公开(公告)号：US09316580B2

公开(公告)日：2016-04-19

申请号：US14501010

申请日：2014-09-29

Applicant: COLORIGHT LTD.

Inventor： Benzion Landa ,  Efraim Miklatzky ,  Sagi Abramovich ,  Yacov Mazuz ,  Anton Krassilnikov ,  Eliyahu Benny ,  Elena Ishkov ,  Lior Shahar ,  Daniel Mandelik

IPC: G01J3/00 ,  G01N21/27 ,  B65D83/04 ,  G01N21/21 ,  B65D1/02 ,  G01J3/02 ,  G01J3/18 ,  G01J3/42

CPC classification number: A61Q5/10 ,  A61K8/0216 ,  A61K2800/4322 ,  B65D1/0223 ,  B65D83/04 ,  B65D2501/0081 ,  G01J3/02 ,  G01J3/18 ,  G01J3/42 ,  G01N21/21 ,  G01N21/27 ,  G01N21/4738 ,  G01N21/84 ,  G01N2201/062 ,  G01N2201/105

Abstract: Novel systems and methods for performing treatment (e.g., coloration) of keratinous fibers are disclosed. The methods and systems utilize one or more of a dispensing device which is configured to provide customized composition for treating keratinous fibers (e.g., a coloring composition), optionally formed from tablets; an optical reader, for obtaining sufficient characteristics of the keratinous fibers to make a realistic prediction of the outcome of a treatment (e.g., coloring treatment); a computational units for predicting an outcome of a treatment, optionally being interfaced with the dispensing device and for selecting a customized treatment; and tablet formulations which are useful in preparing customized composition for treating keratinous fibers. Further disclosed are rapidly disintegrating tablets for use in the preparation of compositions for treating keratinous fibers.

公开(公告)号：US20150124247A1

公开(公告)日：2015-05-07

申请号：US14517751

申请日：2014-10-17

Applicant: KLA-Tencor Corporation

Inventor： Allen Park ,  Craig MacNaughton ,  Ellis Chang

IPC: G01N21/93 ,  G01N21/95

CPC classification number: G01N21/93 ,  G01B11/06 ,  G01B11/0675 ,  G01B2210/56 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/061 ,  G01N2201/105 ,  G01N2201/11 ,  G01N2201/125 ,  G03F7/705 ,  G03F7/70616

Abstract: Methods and systems for determining one or more parameters of a wafer inspection process are provided. One method includes acquiring metrology data for a wafer generated by a wafer metrology system. The method also includes determining one or more parameters of a wafer inspection process for the wafer or another wafer based on the metrology data.

Abstract translation: 提供了用于确定晶片检查过程的一个或多个参数的方法和系统。 一种方法包括获取由晶片计量系统产生的晶片的度量数据。 该方法还包括基于测量数据确定晶片或另一晶片的晶片检查过程的一个或多个参数。

公开(公告)号：US20150068981A1

公开(公告)日：2015-03-12

申请号：US14386388

申请日：2013-03-15

Applicant: Banu ORMECI BECKERS

Inventor： Banu Ormeci Beckers

IPC: G01N21/33 ,  C02F1/00 ,  C02F1/52 ,  G01N21/59

CPC classification number: G01N21/33 ,  C02F1/008 ,  C02F1/5209 ,  C02F1/5245 ,  C02F1/56 ,  C02F11/14 ,  C02F2103/06 ,  C02F2103/30 ,  C02F2103/32 ,  C02F2209/00 ,  C02F2209/001 ,  C02F2209/003 ,  G01J3/42 ,  G01N21/59 ,  G01N2201/105

Abstract: The present application provides a method of detecting an amount of a treatment agent, such as a flocculating agent, in a process stream comprising the step of measuring at least one absorption property of a sample obtained from the process stream at a wavelength of less than about 250 nm. Processes and systems for monitoring and regulating addition of treatment agents to process streams are also provided.

