Abstract:
A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.
Abstract:
A hand-held, self-contained x-ray fluorescence (XRF) analyzer (200) produces a small x-ray spot on a sample (604) to interrogate the elemental composition of a sample (604) region of millimeter-size characteristic dimension. The analyzer (200) includes an x-ray source for aiming an x-ray beam (304) toward a desired location on the sample (604). The analyzer (200) may include a digital camera (316) oriented toward the portion of the sample (604) that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer (200). The analyzer may generate a reticule (908, 910) in a displayed image to indicate the portion of the sample (604) that is, or would be, illuminated by the x-ray beam (304). The analyzer (200) may include a detector collimator (1200) positioned along a light path between the spot and the detector (314). The analyzer (200) may include a chamber through which the beam (304) and the response signal (312) pass and a coupling for receiving an end of a purge gas tank (2502) for providing a purge gas to the chamber. The analyzer (200) may include a sensor operative to detect an amount of ambient gas present in the chamber. A calibration target (2200) and method (2300-2308) are disclosed for calibrating a location of a reticule in the analyzer (200).
Abstract:
An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a detector signal, and a controller for converting the detector signal into a spectrum characterizing the composition of the test material. A platen of attenuating material extends outward from adjacent to, and surrounding, the irradiated surface of the test material. In certain embodiments, the thickness of the attenuating platen is tapered such as to decrease with increasing radial distance from the central irradiated region of the test material.
Abstract:
A method for obtaining a concentrated, monochromatic x-ray beam from a standard x-ray tube or other source of polychromatic emission. X-rays from the anode of the x-ray tube fluoresce an adjoining, independent target that produces a monochromatic spectrum, a portion of which is focused by the x-ray optical system. This two-stage method gives the system considerably versatility without undue loss in signal. The two-stage concentrator makes practical the use of focusing optics in hand-held and portable instruments.
Abstract:
An apparatus for selective radiation detection includes a neutron detector that facilitates detection of neutron emitters, e.g. plutonium, and the like; a gamma ray detector that facilitates detection of gamma ray sources, e.g., uranium, and the like; and/or an X-ray analyzer that facilitates detection of materials that can shield radioactiv sources, e.g., lead, and the like.
Abstract:
Multiple energy sources, such as a laser and electrical field, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time, lead to higher consistency and higher quality optical emission spectra, and enhance the measurements of non-conducting solids, liquids and gases. Additionally, a portable instrument is provided with both laser source and spectrometer optically coupled to a hand-holdable unit.
Abstract:
Multiple energy sources, such as a laser and electrical field, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time, lead to higher consistency and higher quality optical emission spectra, and enhance the measurements of non-conducting solids, liquids and gases. Additionally, a portable instrument is provided with both laser source and spectrometer optically coupled to a hand-holdable unit.
Abstract:
A hand-held, self-contained x-ray fluorescence (XRF) analyzer (200) produces a small x-ray spot on a sample (604) to interrogate the elemental composition of a sample (604) region of millimeter-size characteristic dimension. The analyzer (200) includes an x-ray source for aiming an x-ray beam (304) toward a desired location on the sample (604). The analyzer (200) may include a digital camera (316) oriented toward the portion of the sample (604) that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer (200). The analyzer may generate a reticule (908, 910) in a displayed image to indicate the portion of the sample (604) that is, or would be, illuminated by the x-ray beam (304). The analyzer (200) may include a detector collimator (1200) positioned along a light path between the spot and the detector (314). The analyzer (200) may include a chamber through which the beam (304) and the response signal (312) pass and a coupling for receiving an end of a purge gas tank (2502) for providing a purge gas to the chamber. The analyzer (200) may include a sensor operative to detect an amount of ambient gas present in the chamber. A calibration target (2200) and method (2300-2308) are disclosed for calibrating a location of a reticule in the analyzer (200).
Abstract:
An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a detector signal, and a controller for converting the detector signal into a spectrum characterizing the composition of the test material. A platen of attenuating material extends outward from adjacent to, and surrounding, the irradiated surface of the test material. In certain embodiments, the thickness of the attenuating platen is tapered such as to decrease with increasing radial distance from the central irradiated region of the test material.
Abstract:
An analytical instrument is disclosed having both XRF and optical emission spectroscopy capabilities, hi a particularly advantageous embodiment, a field portable XRF device is removably coupled to the instrument by means of a docking station. A first surface of the sample is irradiated with an X-ray beam, and the X-ray radiation f luorescently emitted from the sample is detected and analyzed to acquire elemental composition data. In the preferred embodiment, the instrument is further provided with a spark source located proximal a second surface of the sample and a detector for sensing the radiation emitted from the spark-excited material. The combined instrument enables the acquisition of complementary elemental composition data by XRF and spark emission spectroscopy without having to transport a sample between separate instruments.