Abstract:
A flexible display device is disclosed. The flexible display device comprises: a display part; a sensing part for sensing bending of the flexible display device; and a controller for controlling the display part to display first content on a first screen of the display part, and display and reconfigure the first content on a second screen generated on an area of the display part based on the bending. [Reference numerals] (110) Display part; (120) Sensing part; (130) Control part
Abstract:
PURPOSE: A hyperbranched polymer with excellent heat resistance is provided to manufacture a fuel cell with improved lifetime property and cell properties. CONSTITUTION: A hyperbranched polymer is the product obtained through condensation polymerization of a composition for forming the hyperbranched polymer consisting of a diisocyanate-based compound represented by chemical formula 1 and a dihydroxy amine-based compound represented by chemical formula 2. In chemical formula 1, A is a substituted or unsubstituted C1-C30 alkylene group, substituted or unsubstituted C2-C30 alkenylene group, substituted or unsubstituted C2-C30 alkynylene group, substituted or unsubstituted C6-C30 arylene group, substituted or unsubstituted C2-C30 heteroarylene group, substituted or unsubstituted C4-C30 carbon ring group, or substituted or unsubstituted C6-C30 condensed polycyclic group.
Abstract:
PURPOSE: A method for forming a gate electrode of a flash memory device to improve a scattering degree of cells and prevent generation of polysilicon residues is provided to improve a scattering degree of threshold voltage characteristics of a memory cell transistor by forming uniformly a gate oxide layer on the first silicon layer pattern and an upper surface of a substrate. CONSTITUTION: A field oxide layer pattern(110) is formed on a semiconductor substrate(100). A nitride layer is formed on the semiconductor substrate and the field oxide layer pattern. A nitride layer spacer is formed by etching back the nitride layer. A gate oxide layer(114) is formed on a surface of the exposed semiconductor substrate. The first polysilicon layer pattern is formed on the nitride layer spacer and the gate oxide layer. A dielectric layer and the second polysilicon layer are formed on the first polysilicon layer pattern and the field oxide layer pattern. A gate electrode is formed by patterning the second polysilicon layer, the dielectric layer, and the first polysilicon layer pattern.
Abstract:
PURPOSE: A method for forming an insulating layer of a semiconductor device is provided to improve gap-filling property and to prevent attack of fluorine ions by forming the insulating layer using NF3. CONSTITUTION: A diffusion barrier layer(220) is formed on a semiconductor substrate(200) for preventing attacks of impurities into the substrate. An insulating layer is then formed on the diffusion barrier layer by using fluorine containing gas, such as NF3. At the time, a thermal oxide layer is used as the diffusion barrier layer(220).