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    Method and apparatus for characterizing materials by using a mechanical resonator
    3.
    发明申请
    Method and apparatus for characterizing materials by using a mechanical resonator 有权

    公开(公告)号：US20020178787A1

    公开(公告)日：2002-12-05

    申请号：US10201181

    申请日：2002-07-23

    Applicant: Symyx Technologies, Inc.

    Inventor： Leonid Matsiev ,  James Bennett ,  Eric McFarland

    IPC: G01N029/02

    CPC classification number: G01H13/00 ,  B01J2219/00704 ,  G01N9/002 ,  G01N9/34 ,  G01N11/16 ,  G01N29/022 ,  G01N29/036 ,  G01N29/30 ,  G01N29/348 ,  G01N29/42 ,  G01N29/4418 ,  G01N29/4427 ,  G01N29/4436 ,  G01N2009/006 ,  G01N2291/014 ,  G01N2291/0224 ,  G01N2291/0255 ,  G01N2291/0256 ,  G01N2291/02818 ,  G01N2291/0422 ,  G01N2291/0423 ,  G01N2291/0427 ,  G10K11/02

    Abstract: A method and apparatus for measuring properties of a liquid composition includes a mechanical resonator, such as a thickness shear mode resonator or a tuning fork resonator, connected to a measurement circuit. The measurement circuit provides a variable frequency input signal to the tuning fork, causing the mechanical resonator to oscillate. To test the properties of a liquid composition, the mechanical resonator is placed inside a sample well containing a small amount of the liquid. The input signal is then sent to the mechanical resonator and swept over a selected frequency range, preferably less than 1 MHz to prevent the liquid being tested from exhibiting gel-like characteristics and causing false readings. The mechanical resonator's response over the frequency range depends on various characteristics of the liquid being tested, such as the temperature, viscosity, and other physical properties. Particular mechanical resonators, such as tuning fork resonators, can also be used to measure a liquid composition's electrical properties, such as the dielectric constant and conductivity, because the tuning fork's structure allows a high degree of electrical coupling between the tuning fork and the surrounding liquid. The mechanical resonator can be covered with a coating to impart additional special detection properties to the resonator, and multiple resonators can be attached together as a single sensor to obtain multiple frequency responses. The invention is particularly suitable for combinatorial chemistry applications, which require rapid analysis of chemical properties for screening.

    Method for conducting sensor array-based rapid materials characterization
    4.
    发明申请
    Method for conducting sensor array-based rapid materials characterization 失效

    公开(公告)号：US20020028456A1

    公开(公告)日：2002-03-07

    申请号：US09858048

    申请日：2001-05-15

    Applicant: SYMYX TECHNOLOGIES

    Inventor： Paul Mansky ,  James Bennett

    IPC: C12Q001/68 ,  G01N033/53 ,  G01N033/20 ,  C12M001/34 ,  G01N033/543

    CPC classification number: G01N25/18 ,  B01J19/0046 ,  B01J2219/00605 ,  B01J2219/00612 ,  B01J2219/00621 ,  B01J2219/00637 ,  B01J2219/00653 ,  B01J2219/00659 ,  B01J2219/00707 ,  B01J2219/00745 ,  B01J2219/00747 ,  C40B30/08 ,  C40B40/18 ,  G01N25/005

    Abstract: A materials characterization method uses a sensor array disposed on a substrate, with an array and contact pad; electronic test and measurement apparatus for sending electrical signals to and receiving electrical signals from the sensor array; an apparatus for making electrical contact to the sensors in the standardized array format; and an apparatus for routing signals between one or more selected sensors and the electronic test and measurement apparatus. The method comprises applying multiple material samples to the multiple sensors in the array; electrically contacting one or more sensors in the array; making electrical connections between selected sensors and the electronic test and measurement apparatus; and sending and receiving signals to and from the sensors in the array, where the electrical signals correspond to the thermal, electrical, mechanical, or other properties of the material samples. The sensor array is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. The standardized interconnection apparatus and standardized sensor array and contact pad format allow measurement of many different material properties by using substrates carrying different sensor types, with only minor modifications if any to the electronic test and measurement apparatus and test procedures. By using a sensor array that is separate from the electronic apparatus, and by including standardized contacting and signal routing apparatuses, the method takes advantage of a modular nullplug-and-playnull system that eliminates the need for multiple materials characterization machines, and eliminates the need for application-specific active circuitry within the sensor arrays themselves. Further, the method can characterize large numbers of material samples rapidly, on the order of at least 50 samples per hour, reducing the time needed for screening of materials libraries.

    Apparatus and method for characterizing libraries of different materials using x-ray scattering
    6.
    发明申请
    Apparatus and method for characterizing libraries of different materials using x-ray scattering 审中-公开
    使用X射线散射来表征不同材料的文库的装置和方法

    公开(公告)号：US20040017896A1

    公开(公告)日：2004-01-29

    申请号：US10448039

    申请日：2003-05-22

    Applicant: Symyx Technologies, Inc.

