中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

477 records (took 0.037 seconds)

    Spectroscopic Color Measurement Device and Method for Calculating Spectral Reflectance
    163.
    发明申请
    Spectroscopic Color Measurement Device and Method for Calculating Spectral Reflectance 审中-公开

    公开(公告)号：US20180356286A1

    公开(公告)日：2018-12-13

    申请号：US15571376

    申请日：2016-04-13

    Applicant: KONICA MINOLTA, INC.

    Inventor： Yoshiroh NAGAI

    IPC: G01J3/50 ,  G01N21/55

    CPC classification number: G01J3/502 ,  G01J3/524 ,  G01N21/55

    Abstract: In order to provide a technique by which a highly-accurate conversion rule of measurement values between different spectrocolorimetric devices can be easily set, the spectrocolorimetric device includes a light source, a light-receiving unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface of an object according to irradiation of the object with illumination light emitted from the light source and measures a spectroscopic spectrum of the reflected light. The conversion unit calculates a spectral reflectance that can be acquired by another spectrocolorimetric device from the spectroscopic spectrum by using a calibrated spectral sensitivity of the other spectrocolorimetric device different from the spectrocolorimetric device and the spectroscopic spectrum.

    CHROMATIC CONFOCAL SENSOR AND MEASUREMENT METHOD
    167.
    发明申请
    CHROMATIC CONFOCAL SENSOR AND MEASUREMENT METHOD 审中-公开

    公开(公告)号：US20180113027A1

    公开(公告)日：2018-04-26

    申请号：US15726276

    申请日：2017-10-05

    Applicant: Mitutoyo Corporation

    Inventor： Koji Kubo

    IPC: G01J3/50 ,  G01J3/02 ,  G01J3/10

    CPC classification number: G01J3/502 ,  G01J3/0208 ,  G01J3/10 ,  G01J2003/102

    Abstract: A chromatic confocal sensor includes: a light source portion that emits a plurality of light beams having different wavelengths; a plurality of optical heads that converge the plurality of light beams emitted from the light source portion at different focal positions and emit measurement light reflected by a measurement point at the focal positions; a spectrometer including a line sensor, and an optical system that includes a diffraction grating that diffracts a plurality of measurement light beams emitted from the plurality of optical heads, and emits the plurality of measurement light beams diffracted by the diffraction grating to a plurality of different light-receiving areas of the line sensor; and a position calculation portion that calculates a position of a plurality of measurement points as a measurement target of the plurality of optical heads based on a light-receiving position of the plurality of light-receiving areas of the line sensor.

    Wavelength variable interference filter, optical filter device, optical module, and electronic apparatus
    169.
    发明授权
    Wavelength variable interference filter, optical filter device, optical module, and electronic apparatus 有权
    波长可变干涉滤波器，滤光器件，光学模块和电子设备

    公开(公告)号：US09347887B2

    公开(公告)日：2016-05-24

    申请号：US13626173

    申请日：2012-09-25

    Applicant: Seiko Epson Corporation

    Inventor： Nozomu Hirokubo ,  Akira Sano

    IPC: G01N21/65 ,  G02B5/28 ,  G01J3/50 ,  G01J3/26 ,  G02B26/00

    CPC classification number: G01N21/658 ,  G01J3/26 ,  G01J3/502 ,  G02B5/284 ,  G02B26/001

    Abstract: A wavelength variable interference filter includes a fixed substrate, a movable substrate, a fixed reflective film provided on the fixed substrate, a movable reflection film provided on the movable substrate and opposed to the fixed reflective film via an inter-reflective film gap, a fixed electrode provided on the fixed substrate, a movable electrode provided on the movable substrate and opposed to the fixed electrode via an inter-electrode gap, a fixed charging preventing electrode provided along the outer circumferential edge of the fixed electrode and in non-contact with the fixed electrode and grounded, and a movable charging preventing electrode provided along the outer circumferential edge of the movable electrode and in non-contact with the movable electrode and grounded.

    Abstract translation: 波长可变干涉滤光器包括：固定基板，可动基板，固定基板上设置的固定反射膜;可移动反射膜，设置在可移动基板上，并经由反射膜间隔与固定反射膜相对;固定反射膜 设置在所述固定基板上的电极，设置在所述可动基板上并且经由所述电极间间隔与所述固定电极相对的可动电极，沿着所述固定电极的外周缘设置并与所述固定电极不接触的固定充电防止电极， 固定电极并接地，以及沿着可动电极的外周缘设置并与可动电极非接触并接地的可移动防止充电电极。

    Image forming apparatus
    170.
    发明授权
    Image forming apparatus 有权
    图像形成装置

    公开(公告)号：US09207125B2

    公开(公告)日：2015-12-08

    申请号：US14071026

    申请日：2013-11-04

    Applicant: CANON KABUSHIKI KAISHA

    Inventor： Taichi Takemura

    IPC: G01J3/52 ,  G03G15/00 ,  G01J3/50 ,  B41J29/38 ,  H04N1/60 ,  G01J3/46 ,  G03G15/01 ,  H04N1/00

    CPC classification number: G01J3/52 ,  B41J29/38 ,  G01J3/462 ,  G01J3/502 ,  G03G15/0189 ,  G03G15/5062 ,  G03G15/55 ,  G03G2215/0129 ,  G03G2215/0164 ,  H04N1/00623 ,  H04N1/6033

    Abstract: An image forming apparatus includes an image forming unit configured to form a measurement image on a sheet, a measurement unit configured to emit light to the measurement image, and measure light reflected from the measurement image, a selection unit configured to select one of a first mode for feeding a sheet, forming a measurement image on the sheet with the image forming unit, and measuring the measurement image on the sheet with the measurement unit, and a second mode for feeding a chart on which a measurement image has already been formed, and measuring the measurement image on the chart with the measurement unit without performing image formation with the image forming unit, and a control unit configured to control the measurement unit to perform measurement of the measurement image according to the mode selected by the selection unit.

    Abstract translation: 图像形成装置包括图像形成单元，被配置为在片材上形成测量图像，测量单元，被配置为向测量图像发光，并测量从测量图像反射的光;选择单元，被配置为选择第一 模式，用图像形成单元在片材上形成测量图像，并用测量单元测量片材上的测量图像，以及用于馈送已经形成测量图像的图表的第二模式， 以及使用测量单元测量图表上的测量图像而不用图像形成单元进行图像形成;以及控制单元，被配置为控制测量单元根据由选择单元选择的模式来执行测量图像的测量。

Patent Agency Ranking