INSPECTION OF EGGS IN THE PRESENCE OF BLOOD
    142.
    发明申请
    INSPECTION OF EGGS IN THE PRESENCE OF BLOOD 审中-公开
    检查血液中存在的血液

    公开(公告)号:WO2006031100A1

    公开(公告)日:2006-03-23

    申请号:PCT/NL2005/000639

    申请日:2005-09-05

    Abstract: The invention relates to a device for inspecting eggs for the presence of blood. The device comprises a light source in order to pass light at a first wavelength which is not selectively absorbed by blood and light at a second wavelength which is selectively absorbed by blood through an egg to be inspected. Furthermore, the device comprises detection means for converting the light transmission through the egg to be inspected for each of the two wavelengths into corresponding signals, each of the said signals being representative of the light transmission at the relevant wavelength. The device also comprises signal-processing means which are designed to determine the ratio between the light transmission associated with the first wavelength and the light transmission associated with the second wavelength based on the signals emanating from the detection means and to emit a decision signal which is representative of the decision whether or not an egg contains blood on the basis of this ratio. According to the invention, the light source comprises one or more identical LED' s (Light Emitting Diode) for generating light which passes through the egg. In use the one or more LED' s emit light within a certain narrow spectrum, which spectrum comprises both the first and the second wavelength.

    Abstract translation: 本发明涉及一种用于检查卵存在血液的装置。 该装置包括光源,以便以不被血液选择性地吸收的第一波长的光和通过待检查的卵选择性地被血液吸收的第二波长的光通过。 此外,该装置包括检测装置,用于将通过要检测的两个波长中的每一个的卵的光透射转换成相应的信号,所述信号中的每一个代表在相关波长处的光透射。 该装置还包括信号处理装置,其被设计为基于从检测装置发出的信号来确定与第一波长相关联的光传输和与第二波长相关联的光传输之间的比率,并且发出决定信号 根据这个比例,代表一个蛋是否含有血液的决定。 根据本发明,光源包括用于产生通过蛋的光的一个或多个相同的LED(发光二极管)。 在使用中,一个或多个LED在特定窄谱内发光,该光谱包括第一和第二波长。

    METHOD FOR DETERMINATION OF GLUCOSE IN WHOLE BLOOD AND CUVETTE AND PHOTOMETER FOR CARRYING OUT SAID METHOD
    143.
    发明申请
    METHOD FOR DETERMINATION OF GLUCOSE IN WHOLE BLOOD AND CUVETTE AND PHOTOMETER FOR CARRYING OUT SAID METHOD 审中-公开
    用于确定全血和葡萄球菌中的葡萄糖的方法和用于实施方法的测光仪

    公开(公告)号:WO1990012890A1

    公开(公告)日:1990-11-01

    申请号:PCT/SE1990000273

    申请日:1990-04-24

    Inventor: MIGRATA UK LTD

    Abstract: A sample of whole blood is contacted with a reagent which by chemical reaction with glucose in the sample brings about a detectable dye concentration change (10) the size of which is determined as a measure of the glucose content of the sample. The sample is initially introduced undiluted in a microcuvette having at least one cavity for receiving the sample. The cavity is internally pretreated with the reagent in dry form, and the chemical reaction takes place in the cavity. Active components of the reagent comprise at least a hemolysing agent for exposing glucose contained in the blood cells of the sample for allowing total glucose determination, and agents taking part in the chemical reaction and ensuring that the dye concentration change (10) takes place at least in a wavelength range (14) outside the absorption range (12) of the blood hemoglobin. An absorption measurement is performed in said wavelength range directly on the sample in the cuvette. A pretreated disposable cuvette with such a reagent and a photometer are also described.

    Abstract translation: 将全血样品与试剂接触,试剂通过与样品中的葡萄糖的化学反应产生可检测的染料浓度变化(10),其大小被确定为样品的葡萄糖含量的量度。 样品最初在具有至少一个用于接收样品的空腔的微量储存器中未稀释地引入。 空腔内部用干燥形式的预处理,化学反应发生在空腔中。 试剂的活性组分至少包含用于暴露样品血细胞中所含的葡萄糖的溶血剂,以允许总葡萄糖测定,以及参与化学反应的试剂,并确保染料浓度变化(10)至少发生 在血红蛋白的吸收范围(12)之外的波长范围(14)中。 在比色皿中的样品上直接在所述波长范围内进行吸收测量。 还描述了具有这种试剂和光度计的预处理的一次性比色杯。

