Modular sample processing apparatus kits and modules
    11.
    发明申请
    Modular sample processing apparatus kits and modules 有权
    模块化样品处理设备套件和模块

    公开(公告)号:US20070007270A1

    公开(公告)日:2007-01-11

    申请号:US11174756

    申请日:2005-07-05

    CPC classification number: G01N35/025

    Abstract: Modular sample processing apparatus kits that can provide a user with the flexibility to customize a disk-based assay in view of a variety of factors are disclosed. The sample processing apparatus kits of the present invention include one or more process modules that can be retained within openings in a frame. The frame and process modules of the sample processing apparatus kits are preferably adapted for use in sample processing systems that compress the apparatus. The process modules may contain different reagents to perform different tests on the same sample materials or a variety of sample materials. As a result, a single sample processing apparatus can be used to perform a variety of different tests and may include a quality control module capable of providing feedback to the user as to the accuracy of the processes run using the sample processing apparatus. Methods of using the sample processing apparatus that include deforming the process modules and frame are also disclosed.

    Abstract translation: 公开了可以根据各种因素为用户提供定制基于磁盘的测定的灵活性的模块化样品处理装置套件。 本发明的样品处理装置试剂盒包括可以保持在框架中的开口内的一个或多个处理模块。 样品处理装置套件的框架和处理模块优选地适用于压缩装置的样品处理系统。 过程模块可以包含不同的试剂以对相同的样品材料或各种样品材料进行不同的测试。 结果,可以使用单个样本处理装置来执行各种不同的测试,并且可以包括质量控制模块,其能够向用户提供关于使用样本处理装置运行的处理的准确性的反馈。 还公开了使用包括使处理模块和框架变形的样品处理装置的方法。

    Variable valve apparatus and methods

    公开(公告)号:US20050126312A1

    公开(公告)日:2005-06-16

    申请号:US10734717

    申请日:2003-12-12

    Abstract: Sample processing devices with variable valve structures and methods of using the same are disclosed. The valve structures allow for removal of selected portions of the sample material located within the process chamber. Removal of the selected portions is achieved by forming an opening in a valve septum at a desired location. The valve septums may be large enough to allow for adjustment of the location of the opening based on the characteristics of the sample material in the process chamber. If the sample processing device is rotated after the opening is formed, the selected portion of the material located closer to the axis of rotation exits the process chamber through the opening. The remainder of the sample material cannot exit through the opening because it is located farther from the axis of rotation than the opening.

    MODULAR SAMPLE PROCESSING APPARATUS KITS AND MODULES
    14.
    发明申请
    MODULAR SAMPLE PROCESSING APPARATUS KITS AND MODULES 有权
    模块化样品加工装置和模块

    公开(公告)号:US20080050276A1

    公开(公告)日:2008-02-28

    申请号:US11930628

    申请日:2007-10-31

    CPC classification number: G01N35/025

    Abstract: Modular sample processing apparatus kits that can provide a user with the flexibility to customize a disk-based assay in view of a variety of factors are disclosed. The sample processing apparatus kits of the present invention include one or more process modules that can be retained within openings in a frame. The frame and process modules of the sample processing apparatus kits are preferably adapted for use in sample processing systems that compress the apparatus. The process modules may contain different reagents to perform different tests on the same sample materials or a variety of sample materials. As a result, a single sample processing apparatus can be used to perform a variety of different tests and may include a quality control module capable of providing feedback to the user as to the accuracy of the processes run using the sample processing apparatus. Methods of using the sample processing apparatus that include deforming the process modules and frame are also disclosed.

    Abstract translation: 公开了可以根据各种因素为用户提供定制基于磁盘的测定的灵活性的模块化样品处理装置套件。 本发明的样品处理装置试剂盒包括可以保持在框架中的开口内的一个或多个处理模块。 样品处理装置套件的框架和处理模块优选地适用于压缩装置的样品处理系统。 过程模块可以包含不同的试剂以对相同的样品材料或各种样品材料进行不同的测试。 结果,可以使用单个样本处理装置来执行各种不同的测试,并且可以包括质量控制模块,其能够向用户提供关于使用样本处理装置运行的处理的准确性的反馈。 还公开了使用包括使处理模块和框架变形的样品处理装置的方法。

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