    Inventor： Damian Hajduk ,  James Bennett ,  Rakesh Jain

    IPC: H05G001/00

    CPC classification number: G01N23/20 ,  B01J19/0046 ,  B01J2219/00315 ,  B01J2219/00511 ,  B01J2219/00585 ,  B01J2219/00596 ,  B01J2219/00659 ,  B01J2219/00704 ,  B01J2219/00707 ,  B01J2219/00745 ,  C40B40/18 ,  Y10T436/25

    Abstract: An apparatus for characterizing a library containing an array of samples. The apparatus includes an x-ray beam directed at the library, a chamber housing the library and a beamline for directing the x-ray beam onto the library in the chamber. The chamber may include a translation stage that holds the library and that is programmable to change the position of the library relative to the x-ray beam and a controller that controls the movement of the translation stage to expose an element to the x-ray beam in order to rapidly characterize the element in the library. During the characterization, the x-ray beam diffracts upon impinging the element and a detector detects the diffracted x-ray beam in order to generate characterization data for the element.

    Abstract translation: 用于表征包含样本阵列的库的装置。 该装置包括指向文库的x射线束，容纳库的腔室和用于将x射线束引导到腔室中的文库的束线。 所述腔室可以包括平移台，其保持所述库并且可编程以改变所述库相对于所述X射线束的位置;以及控制器，所述控制器控制所述平移台的运动以将元件暴露于所述X射线束 以便快速表征图书馆中的元素。 在表征期间，x射线束在撞击元件时衍射，并且检测器检测衍射的X射线束，以便产生元件的表征数据。

    Sensor array-based system and method for rapid materials characterization
    8.
    发明申请
    Sensor array-based system and method for rapid materials characterization 失效
    基于传感器阵列的系统和快速材料表征的方法

    公开(公告)号：US20030101006A1

    公开(公告)日：2003-05-29

    申请号：US10315519

    申请日：2002-12-10

    Applicant: Symyx Technologies, Inc.

    Inventor： Paul Mansky ,  James Bennett

    IPC: G06F019/00

    CPC classification number: G01N25/005 ,  B01J19/0046 ,  B01J2219/00605 ,  B01J2219/00612 ,  B01J2219/00621 ,  B01J2219/00637 ,  B01J2219/00653 ,  B01J2219/00659 ,  B01J2219/00707 ,  B01J2219/00745 ,  B01J2219/00747 ,  C40B30/08 ,  C40B40/18 ,  G01N25/18 ,  G01N27/72

    Abstract: A modular materials characterization apparatus includes a sensor array disposed on a substrate, with a standardized array and contact pad format; electronic test and measurement apparatus for sending electrical signals to and receiving electrical signals from the sensor array; an apparatus for making electrical contact to the sensors in the standardized array format; an apparatus for routing signals between one or more selected sensors and the electronic test and measurement apparatus and a computer including a computer readable having a computer program recorded therein for controlling the operator of the apparatus. The sensor array is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. The interconnection apparatus and sensor array and contact pad allow measurement of many different material properties by using substrates carrying different sensor types, with only minor modifications if any to the electronic test and measurement apparatus and test procedures. By using a sensor array that is separate from the electronic apparatus, and by including standardized contacting and signal routing apparatuses, the apparatus creates a modular nullplug-and-playnull system that eliminates the need for multiple materials characterization machines, and eliminates the need for application-specific active circuitry within the sensor arrays themselves. Further, the modular sensor array system can characterize large numbers of material samples rapidly, on the order of at least 50 samples per hour, reducing the time needed for screening of materials libraries.

    Abstract translation: 模块化材料表征装置包括设置在基板上的传感器阵列，具有标准化的阵列和接触垫格式; 电子测试和测量装置，用于向传感器阵列发送电信号并接收电信号; 用于以标准阵列格式与传感器电接触的装置; 用于在一个或多个选择的传感器和电子测试和测量装置之间路由信号的装置和包括计算机可读的计算机，其中记录有计算机程序以控制装置的操作者。 传感器阵列优选地以用于组合化学应用中的标准化格式布置，用于将样品材料快速沉积在传感器阵列上。 互连装置和传感器阵列和接触垫允许通过使用携带不同传感器类型的基板来测量许多不同的材料性质，只要对电子测试和测量装置和测试程序进行微小的修改即可。 通过使用与电子设备分离的传感器阵列，并且通过包括标准化的接触和信号路由设备，该设备创建了模块化的“即插即用”系统，其消除了对多种材料表征机器的需要，并且消除了需要 用于传感器阵列本身内的特定于应用的有源电路。 此外，模块化传感器阵列系统可以快速表征大量材料样品，每小时至少50个样品量级，减少了材料库筛选所需的时间。

    Method and apparatus for characterizing materials by using a mechanical resonator
    9.
    发明申请
    Method and apparatus for characterizing materials by using a mechanical resonator 失效

    公开(公告)号：US20030041653A1

    公开(公告)日：2003-03-06

    申请号：US10266047

    申请日：2002-10-07

    Applicant: Symyx Technologies, Inc.