    PROCESS AND DEVICE FOR MEASURING GLOSS
    145.
    发明申请
    PROCESS AND DEVICE FOR MEASURING GLOSS 审中-公开
    用于测量GLOSS的过程和设备

    公开(公告)号:WO1990004166A1

    公开(公告)日:1990-04-19

    申请号:PCT/EP1989001218

    申请日:1989-10-13

    Inventor: BYK-GARDNER GMBH

    CPC classification number: G01N21/57 G01N2201/126 G01N2201/12753

    Abstract: Process and device for measuring gloss in a surface with a light source, which emits light towards the surface, and with a photosensitive detector, which receives the light reflected by the surface and converts it into an electrical signal value. Said device includes a storage unit, where a computing rule for calculating the gloss parameter is stored, a calculation unit, which determines a gloss parameter on the basis of the electrical signal value using the computing rule, and a display unit, which displays the gloss parameter calculated. Five or more pairs of reference values are stored in the storage unit, each pair of reference values being comprised of a reference gloss parameter and of a corresponding reference signal value measured by the device using a reference surface. A comparative unit is also provided, which compares the signal value measured with said reference signal values and feeds at least the nearest higher and the nearest lower value to an interpolation unit.

    Abstract translation: 用于利用光源测量表面光泽的方法和装置,该光源向表面发射光,以及光敏检测器,其接收由表面反射的光并将其转换成电信号值。 所述装置包括存储单元,其中存储用于计算光泽度参数的计算规则;计算单元,其基于使用计算规则的电信号值确定光泽度参数;以及显示单元,其显示光泽度 参数计算。 五个或更多对参考值存储在存储单元中,每对参考值由参考光泽参数和由设备使用参考表面测量的相应参考信号值组成。 还提供了比较单元,其将测量的信号值与所述参考信号值进行比较,并将至少最接近的较高和最接近的较低值馈送到内插单元。

    Auto-focussing LIBS system
    146.
    发明授权

    公开(公告)号:US12117401B2

    公开(公告)日:2024-10-15

    申请号:US18455983

    申请日:2023-08-25

    Abstract: A LIBS analysis system comprises a focusing lens arrangement having a focal plane; a laser for propagating a laser beam through the focusing lens arrangement to be focused at the focal plane; a detector for generating an output that is proportional to an intensity of incident electromagnetic radiation that is incident on the detector; a translation mechanism configured to cause a relative movement of the sample holder and the focusing lens arrangement to vary a position of the focal plane along the optical path with respect to the sample holder; and a controller configured to automatically control the translation mechanism to cause the relative movement of the sample holder and the focusing lens arrangement to achieve an optimum position at which the focal plane and an analysis region of the upper surface intersecting the optical path are at or are close to coincidence.

    Method and Apparatus for Optimizing a Measurement Pattern on a Wafer

    公开(公告)号:US20240328960A1

    公开(公告)日:2024-10-03

    申请号:US18608169

    申请日:2024-03-18

    Inventor: Peter Ebersbach

    CPC classification number: G01N21/9501 G01N2201/126

    Abstract: A method for optimizing a measurement pattern of measurement points for a semiconductor wafer includes (i) obtaining a plurality of measured values with associated measurement points and timestamps, (ii) partitioning the semiconductor wafer into zones, wherein the zones are characterized in that measured values whose measurement positions are within the respective zone have the same characteristic, (iii) determining a variation of the measured values for each of the zones along a predetermined time period, the timestamps of which are within the predetermined time window, and (iv) defining the measurement pattern, wherein, depending on the variations, a measurement point density is defined for each of the zones, in particular a higher measurement point density is selected in the zones with higher variation along the time.

    METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE

    公开(公告)号:US20240319105A1

    公开(公告)日:2024-09-26

    申请号:US18577922

    申请日:2022-09-09

    Inventor: Klaus VEIT

    Abstract: A method for detecting local defects on a reflective surface with a device having at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit. The pattern has at least one substantially linear light-dark transition, the positioning and orientation of the camera are known, the camera captures the pattern reflected on the surface and generates image data of the reflected pattern which are transmitted by the camera to the data processing unit, and the data processing unit determines local defects on the surface on the basis of an evaluation of at least one property of the at least one light-dark transition in the image data of the reflected pattern. Also a device and a computer program.

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