Abstract:
Several different inspection systems (100) and methods are described herein that identify defects (e.g. inclusions, occlusions, scratches, stains, blisters, cords or other imperfections associated with surface discontinuities or materal non-homogeneities) on or within a lass sheet 110 .
Abstract:
The invention relates to a method and an apparatus for the investigation of a sample material that is stored in the sample chamber (303) of a storage unit (300). A multi-spot generator MSG (100) and a transmission section (200) generate an array of sample light spots (501) within the sample chamber. Input light (504) that leaves the storage unit (300) in forward direction is mapped onto a CCD array (401) and measured as reference. Moreover, fluorescence light (500) that is stimulated in the sample chamber (303) is measured by a second CCD array which is disposed perpendicular to the optical path of the input light (504).
Abstract:
Apparatus for inspecting lean of a container (34) includes a light source (50) positioned beneath a container (34) for directing light energy (60) onto the container bottom (62) as the container is held in position and rotated around an axis (A). A light sensor (54) positioned beneath the container (34) receives portions of the light energy from the source (50) reflected from the container bottom (62). An information processor (56) is coupled to the light sensor (54) for determining, as a combined function of the reflected light energy and container rotation, departure of the container bottom (62) from a plane perpendicular to the axis (A). The container (34) preferably is held in position and rotated around an axis by a drive roller (24) that urges the container (34) against axially spaced backup rollers (26, 28) so as to define an average axis of rotation as a suction of the geometry of the container (34) and spacing between the backup rollers (26, 28).
Abstract:
An optical inspection system (12, 112) is presented, aimed at detecting defects on a substantially flat workpiece (W) having an axis of symmetry (OP). The workpiece is supported on a stage (18) so as to be in an inspection plane (IP), the stage being mounted for rotation in a plane parallel to the inspection plane. A scanning apparatus (16) is accommodated above the workpiece, and comprises an illumination assembly (24), a plurality of optical assemblies (OA), and a plurality of area sensors (AS). The illumination assembly produces a plurality of incident radiation components for illuminating a strip (S) on the workpiece extending parallel to the axis symmetry between two opposite sides thereof. The optical assemblies are aligned along the axis of symmetry in a spaced-apart parallel relationship, and are mounted for reciprocating movement within a plane parallel to an inspection area (IA) that covers substantially a half of the workpiece. The area sensors are arranged in a predetermined manner, each area sensor being associated with a corresponding one of the optical assemblies for receiving a component of returned radiation and generating data representative thereof. The half of the workpiece is strip-by-strip inspected, then the stage with the workpiece is rotated by 180° and the other half of the workpiece is strip-by-strip inspected.
Abstract:
Method for determining the image clarity of a surface of a sheet, strip or similar, comprising reflection of an image on the surface, detection of a virtual image of the image projected onto the surface and the processing of the detected virtual image of the image projected onto the surface into a signal that is presented as a measure for the image clarity of the surface, wherein the image reflected onto the surface is composed of a number of distinctive light spots and wherein the number of distinctive light spots is determined from the virtual image detected, which number determines, at least in part, the magnitude of the signal.
Abstract:
광학 시스템은 제1 파워를 갖는 제1 광 빔을 생성하도록 구성된 제1 광원을 포함한다. 광학 시스템은 제2 파워를 갖는 적어도 하나의 제2 광 빔을 생성하도록 구성된 제2 광원을 포함한다. 제2 파워는 제1 파워보다 클 수 있다. 광학 시스템은 에너지가 유도 라만 산란(SRS)을 통해 대기 공간의 영역 내에서 제2 파워의 적어도 하나의 제2 광 빔의 광자로부터 제1 파워의 제1 광 빔의 광자로 전달되도록, 대기 공간의 영역 내에서 및 평행하거나 또는 거의 평행한 패턴으로 제2 파워의 적어도 하나의 제2 광 빔을 제1 파워의 제1 광 빔과 적어도 부분적으로 공동-정렬하기 위한 디바이스를 포함한다.