    Inventor： Leonid Matsiev ,  James Bennett ,  Eric McFarland

    IPC: G01N011/10

    CPC classification number: G01H13/00 ,  B01J2219/00704 ,  G01N9/002 ,  G01N9/34 ,  G01N11/16 ,  G01N29/022 ,  G01N29/036 ,  G01N29/30 ,  G01N29/348 ,  G01N29/42 ,  G01N29/4418 ,  G01N29/4427 ,  G01N29/4436 ,  G01N2009/006 ,  G01N2291/014 ,  G01N2291/0224 ,  G01N2291/0255 ,  G01N2291/0256 ,  G01N2291/02818 ,  G01N2291/0422 ,  G01N2291/0423 ,  G01N2291/0427 ,  G10K11/02

    Abstract: A method and apparatus for measuring properties of a liquid composition includes a mechanical resonator, such as a thickness shear mode resonator or a tuning fork resonator, connected to a measurement circuit. The measurement circuit provides a variable frequency input signal to the tuning fork, causing the mechanical resonator to oscillate. To test the properties of a liquid composition, the mechanical resonator is placed inside a sample well containing a small amount of the liquid. The input signal is then sent to the mechanical resonator and swept over a selected frequency range, preferably less than 1 MHz to prevent the liquid being tested from exhibiting gel-like characteristics and causing false readings. The mechanical resonator's response over the frequency range depends on various characteristics of the liquid being tested, such as the temperature, viscosity, and other physical properties. Particular mechanical resonators, such as tuning fork resonators, can also be used to measure a liquid composition's electrical properties, such as the dielectric constant and conductivity, because the tuning fork's structure allows a high degree of electrical coupling between the tuning fork and the surrounding liquid. The mechanical resonator can be covered with a coating to impart additional special detection properties to the resonator, and multiple resonators can be attached together as a single sensor to obtain multiple frequency responses. The invention is particularly suitable for combinatorial chemistry applications, which require rapid analysis of chemical properties for screening.

    Sensor array for rapid materials characterization
    10.
    发明申请
    Sensor array for rapid materials characterization 失效
    用于快速材料表征的传感器阵列

    公开(公告)号：US20020032531A1

    公开(公告)日：2002-03-14

    申请号：US09863532

    申请日：2001-05-23

    Applicant: SYMYX TECHNOLOGIES

    Inventor： Paul Mansky ,  James Bennett

    IPC: G01N033/48

    CPC classification number: G01N25/18 ,  B01J19/0046 ,  B01J2219/00605 ,  B01J2219/00612 ,  B01J2219/00621 ,  B01J2219/00637 ,  B01J2219/00653 ,  B01J2219/00659 ,  B01J2219/00707 ,  B01J2219/00745 ,  B01J2219/00747 ,  C40B30/08 ,  C40B40/18 ,  G01N25/005 ,  G01N27/72

    Abstract: A sensor-array based materials characterization apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending electrical signals to and receiving electrical signals from the sensor array; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor. All or part of the electronic test and signal routing circuitry is contained on the same substrate as the sensor array, comprising an integrated apparatus disposed on a substrate. Additional circuitry and a processor or computer may be physically separate from the substrate carrying the sensor array, and connected to the sensor array substrate by a standardized interconnection method. The method of using the apparatus comprises applying multiple samples to the multiple sensors in the array, and sending and receiving signals to and from selected sensors, where the signals correspond to the material properties of samples in contact with the sensors. The sensor array is preferably arranged in a standardized format used in combinatorial applications for rapid deposition of sample materials on the sensor array. By integrating the electronic test and signal routing circuitry onto the same substrate as the sensor array, a high density of sensors can be situated on a single substrate, permitting the rapid analysis of libraries containing thousands of material samples or more.

    Abstract translation: 基于传感器阵列的材料表征装置包括设置在基板上的传感器阵列; 电子测试电路，用于向电传感器阵列发送电信号并接收电信号; 用于在所选传感器和电子测试电路之间路由信号的电子电路; 以及计算机或处理器。 电子测试和信号路由电路的全部或一部分包含在与传感器阵列相同的衬底上，包括设置在衬底上的集成设备。 附加电路和处理器或计算机可以与承载传感器阵列的基板物理分离，并通过标准化的互连方法连接到传感器阵列基板。 使用该装置的方法包括将多个样本应用于阵列中的多个传感器，以及向选择的传感器发送和接收信号，其中信号对应于与传感器接触的样品的材料特性。 传感器阵列优选地以用于组合应用的标准化格式布置，用于将样品材料快速沉积在传感器阵列上。 通过将电子测试和信号路由电路集成到与传感器阵列相同的衬底上，高密度传感器可以位于单个衬底上，允许对包含数千个材料样品或更多的库的库进行快速分析。

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