Abstract translation: 本申请提供了在工艺流中检测处理剂如絮凝剂的量的方法，该方法包括以下步骤：测量从工艺流中获得的样品的至少一种吸收性能，其波长小于约 250 nm。 还提供了用于监测和调节加工流程中处理剂添加的过程和系统。

公开(公告)号：US20150057954A1

公开(公告)日：2015-02-26

申请号：US14383495

申请日：2013-03-07

Applicant: Innovativ Vision AB

Inventor： Anders Olsson ,  Erik Serrano ,  Jan Oscarsson ,  Bertil Enquist ,  Marie Johansson ,  Bo Källsner

IPC: G01N33/46 ,  G01N3/02 ,  G01N21/898

CPC classification number: G01N33/46 ,  G01N3/02 ,  G01N21/8986 ,  G01N2201/06113 ,  G01N2201/105

Abstract: The present disclosure relates to a method and device for evaluating a wooden board with an elongated direction. Data indicating fiber orientation over the surface of the board is acquired and for a number of board sub-portions a nominal local modulus of elasticity, MOE, is determined based on the fiber orientation data and a nominal material parameter. A nominal global MOE in the elongated direction for the wooden board as a whole is generated and compared with a secondary global MOE. Based on the fiber orientation data and this comparison an estimated local modulus of elasticity, MOE, in said elongated direction is generated for a number of board sub-portions. This data may be used e.g. for reliable strength grading of wooden boards.

Abstract translation: 本公开涉及一种用于评估具有细长方向的木板的方法和装置。 获取指示板的表面上的纤维取向的数据，并且对于多个板子部分，基于纤维取向数据和标称材料参数来确定标称局部弹性模量MOE。 整个木板的拉伸方向的名义上的全球MOE被产生并与次级全球MOE进行比较。 基于纤维取向数据和该比较，对于多个板子部分产生在所述细长方向上的估计的局部弹性模量MOE。 该数据可以例如使用。 用于可靠的木板强度分级。

公开(公告)号：US08958063B2

公开(公告)日：2015-02-17

申请号：US14369384

申请日：2011-12-31

Applicant: Xiaofeng Guo ,  Huifen Li ,  Xiaofeng Lin ,  Xiaowei Sun ,  Wenhua Deng

Inventor： Xiaofeng Guo ,  Huifen Li ,  Xiaofeng Lin ,  Xiaowei Sun ,  Wenhua Deng

IPC: G01N21/00 ,  G01N21/88 ,  G01N21/958 ,  F21K99/00 ,  F21Y103/00

CPC classification number: G01N21/8806 ,  F21K9/27 ,  F21Y2103/10 ,  F21Y2115/10 ,  G01N21/896 ,  G01N21/958 ,  G01N2021/8816 ,  G01N2201/0633 ,  G01N2201/105

Abstract: An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented. An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.

Abstract translation: 提供一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括该照明装置的检测系统。 照明系统包括：用于检测透明基板中的缺陷的照明系统，包括条形光源容器; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。

公开(公告)号：US20150042993A1

公开(公告)日：2015-02-12

申请号：US14525647

申请日：2014-10-28

Applicant: KLA-TENCOR CORPORATION

Inventor： Richard E. Bills ,  Neil Judell ,  Klaus R. Freischlad ,  James P. McNiven

IPC: G01N21/88 ,  G01N21/21 ,  G01N21/95 ,  G01N21/47

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

公开(公告)号：US20150029516A1

公开(公告)日：2015-01-29

申请号：US14374054

申请日：2012-12-12

Applicant: FARO Technologies, Inc.

Inventor： Christoph Neundorf ,  Reinhard Becker

IPC: G01B11/14 ,  G01N21/47

CPC classification number: G01B11/14 ,  G01C15/002 ,  G01N21/47 ,  G01N2201/06113 ,  G01N2201/105 ,  G02B26/10

Abstract: A laser scanner device for optically scanning and measuring an environment includes a base, a measuring head which is rotatable relative to the base, and a mirror which is rotatably relative to the measuring head, wherein, in at least one operating mode, the laser scanner is mounted on a cart by a mounting device, the cart moves the base which is fixedly connected with the mounting device, the measuring head rests relative to the base, the mirror rotates, and the measuring head is locked with the mounting device by a locking mechanism.

Abstract translation: 一种用于光学扫描和测量环境的激光扫描仪装置包括基座，可相对于基座旋转的测量头和相对于测量头可旋转的反射镜，其中在至少一个操作模式中，激光扫描器 通过安装装置安装在推车上，推车移动与安装装置固定连接的基座，测量头相对于基座搁置，镜子旋转，测量头通过锁定与安装装置锁定 机制。

公开(公告)号：US08917432B2

公开(公告)日：2014-12-23

申请号：US13563850

申请日：2012-08-01

Applicant: Daniel Wack ,  Daimian Wang ,  Karl R. Umstadter ,  Ed Ma ,  Frank Chilese

Inventor： Daniel Wack ,  Daimian Wang ,  Karl R. Umstadter ,  Ed Ma ,  Frank Chilese

