Abstract:
PROBLEM TO BE SOLVED: To provide a coil for preventing the occurrence of a peak with a high electric-field strength.SOLUTION: A positioning device includes a planar motor having two sets of stators and translators. One set of the stator and the translator has a periodical magnetic structure, and another set of the stator and translator includes at least one coil applied to carry a current. The coil includes the wound strip of a sheeted conductive material, and the edge of the coil has a round profile.
Abstract:
PROBLEM TO BE SOLVED: To reduce or eliminate imaging defects caused by bubbles in an immersion liquid while increasing a table speed.SOLUTION: There is disclosed the immersion lithographic apparatus which includes: a projection system configured to direct a patterned beam of radiation on a substrate supported by a table; a liquid handling system configured to supply and confine the immersion liquid to a space defined between a projection system and the table or a substrate, or both of them; and a controller to control a moving speed of the table relative to liquid handling on the basis of a distance between moving direction switches.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation beam modification apparatus and method suitable for usage in an EUV lithographic apparatus. SOLUTION: This radiation beam modification apparatus which controls a characteristic of a radiation beam in a lithographic apparatus includes a flexible sheet formed with a plurality of apertures, and a positioning device including a first rotary member and a second rotary member, wherein a first end of the flexible sheet is connected to the first rotary member, a second end of the flexible sheet is connected to the second rotary member, and the central part of the flexible sheet extends between the first rotary member and the second rotary member. The apertures are used for controlling the numerical aperture of a projection system of the lithographic apparatus. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a programmable patterning means capable of reducing errors due to the movement of a substrate during the duration of the pulse of radiation. SOLUTION: By supplying a means for shifting a patterned projection beam which is incident on a substrate in synchronism with the movement of the substrate during the duration of the pulse of the radiation, movement of the substrate inside is corrected during the duration of the pulse of one-time radiation. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To achieve a high throughput in the patterning of a medium imprintable on a substrate. SOLUTION: An actuator is disclosed that is equipped with: a body 40 having faces; and a plurality of parallel conduits 44 located in the body 40. Each of the conduits 44 is deformable in response to a proper pressure change in the conduit 44, by increasing the flow of a fluid in the conduit 44 or increasing a static pressure applied to the fluid in the conduit 44. A deformation of the conduit 44 causes a deformation of a face 42. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To accurately align a projected image and a substrate. SOLUTION: When the substrate is scanned relative to the image in the lithographic apparatus, a scanning mechanism has coarse accuracy compared with precise patterns of the image to be exposed onto the substrate. In order to ensure that the image and the substrate are aligned at some point in time, an oscillation is imparted to a substrate table or a device that aligns the image, such as a mask table. An oscillation frequency is chosen corresponding to the maximum value of an alignment error. The frequency of a radiation pulse is adjusted so as to most accurately align the image and the substrate. The timing of the radiation pulse of the image may be adjusted so as to achieve accurate alignment when the oscillation is not imparted. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To improve the lithography performance of an apparatus having a liquid that fills the space between a final element of a projection system and a substrate. SOLUTION: A lithographic apparatus and a device manufacturing method make use of a high-refractive index liquid, confined in a reservoir 13, at least partly filling a lithography field between a final element of a projection lens and the substrate. Bubbles forming in the liquid resulting from dissolved atmospheric gases or the gas discharge from an apparatus element exposed to the liquid are detected and removed so that they do not interfere with the exposure, to cause burning defects on the substrate. The detection can be carried out, by measuring the frequency dependence of ultrasonic attenuation in the liquid and the removal of bubbles can be implemented by: degassing and pressurizing the liquid; isolating the liquid from the atmosphere; supplying a continuous flow of liquid through the lithography field using liquids of low surface tension; and further, phase-shifting the ultrasonic standing-wave nodes. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide more effective radiation sources by, improving the efficiency of the collector assembly, to reduce the excitation power used to produce radiation, to extend the life of the radiation sources by, and to improve the efficiency of light collection for the EUV radiation. SOLUTION: A collector assembly for use in a laser-produced plasma extreme ultraviolet radiation source for use in lithography has a collector body 40 having a collecting mirror 42 and a window 43 in the collector body 40. The window is transmissive to excitation radiation beam, which may be an infrared laser beam in general, so that the beam passes through the window to excite the plasma, and the window has an EUV mirror on its surface, which is also transmissive to the excitation radiation beam but which reflects EUV generated by the plasma to the light collecting site of the collecting mirror. The window may improve the collection efficiency and reduce non-uniformity in the image at the light collecting site. Radiation sources, lithographic apparatus and device manufacturing methods may make use of the collector. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To enable efficient cooling and stable positioning of an object that is a detector, such as a photodetector, disposed in a vacuum space. SOLUTION: A described cooling arrangement includes a heat sink having a first heat contact surface, an object having a second heat contact surface, and an elastic wall. The first heat contact surface and the second heat contact surface are set facing each other to form a gap. The elastic wall is part of an enclosure enclosing a space at least containing the gap. The cooling arrangement includes equipment that maintains a pressure difference between the space and an environment given by the cooling arrangement. A lithography apparatus includes this cooling arrangement. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an alignment arrangement and an alignment method which reduce influences of change by marks. SOLUTION: The alignment measurement arrangement includes a light source, an optical system and a detector. The light source generates a radiation beam with a plurality of wavelength ranges. The optical system receives the radiation beam, produces an alignment beam, directs the alignment beam to a mark located on an object, receives alignment radiation back from the mark, and transmits the received radiation. The detector receives the alignment radiation, detects an image of the alignment mark and outputs a plurality of alignment signals (r) each associated with one of the wavelength ranges. A processor, in communication with the detector, receives the alignment signals, determines signal qualities of the alignment signals, determines aligned positions of the alignment signals, and calculates a position of the alignment mark based on the signal qualities, aligned positions, and a model relating the aligned position to the range of wavelengths and mark characteristics, including mark depth and mark asymmetry. COPYRIGHT: (C)2011,JPO&INPIT