  G01N29/42 ,  G01N29/4418 ,  G01N29/4427 ,  G01N29/4436 ,  G01N2009/006 ,  G01N2291/014 ,  G01N2291/0224 ,  G01N2291/0255 ,  G01N2291/0256 ,  G01N2291/02818 ,  G01N2291/0422 ,  G01N2291/0423 ,  G01N2291/0427 ,  G10K11/02

    Abstract: A method and apparatus for measuring properties of a liquid composition includes a mechanical resonator, such as a thickness shear mode resonator or a tuning fork resonator, connected to a measurement circuit. The measurement circuit provides a variable frequency input signal to the tuning fork, causing the mechanical resonator to oscillate. To test the properties of a liquid composition, the mechanical resonator is placed inside a sample well containing a small amount of the liquid. The input signal is then sent to the mechanical resonator and swept over a selected frequency range, preferably less than 1 MHz to prevent the liquid being tested from exhibiting gel-like characteristics and causing false readings. The mechanical resonator's response over the frequency range depends on various characteristics of the liquid being tested, such as the temperature, viscosity, and other physical properties. Particular mechanical resonators, such as tuning fork resonators, can also be used to measure a liquid composition's electrical properties, such as the dielectric constant and conductivity, because the tuning fork's structure allows a high degree of electrical coupling between the tuning fork and the surrounding liquid. The mechanical resonator can be covered with a coating to impart additional special detection properties to the resonator, and multiple resonators can be attached together as a single sensor to obtain multiple frequency responses. The invention is particularly suitable for combinatorial chemistry applications, which require rapid analysis of chemical properties for screening.

    Method for conducting sensor array-based rapid materials characterization
    150.
    发明申请
    Method for conducting sensor array-based rapid materials characterization 失效

    公开(公告)号：US20020028456A1

    公开(公告)日：2002-03-07

    申请号：US09858048

    申请日：2001-05-15

    Applicant: SYMYX TECHNOLOGIES

    Inventor： Paul Mansky ,  James Bennett

    IPC: C12Q001/68 ,  G01N033/53 ,  G01N033/20 ,  C12M001/34 ,  G01N033/543

    CPC classification number: G01N25/18 ,  B01J19/0046 ,  B01J2219/00605 ,  B01J2219/00612 ,  B01J2219/00621 ,  B01J2219/00637 ,  B01J2219/00653 ,  B01J2219/00659 ,  B01J2219/00707 ,  B01J2219/00745 ,  B01J2219/00747 ,  C40B30/08 ,  C40B40/18 ,  G01N25/005

    Abstract: A materials characterization method uses a sensor array disposed on a substrate, with an array and contact pad; electronic test and measurement apparatus for sending electrical signals to and receiving electrical signals from the sensor array; an apparatus for making electrical contact to the sensors in the standardized array format; and an apparatus for routing signals between one or more selected sensors and the electronic test and measurement apparatus. The method comprises applying multiple material samples to the multiple sensors in the array; electrically contacting one or more sensors in the array; making electrical connections between selected sensors and the electronic test and measurement apparatus; and sending and receiving signals to and from the sensors in the array, where the electrical signals correspond to the thermal, electrical, mechanical, or other properties of the material samples. The sensor array is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. The standardized interconnection apparatus and standardized sensor array and contact pad format allow measurement of many different material properties by using substrates carrying different sensor types, with only minor modifications if any to the electronic test and measurement apparatus and test procedures. By using a sensor array that is separate from the electronic apparatus, and by including standardized contacting and signal routing apparatuses, the method takes advantage of a modular nullplug-and-playnull system that eliminates the need for multiple materials characterization machines, and eliminates the need for application-specific active circuitry within the sensor arrays themselves. Further, the method can characterize large numbers of material samples rapidly, on the order of at least 50 samples per hour, reducing the time needed for screening of materials libraries.

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