IPC: G02B26/08 ,  G03F7/20 ,  G02B26/12

CPC classification number: G02B26/123 ,  G01N21/8806 ,  G01N2021/95676 ,  G01N2201/105 ,  G03F1/24 ,  G03F1/84 ,  G03F7/7005

Abstract: The present disclosure is directed to an illumination system. The illumination system may include a base member rotatable about a rotation axis and a plurality of mirrors disposed on an outer surface of the base member along a perimeter of the base member. The mirrors may be oriented at a predetermined angle. The illumination system also includes at least two illumination sources. Each of the mirrors of the first plurality of mirrors is configured to receive radiation from the first illumination source at a first portion of each mirror at a first time. The mirror is configured to reflect the radiation to an optical path. Each of the mirrors is further configured to receive radiation from the second illumination source at a second portion of the mirror at a second time. The mirrors reflect the radiation from the second illumination source to the common optical path.

Abstract translation: 本公开涉及一种照明系统。 照明系统可以包括可围绕旋转轴线旋转的基座构件和沿着基座构件的周边设置在基座构件的外表面上的多个反射镜。 反射镜可以以预定角度定向。 照明系统还包括至少两个照明源。 第一多个反射镜的每个反射镜被配置为在第一时间在每个反射镜的第一部分处接收来自第一照明源的辐射。 镜被配置为将辐射反射到光路。 每个反射镜被进一步配置成在第二时间在反射镜的第二部分处接收来自第二照明光源的辐射。 反射镜将从第二照明源的辐射反射到公共光路。

公开(公告)号：US20140357969A1

公开(公告)日：2014-12-04

申请号：US14365609

申请日：2012-12-17

Applicant: RIKEN

Inventor： Satoshi Wada ,  Kazuo Tsubota ,  Atsushi Shinjo

IPC: A61B5/1455 ,  A61B5/145 ,  A61B3/12 ,  G01N21/65

CPC classification number: A61B5/1455 ,  A61B3/1025 ,  A61B3/12 ,  A61B5/0068 ,  A61B5/0071 ,  A61B5/0075 ,  A61B5/14546 ,  G01N21/65 ,  G01N2021/5957 ,  G01N2021/653 ,  G01N2201/06113 ,  G01N2201/105

Abstract: In a laser scanning method for measuring in vivo substances, wavelength of the anti-Stokes line is made greater than wavelength absorption band of the specific substance, the wavelength of the probe light is shifted from the wavelength of the anti-Stokes line by a shift amount of Raman scattering of the specific substance, and the wavelength of the Stokes light is shifted from the wavelength of the probe light by the shift amount of the Raman scattering of the specific substance. According to this, density (concentration and distribution) of lutein in an eye fundus is measured quantitatively and non-invasively from a signal strength level of the anti-Stokes line.1

Abstract translation: 在用于体内物质测量的激光扫描方法中，反斯托克斯线的波长比特定物质的波长吸收带宽大，探针光的波长从反斯托克斯线的波长偏移了一个偏移 特定物质的拉曼散射量和斯托克斯光的波长从探测光的波长偏移特定物质的拉曼散射的偏移量。 据此，从反斯托克斯线的信号强度水平定量和非侵入地测量眼底中叶黄素的浓度（浓度和分布）。

公开(公告)号：US20140347657A1

公开(公告)日：2014-11-27

申请号：US14369384

申请日：2011-12-31

Applicant: Xiaofeng Guo ,  Huifen Li ,  Xiaofeng Lin ,  Xiaowei Sun ,  Wenhua Deng

Inventor： Xiaofeng Guo ,  Huifen Li ,  Xiaofeng Lin ,  Xiaowei Sun ,  Wenhua Deng

IPC: G01N21/88 ,  F21K99/00 ,  G01N21/958

CPC classification number: G01N21/8806 ,  F21K9/27 ,  F21Y2103/10 ,  F21Y2115/10 ,  G01N21/896 ,  G01N21/958 ,  G01N2021/8816 ,  G01N2201/0633 ,  G01N2201/105

Abstract: An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented, An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle.

Abstract translation: 一种用于提供近似各向同性照明的照明装置，特别是用于检测透明基板中的缺陷的照明系统和包括其的检测系统。一种照明系统，包括：用于检测透明基板中的缺陷的照明系统，包括 光源插座为棒状; 第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且第一点光源沿着插座的纵向布置到第一线点光源; 以及第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源。