公开(公告)号：US20230086325A1

公开(公告)日：2023-03-23

申请号：US17849771

申请日：2022-06-27

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN ,  Ming-Yuan HUANG

IPC: G01N3/12 ,  G01N3/04 ,  G01N3/06 ,  H05K13/04

Abstract: The present invention relates to a quick release assembly for a pressing head and an electronic device testing apparatus having the same. The quick release assembly comprises an upper base, an actuator and a lower base. When the lower base is to be mounted on the upper base, the actuator drives a movable head to a first position; the movable head passes through an open slot of the lower base; then, the actuator drives the movable head to a second position so that the lower base is retained by the movable head. The open slot of the lower base is firstly fitted on the movable head of the actuator located on the upper base. At this time, the actuator is controlled to drive the movable head to the second position from the first position.

公开(公告)号：US20230086266A1

公开(公告)日：2023-03-23

申请号：US17822816

申请日：2022-08-29

Applicant: CHROMA ATE INC.

Inventor： Chin-Yi OUYANG ,  Chien-Ming CHEN

IPC: G01R31/28

Abstract: The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.

公开(公告)号：US20140103954A1

公开(公告)日：2014-04-17

申请号：US14048785

申请日：2013-10-08

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN ,  Herbert TSAI ,  Chin-Yi OU YANG

IPC: G01R31/26

CPC classification number: G01R31/2601 ,  G01R31/2887 ,  G01R31/2893

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.

Abstract translation: 具有用于测试半导体部件的旋转测试臂的测试系统包括传送装置，第一测试插座，第二测试插座，第一测试臂和第二测试臂。 第一测试插座和第二测试插座分别电连接到不同的测试信号，并对应于第一测试臂和第二测试臂。 第一测试臂和第二测试臂测试臂旋转操作以将半导体组件携带并放置到传输设备，第一测试插座和第二测试插座，从而提高测试时间。

公开(公告)号：US20230089716A1

公开(公告)日：2023-03-23

申请号：US17930082

申请日：2022-09-07

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN ,  Jui-Hsiung CHEN ,  Chi-Wei WANG

IPC: B65G47/90 ,  H01L21/673

Abstract: The present invention relates to a chip tray positioning device, which mainly comprises a frame body, a tray conveying module, a pulling module, a pushing module and a controller. The tray conveying module is disposed on the frame body, electrically connected to the controller and controlled to convey a chip tray from the start area to the end area. The pulling module and the pushing module are disposed on the frame body, electrically connected to the controller and controlled to cause the chip tray to be abutted against the end wall and the lateral wall of the frame body, thereby realizing the positioning of the chip tray and eliminating an error formed in the transfer process of the chip tray. In addition, the controller also controls the pushing module to knock the chip tray at a specific frequency so that the chip tray is vibrated.

公开(公告)号：US20230086540A1

公开(公告)日：2023-03-23

申请号：US17816086

申请日：2022-07-29

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN ,  Jui-Hsiung CHEN ,  Yi-Sheng XU

IPC: G01R31/28

Abstract: The present invention relates to an electronic device pick-and-place system and an electronic device testing apparatus having the same, comprising a plurality of pick-and-place heads, a plurality of negative pressure generators and an air pressure regulating valve. Each pick-and-place head has a pick-and-place port; the plurality of negative pressure generators are communicated with the plurality of pick-and-place ports of the plurality of pick-and-place heads respectively; an inlet end of the air pressure regulating valve is communicated with an air pressure source, and an outlet end of the air pressure regulating valve is communicated with the plurality of negative pressure generators; the air pressure regulating valve can be used to adjust the suction forces of the pick-and-place ports of the pick-and-place heads in a batch. Accordingly, the suction forces and blowing forces of the pick-and-place ports of the pick-and-place heads can be adjusted in a batch.

公开(公告)号：US20230022501A1

公开(公告)日：2023-01-26

申请号：US17834035

申请日：2022-06-07

Applicant: CHROMA ATE INC.

Inventor： Chin-Yi OUYANG ,  Chien-Ming CHEN ,  Wei-Cheng KUO ,  Xin-Yi WU ,  Iching TSAI

IPC: G01R31/28 ,  G01R1/04

Abstract: The present invention relates to a multistory electronic device testing apparatus, which mainly comprises a feeding and binning device, a multi-axis transfer device, a chip-testing device and a main controller. The feeding and binning device includes an upper module and a lower module. The chip-testing device includes a plurality of testing units arranged vertically. The main controller not only controls the feeding, binning and testing operations, but also controls the multi-axis transfer device to transfer an electronic device to be tested or a tested electronic device between the feeding and binning device and the chip-testing device. Accordingly, the three-dimensional arrangement of the feeding and binning module and the testing device is realized, and the accommodating capacity and the testing capacity for the electronic devices to be tested and the tested electronic devices can be increased.

公开(公告)号：US20210199690A1

公开(公告)日：2021-07-01

申请号：US17023445

申请日：2020-09-17

Applicant: Chroma Ate Inc.

Inventor： Chin-Yi OUYANG ,  Chien-Ming CHEN ,  Bo-An SU ,  Yu-Hsuen WANG

IPC: G01R1/04

Abstract: The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.

公开(公告)号：US20190172740A1

公开(公告)日：2019-06-06

申请号：US15903228

申请日：2018-02-23

Applicant: CHROMA ATE INC.

Inventor： Chi-Chen WU ,  Yun-Jui CHENG ,  Chien-Ming CHEN

IPC: H01L21/673 ,  G01R1/04 ,  H01R13/629 ,  B21D43/05 ,  H01L21/677 ,  H01L23/32 ,  B30B15/00

Abstract: A modular pressing device capable of generating stage downward forces is provided. The modular pressing device comprises a non-exchangeable pressing module and an exchangeable pressing module. The non-exchangeable pressing module includes a first downward force generating unit. The exchangeable pressing module includes a second downward force generating unit. The first downward force generating unit applies a first downward force to at least one of a testing seat and an electronic device through the exchangeable pressing module. The second downward force generating unit applies a second downward force to the electronic device. Thereby, the modular pressing device is capable to generate two different downward forces to reduce the downward surge force. In addition, as the exchangeable pressing module is worn, the exchangeable pressing module can be replaced quickly such that the maintenance cost can be effectively reduced and the stability of the apparatus can be enhanced.