IMPROVED WRITE BANDWIDTH IN A MEMORY CHARACTERIZED BY A VARIABLE WRITE TIME
    11.
    发明申请
    IMPROVED WRITE BANDWIDTH IN A MEMORY CHARACTERIZED BY A VARIABLE WRITE TIME 审中-公开
    在一个可变写入时间表示的存储器中改进写入带宽

    公开(公告)号:WO2012115744A1

    公开(公告)日:2012-08-30

    申请号:PCT/US2012/022823

    申请日:2012-01-27

    Abstract: A memory system that includes a plurality of memory arrays having memory cells characterized by a variable write time. The memory system also includes a memory bus configured to receive write commands, and a plurality of data buffers configured to communicate with the memory arrays. The memory system further includes an address buffer configured to communicate with the memory arrays to store the write addresses. A mechanism configured to receive a write command and to split a data line received with the write command into a number of parts is also included in the memory system. The parts of the data line are stored in different data buffers and the writing of the parts of the data line to memory arrays at the write address is initiated. The write command is completed when write completion signals specifying the write address have been received from all of the memory arrays.

    Abstract translation: 一种存储器系统,其包括具有由可变写入时间表征的存储器单元的多个存储器阵列。 存储器系统还包括被配置为接收写入命令的存储器总线以及被配置为与存储器阵列进行通信的多个数据缓冲器。 存储器系统还包括配置为与存储器阵列通信以存储写入地址的地址缓冲器。 被配置为接收写入命令并将用写入命令接收的数据线分割成多个部件的机构也包括在存储器系统中。 数据线的部分存储在不同的数据缓冲器中,并且开始将写入地址的数据线的部分写入存储器阵列。 当从所有存储器阵列接收到指定写入地址的写入完成信号时,写入命令完成。

    MEMORY READING METHOD TAKING CARE OF RESISTANCE DRIFT EFFECTS
    14.
    发明申请
    MEMORY READING METHOD TAKING CARE OF RESISTANCE DRIFT EFFECTS 审中-公开
    记忆读取方法对电阻干扰的影响

    公开(公告)号:WO2010097302A1

    公开(公告)日:2010-09-02

    申请号:PCT/EP2010/051786

    申请日:2010-02-12

    Abstract: Techniques for reading phase change memory that mitigate resistance drift. One contemplated method includes apply a plurality of electrical input signals to the memory cell. The method includes measuring a plurality of electrical output signals from the memory cell resulting from the plurality of electrical input signals. The method includes calculating an invariant component of the plurality of electrical output signals dependent on the configuration of amorphous material in the memory cell. The method also includes determining a memory state of the memory cell based on the invariant component. In a preferred embodiment of the present invention, the method further includes mapping the plurality of electrical output signals to a measurements region of a plurality of measurements regions. The measurements regions correspond to memory states of the memory cell.

    Abstract translation: 读取相变存储器的技术,减轻电阻漂移。 一种预期的方法包括将多个电输入信号应用于存储器单元。 该方法包括从多个电输入信号测量来自存储器单元的多个电输出信号。 该方法包括根据存储单元中非晶材料的配置来计算多个电输出信号的不变分量。 该方法还包括基于不变分量来确定存储器单元的存储器状态。 在本发明的优选实施例中,该方法还包括将多个电输出信号映射到多个测量区域的测量区域。 测量区域对应于存储器单元的存储器状态。

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