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公开(公告)号:US12078542B2
公开(公告)日:2024-09-03
申请号:US17742384
申请日:2022-05-11
Applicant: Au Optronics Corporation , National Cheng-Kung University
Inventor: Chih-Lung Lin , Chia-En Wu , Chia-Lun Lee , Jui-Hung Chang , Jian-Shen Yu
Abstract: An optical sensor circuit is provided. In the optical sensor circuit, an output stage circuit transmits a voltage of first and second node to the output line according to a first driving signal. A first sensor is configured to generate a first photocurrent according to a first color light that senses an ambient light, and generate a second photocurrent according to a second color light. A second sensor is configured to generate a third photocurrent according to a third color light, and generate a fourth photocurrent according to the second color light. In a sensing phase, when the first sensor senses the first color light, and the second sensor senses the third color light, the first sensor adjusts a voltage level of the voltage according to the first photocurrent, and the second sensor adjusts the voltage level of the voltage according to the third photocurrent.
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152.
公开(公告)号:US20180340985A1
公开(公告)日:2018-11-29
申请号:US15887551
申请日:2018-02-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jong Hoon JUNG , Dae Sik KIM , Sung Yeol KIM , Seung Yong SHIN
CPC classification number: G01R31/44 , G01J1/42 , G01J1/44 , G01J3/505 , G01J2001/4252 , G01R1/07314 , G01R31/2635
Abstract: Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.
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公开(公告)号:US10012520B2
公开(公告)日:2018-07-03
申请号:US14949089
申请日:2015-11-23
Applicant: Henry Ip , Michael A. Tischler , Chi Wai Ho
Inventor: Henry Ip , Michael A. Tischler , Chi Wai Ho
CPC classification number: G01D5/34 , G01J1/42 , G01J3/465 , G01J3/505 , G01J2001/4252 , G01J2003/2813
Abstract: In accordance with certain embodiments, multiple light-emitting elements of a light-emitting device are tested via imaging and image analysis.
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公开(公告)号:US20180100763A1
公开(公告)日:2018-04-12
申请号:US15840078
申请日:2017-12-13
Applicant: Gooee Limited
Inventor: Simon Coombes , Shmuel Silverman
CPC classification number: G01J3/505 , G01J1/0271 , G01J1/0403 , G01J1/06 , G01J1/4204 , G01J3/0291 , G01J3/46 , G01J3/51 , H05B33/089 , H05B37/029
Abstract: Devices, systems, and methods are disclosed for attaching a sensor system to luminaires of a variety of shapes and sizes. Specifically, a 3D sensor clip is disclosed with adjustable components configured to attached the 3D sensor clip to a luminaire such as to adjust the position of a color sensor in the 3D sensor clip relative to a luminaire. Devices, systems, and methods are also disclosed for using visual light communication (VLC)/dark light communication (DLC) for communications in a lighting system, including automated identification of luminaires.
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公开(公告)号:US20180073924A1
公开(公告)日:2018-03-15
申请号:US15558209
申请日:2016-02-12
Applicant: Heptagon Micro Optics Pte. Ltd.
Inventor: Lukas Steinmann , Hartmut Rudmann
CPC classification number: G01J3/108 , G01J1/0204 , G01J1/0266 , G01J1/0271 , G01J1/0411 , G01J1/0488 , G01J1/4204 , G01J1/4228 , G01J3/0208 , G01J3/0256 , G01J3/0291 , G01J3/36 , G01J3/50 , G01J3/505 , G01J3/513 , G01J2001/4247 , G01J2001/4266 , G01J2003/1213 , G01S7/4811 , G01S7/4813 , G01S7/4814 , G01S7/4816 , G01S17/026
Abstract: Optoelectronic modules for proximity determination and ambient light sensing include hybrid optical assemblies configured with multiple field-of-views. The field of view in a region of the hybrid optical assembly can be dedicated to a first detector, while the field of views in another region of the hybrid optical assembly can be dedicated to both the emission of light and ambient light sensing. Embodiments relate particularly to implementation in a mobile phone or other portable electronic devices.
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公开(公告)号:US20170165848A1
公开(公告)日:2017-06-15
申请号:US15128393
申请日:2015-03-11
Applicant: LMT Lichtmesstechnik GmbH Berlin
Inventor: Carsten Diem , Thomas Reiners , Dieter Sorowka , Konstantin Radewald , Peter Lange
IPC: B25J19/06 , B25J19/00 , G05B19/4061 , B25J19/02 , B25J19/04
CPC classification number: B25J19/063 , B25J19/0004 , B25J19/022 , B25J19/023 , B25J19/04 , G01J1/0242 , G01J3/504 , G01J3/505 , G01J2001/4247 , G01J2001/4261 , G05B19/4061
Abstract: A method and a gonioradiometer for the direction-dependent measurement of at least one photometric or radiometric characteristic of an optical radiation source. The emission direction of the photometric or radiometric characteristic is described using a system of planes (A, B, C), the planes of which intersect at an intersection line which passes through the radiation centroid of the radiation source, and using an emission angle (α, β, γ) which specifies the emission direction (α, β, γ) within a considered plane. A sensor or the radiation source is fastened to a multi-axis articulated robot. The robot is configured to only swivel about precisely one of its axes during a measuring process, in which measurement values relating to different emission angles (α, β, γ) within a considered plane of the system of planes (A, B, C) or to different planes at a considered emission angle (α, β, γ) are detected.
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157.
公开(公告)号:US20170105260A1
公开(公告)日:2017-04-13
申请号:US15388607
申请日:2016-12-22
Applicant: Ketra, Inc.
