Abstract:
A memory system that includes a plurality of memory arrays having memory cells characterized by a variable write time. The memory system also includes a memory bus configured to receive write commands, and a plurality of data buffers configured to communicate with the memory arrays. The memory system further includes an address buffer configured to communicate with the memory arrays to store the write addresses. A mechanism configured to receive a write command and to split a data line received with the write command into a number of parts is also included in the memory system. The parts of the data line are stored in different data buffers and the writing of the parts of the data line to memory arrays at the write address is initiated. The write command is completed when write completion signals specifying the write address have been received from all of the memory arrays.
Abstract:
Marking memory chips as faulty when a fault is detected in data from the memory chip. Upon detecting that a plurality of memory chips are faulty, determining which of a plurality of memory channels contains the faulty memory chips. Marking one of a plurality of memory channels as failing in response to determining that the number of failing memory chips has exceeded a threshold.
Abstract:
Providing homogeneous recovery in a redundant memory system that includes a memory controller, a plurality of memory channels in communication with the memory controller, an error detection code mechanism configured for detecting a failing memory channel, and an error recovery mechanism. The error recovery mechanism is configured for receiving notification of the failing memory channel, for blocking off new operations from starting on the memory channels, for completing any pending operations on the memory channels, for performing a recovery operation on the memory channels and for starting the new operations on at least a first subset of the memory channels. The memory system is capable of operating with the first subset of the memory channels.
Abstract:
Techniques for reading phase change memory that mitigate resistance drift. One contemplated method includes apply a plurality of electrical input signals to the memory cell. The method includes measuring a plurality of electrical output signals from the memory cell resulting from the plurality of electrical input signals. The method includes calculating an invariant component of the plurality of electrical output signals dependent on the configuration of amorphous material in the memory cell. The method also includes determining a memory state of the memory cell based on the invariant component. In a preferred embodiment of the present invention, the method further includes mapping the plurality of electrical output signals to a measurements region of a plurality of measurements regions. The measurements regions correspond to memory states of the memory cell.
Abstract:
A content addressable memory using encoded data words and search words, and techniques for operating such device. In one embodiment, the data word is transformed into a code word guaranteeing a mismatch of at least two code word bits of different binary values during the memory search operation when the data word does not match a search word. In another embodiment, the search word is transformed into a search code such that the Hamming distance between the code word and the search code is greater than a given threshold when there is a mismatch of at least one bit between the data word and the search word.
Abstract:
A system and method for error correction and detection in a memory system. The system includes a memory controller, a plurality of memory modules and a mechanism. The memory modules are in communication with the memory controller and with a plurality of memory devices. The mechanism detects that one of the memory modules has failed possibly coincident with a memory device failure on an other of the memory modules. The mechanism allows the memory system to continue to run unimpaired in the presence of the memory module failure and the memory device failure.