METHOD OF DETERMINING THE CONTRIBUTION OF A PROCESSING APPARATUS TO A SUBSTRATE PARAMETER

    公开(公告)号:EP3650941A1

    公开(公告)日:2020-05-13

    申请号:EP18205693.7

    申请日:2018-11-12

    Inventor: ANUNCIADO, Roy

    Abstract: Disclosed is a method for determining a contribution of a processing apparatus to a fingerprint of a parameter across a first substrate, the method comprising: obtaining a delta image which relates to the difference between a first pupil image associated with inspection of a first feature on the substrate and a second pupil image associated with inspection of a second feature on the substrate, wherein the first and second features have different dose sensitivities; determining a rate of change of the difference in response to a variation of a dose used to form said first and second features; and determining the contribution using the determined rate of change and the delta image.

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