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公开(公告)号：KR1020150057392A
公开(公告)日：2015-05-28
申请号：KR1020130140719
申请日：2013-11-19
Applicant: 전자부품연구원
IPC: G01R31/3183 , G01R31/317
Abstract: 본발명은반도체부품이장착된전자모듈의하드웨어안정성검증방법에관한것으로, 더욱상세하게는자동차나인공위성등의구동에구동에사용되는반도체부품이장착된전자모듈의하드웨어안정성검증방법에관한것이다. 이를위해본 발명의반도체부품이장착된전자모듈의하드웨어의안정성검증방법은선정된반도체부품에정전기, 전류, 전압중 적어도하나를인가하여상기반도체부품의전기적특성을변화하는단계, 전기적특성이변화된반도체부품을전자모듈의하드웨어에장착하는단계, 반도체부품이장착된전자모듈의하드웨어가정상적으로동작하는것을확인하는단계, 상기반도체부품이장착된전자모듈의하드웨어에설정된온도, 진동, EMI 중적어도하나의외부스트레스를인가하는단계, 상기외부스트레스가인가된전자모듈의하드웨어에서고장이발생하는지 여부를판단하는단계를포함한다.
Abstract translation: 本发明涉及安装有半导体部件的电子模块的硬件稳定性验证方法。 具体地，本发明涉及一种用于车辆和人造卫星操作的半导体部件的电子模块的硬件稳定性验证方法。 安装有半导体部件的电子模块的硬件稳定性验证方法包括：通过施加静电，电流和电压中的至少一种来改变选择的半导体部件的电性能的步骤; 将具有电性能的半导体部件安装到电子模块的硬件上的步骤; 检查安装半导体零件的电子模块的硬件正常运行的一个步骤; 将诸如振动，温度和EMI的外部应力源中的至少一种应用于安装有半导体部件的电子模块的硬件的步骤; 并确定应用于外部应激源的电子模块的硬件故障的步骤。
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Patent Agency Ranking
公开(公告)号：KR1020130076985A
公开(公告)日：2013-07-09
申请号：KR1020110145441
申请日：2011-12-29
Applicant: 전자부품연구원
Inventor： 천성일
IPC: G01M99/00 , H01L31/042
CPC classification number: Y02E10/50 , H02S50/10 , G01R31/2642
Abstract: PURPOSE: A lifetime testing method for a solar cell module is provided to establish a condition causing malfunction of components forming the solar cell module, thereby calculating failure ratios of the components and calculating the service time of the solar cell module base on the calculated. CONSTITUTION: A lifetime testing method for a solar cell module (100) is as follows. A failure ratio is calculated by exposing components of the solar cell module to a condition causing malfunction. The calculated failure ratio of the components is applied to a formula calculating a failure ratio of the solar cell module so that the failure ratio of the solar cell module is calculated. The components of the solar cell module are a back sheet (150), an EVA sheet, an electrode, and a ribbon wire. The back sheet and the EVA sheet are exposed to a condition causing dew condensation, so that a failure ratio which is the probability of separation is calculated. The ribbon wire and the electrode are applied to a heat-cycle test condition so that a failure ratio which is the probability of cracks is calculated.