Inventor: Horace Ho , Jason E. Lewis , David J. Knapp
CPC classification number: H05B33/0851 , G01J1/0252 , G01J1/32 , G01J1/42 , G01J3/0286 , G01J3/465 , G01J3/505 , G01J2001/4252 , G01J2001/444 , G01R31/44 , H05B33/0866 , H05B33/0869 , H05B37/02 , H05B37/0227
Abstract: An illumination device and method is provided herein for calibrating individual LEDs in the illumination device, so as to obtain a desired luminous flux and a desired chromaticity of the device over changes in drive current, temperature, and over time as the LEDs age. The calibration method may include subjecting the illumination device to a first ambient temperature, successively applying at least three different drive currents to a first LED to produce illumination at three or more different levels of brightness, obtaining a plurality of optical measurements from the illumination produced by the first LED at each of the at least three different drive currents, obtaining a plurality of electrical measurements from the photodetector and storing results of the obtaining steps within the illumination device to calibrate the first LED at the first ambient temperature. The plurality of optical measurements may generally include luminous flux and chromaticity, the plurality of electrical measurements may generally include induced photocurrents and forward voltages, and the calibration method steps may be repeated for each LED included within the illumination device and upon subjecting the illumination device to a second ambient temperature.
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158.
公开(公告)号:US20170070655A1
公开(公告)日:2017-03-09
申请号:US14943235
申请日:2015-11-17
Applicant: Kabushiki Kaisha Toshiba
Inventor: Ryuji Hada , Ken Tanabe
CPC classification number: H04N5/2351 , G01J3/505 , G01J3/513 , H04N9/735
Abstract: A light source estimating apparatus of embodiments has a sensitivity ratio spatial distribution calculating unit configured to extract a first color pixel and a second color pixel which have close spectral sensitivity and which have different sensor responses from a first picked up image picked up with an image sensor under an arbitrary light source, and calculate a ratio between a signal value of the first color pixel and a signal value of the second color pixel to acquire a first sensitivity ratio spatial distribution, and a similarity determining unit configured to estimate a type of the arbitrary light source based on similarity between a second sensitivity ratio spatial distribution group calculated using a second picked up image picked up with the image sensor under a known light source and the first sensitivity ratio spatial distribution.
Abstract translation: 实施例的光源估计装置具有灵敏度比空间分布计算单元,其被配置为提取具有接近光谱灵敏度的第一彩色像素和第二彩色像素,并且具有与由图像传感器拾取的第一拾取图像不同的传感器响应 在任意光源下,计算第一彩色像素的信号值与第二彩色像素的信号值之间的比例,以获取第一灵敏度比空间分布;以及相似度确定单元,被配置为估计任意的类型 基于使用在已知光源下拍摄的图像传感器拾取的第二拾取图像计算的第二灵敏度比空间分布组与第一灵敏度比空间分布之间的相似度的光源。
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159.
公开(公告)号:US09585224B2
公开(公告)日:2017-02-28
申请号:US15240936
申请日:2016-08-18
Applicant: Xicato, Inc.
Inventor: Gerard Harbers
CPC classification number: H05B33/10 , F21K9/00 , F21K9/64 , F21K9/90 , F21V9/30 , F21Y2101/00 , F21Y2105/10 , F21Y2115/10 , G01J3/0251 , G01J3/505 , H01L22/24 , H01L25/0753 , H01L33/00 , H01L33/50 , H01L33/504 , H01L33/505 , H01L33/507 , H01L33/508 , H01L2924/0002 , H01L2933/0041 , H05B33/0857 , Y10T29/49002 , H01L2924/00
Abstract: Multiple colors of light emitted by an assembled light emitting diode (LED) based illumination device is automatically tuned to within a predefined tolerance of multiple target color points by modifying portions of wavelength converting materials associated with each color. A first color of light emitted from the assembled LED based illumination device in response to a first current is measured and a second color of light emitted from the assembled LED based illumination device in response to a second current is measured. A material modification plan to modify wavelength converting materials is determined based at least in part on the measured colors of light and desired colors of light to be emitted. The wavelength converting materials may be selectively modified in accordance with the material modification plan so that the assembled LED based illumination device emits colors of light that are within a predetermined tolerance of target color points.
Abstract translation: 通过修改与每种颜色相关联的波长转换材料的部分,由组装的基于发光二极管(LED)的照明装置发射的多种颜色的光被自动调谐到多个目标色点的预定公差内。 测量响应于第一电流从组装的基于LED的照明装置发射的光的第一颜色,并且测量响应于第二电流从组装的基于LED的照明装置发射的第二颜色的光。 至少部分地基于所测量的光的颜色和要发射的光的所需颜色来确定修改波长转换材料的材料修改计划。 波长转换材料可以根据材料改性方案选择性地修改,使得组装的基于LED的照明装置发射在目标色点的预定公差内的光的颜色。
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160.
公开(公告)号:US09551669B2
公开(公告)日:2017-01-24
申请号:US14204113
申请日:2014-03-11
Applicant: Sof-Tek Integrators, Inc.
Inventor: Daniel C. Morrow , Jonathan Dummer , Stanley Curtis Dodds
CPC classification number: G01N21/66 , G01J3/501 , G01J3/505 , G01J2001/4252 , G01N21/21 , G01N21/8422 , G01N21/9501 , G01R31/2635
Abstract: Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.
Abstract translation: 本文公开的实施方案提供了一种方法和系统,其特征在于物理性质,例如厚度,均匀性,极化,和/或尺寸和位于生长在沉积在基底上的薄膜上的晶体结构的缺陷(例如,缺陷密度分布) 固态发光器件。 本文公开的实施例通常包括用能量源激发发光器件并分析由沉积在衬底上的薄膜上生长的晶体结构发射的光能。
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