Abstract translation: 目的：提供一种用于太阳能电池模块的寿命测试方法，以建立导致形成太阳能电池模块的部件故障的状况，由此计算部件的故障率并根据所计算的计算太阳能电池组件的使用时间。 构成：太阳能电池模块（100）的寿命试验方法如下。 通过将太阳能电池模块的部件暴露于导致故障的状态来计算故障率。 将计算出的成分的故障率应用于计算太阳能电池模块的故障率的公式，从而计算太阳能电池模块的故障率。 太阳能电池组件的组件是背板（150），EVA片，电极和带状线。 底片和EVA片暴露于导致结露的状态，从而计算作为分离概率的故障率。 将带状线和电极应用于热循环试验条件，从而计算出裂纹概率的故障率。
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公开(公告)号：KR101882106B1
公开(公告)日：2018-08-24
申请号：KR1020160176263
申请日：2016-12-22
Applicant: 전자부품연구원
IPC: H02S50/10 , H01L31/042 , G01R22/06
CPC classification number: Y02E10/50
Abstract: 보다정확한태양전지모듈발전량예측이가능하고, 이와함께열화율판단이가능한태양전지모듈발전량예측방법및 예측장치가제안된다. 본발명에따른태양전지모듈발전량예측방법은태양전지모듈로부터측정된일사량(A), 모듈온도(B) 및발전량(C)를포함하는측정데이터를얻는제1단계; 측정데이터중 제1구간에서얻은측정데이터로부터일사량(A1) 및모듈온도(B1)와발전량(C1)의상관관계를복수개획득하는제2단계; 제1구간에서획득한상관관계에따라제2구간에서측정된일사량(A2) 및모듈온도(B2)를이용하여예측된예측발전량(Cp)을획득하는제3단계; 제2구간에서측정된측정발전량(Cm2)과예측발전량(Cp)을비교하여상관관계중 가장정확한최적상관관계를획득하는제4단계; 및예측발전량(Cp) 중최적상관관계에따라예측된예측발전량(Cp)을선택하는제5단계;를포함한다.
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公开(公告)号：KR101831048B1
公开(公告)日：2018-02-21
申请号：KR1020160036027
申请日：2016-03-25
Applicant: 전자부품연구원
CPC classification number: Y02P70/521
Abstract: PID 시험과정을간략화할수 있고비용측면에서의효율성을향상시킬수 있으며, PID 특성시험을위해소요되는시간을크게단축하면서도 PID 특성을신뢰성있게시험할수 있는태양전지 PID 특성시험용시트및 그의제조방법이제안된다. 본발명에따른태양전지 PID 특성시험용시트는고분자수지층및 고분자수지층의적어도일면또는고분자수지층내에포함되는태양전지 PID 특성유발입자를포함한다.
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公开(公告)号：KR1020160122417A
公开(公告)日：2016-10-24
申请号：KR1020150052233
申请日：2015-04-14
Applicant: 전자부품연구원
Inventor： 천성일
Abstract: 본발명은레이저두께측정기를이용한태양전지모듈유지관리장치에관한것이다. 본발명은태양전지판의상부면에축적된이물질의두께를레이저를이용하여측정하는레이저두께측정기, 상기태양전지판의상부면을세척하는세척장치및 상기레이저두께측정기(200)로부터전송받은이물질두께가미리저장된기준두께를초과하는경우상기세척장치가가동되도록제어하는제어부를포함한다. 본발명에따르면, 태양전지판의표면에쌓이는이물질을레이저두께측정기를이용하여정밀하게측정하고, 이측정결과에따라태양전지판의세척시점을결정함으로써, 태양광발전효율이향상되고, 태양전지판의표면에쌓이는이물질의두께에따라변동되는태양광발전량을실시간연산하여원격지관리서버로제공함으로써, 태양광발전과관련한유지관리의효율성이향상되는효과가있다.
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公开(公告)号：KR1020140084606A
公开(公告)日：2014-07-07
申请号：KR1020120154249
申请日：2012-12-27
Applicant: 전자부품연구원
Abstract: The present invention relates to a potential fault risk evaluating system and, more particularly, to a system for checking a fault mode which may occur in an electronic system and its influence and preventing the mode before a product is launched. To achieve the purpose, in a potential fault risk evaluating system including a user terminal and a server providing the fault mode for a specific component requested by the user terminal, the server includes a bank storing information about the fault mode and fault mechanism corresponding to the fault mode, the fault mode is a state formally classifying a fault state including a disconnection and a short circuit, and the fault mechanism is a structure making a fault from physical, chemical, and mechanical causes.
Abstract translation: 本发明涉及一种潜在的故障风险评估系统，更具体地说，涉及一种用于检查可能在电子系统中发生的故障模式的系统及其影响并防止产品启动之前的模式。 为了实现该目的，在潜在的故障风险评估系统中，包括用户终端和为用户终端请求的特定组件提供故障模式的服务器，服务器包括存储关于故障模式和故障机制的信息的存储体 故障模式是故障状态，包括断线和短路故障状态，故障机制是从物理，化学和机械原因造成故障的一种结构。
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