Abstract:
Thermal management systems for semiconductor devices are provided. Embodiments of the invention provide two or more liquid cooling subsystems that are each capable of providing active cooling to one or more semiconductor devices, such as packaged processors. In operation, a first liquid cooling subsystem can provide active cooling to the semiconductor device(s) while the second cooling subsystem is circulating a heat transfer fluid within its own subsystem. The second liquid cooling subsystem can be then switched into operation and provides active cooling to the semiconductor device(s) while the first cooling subsystem is circulating heat transfer fluid within its own subsystem. In alternate embodiments, the heat transfer fluid remains in the subsystem, but does not circulate within the subsystem when the subsystem is not providing cooling to the semiconductor device(s). The subsystems comprise heat dissipation units. The switching between cooling systems allows the semiconductor device(s) to be maintained at a lower operating temperature than if switching between cooling subsystems were not employed.
Abstract:
The present disclosure provides an apparatus comprising a multi-die package substrate, a plurality of dies mounted on the multi-die package substrate, and a power management unit to execute thermal management firmware to manage temperatures of the plurality of dies. The plurality of dies comprises a first die and a second die. The first die comprises a first plurality of cores to execute instructions and process data, a first plurality of integrated voltage regulators, the first plurality of integrated voltage regulators associated with respective cores of the first plurality of cores, a shared cache coupled to the first plurality of cores, and a first plurality of temperature sensors associated with the first plurality of cores to generate first temperature measurement data. The second die coupled to the first die over a bi-directional interconnect comprises a second temperature sensor integral to the second die to generate second temperature measurement data. The power management unit is to periodically read temperature values from the plurality of dies in accordance with a specified time period, including temperature values from the first plurality of temperature sensors, the second temperature sensor, and additional temperature values from additional dies of the plurality of dies, and process the temperature values to determine a thermal management result, wherein processing the temperature values includes determining a maximum temperature value. A clock frequency of one or more of the plurality of dies is to be reduced based, at least in part, on the thermal management result.
Abstract:
Methods and systems may provide for identifying a thermal management setting in a computing system, and comparing the thermal management setting to valid configuration information. In addition, the thermal management setting may be modified if it does not comply with the valid configuration information, wherein the modification can cause the thermal management setting to comply with the valid configuration information. Additionally, a threat risk notification can be initiated in order to notify users of the non-compliance.
Abstract:
An apparatus is described. The apparatus includes a chamber to contain one or more electronic components, a first liquid and a second liquid. The electronics to be immersed in the second liquid. The first liquid having less density than the second liquid so that the first liquid floats above the second liquid. The first liquid to return second liquid molecules received from the second liquid back to the second liquid. The chamber comprising a first fluidic channel to drain the first liquid from the chamber while the second liquid is within the chamber.
Abstract:
In an embodiment, a processor includes at least one core and power management logic. The power management logic is to receive temperature data from a plurality of dies within a package that includes the processor, and determine a smallest temperature control margin of a plurality of temperature control margins. Each temperature control margin is to be determined based on a respective thermal control temperature associated with the die and also based on respective temperature data associated with the die. The power management logic is also to generate a thermal report that is to include the smallest temperature control margin, and to store the thermal report. Other embodiments are described and claimed.
Abstract:
Methods and systems may provide for identifying a thermal management setting in a computing system, and comparing the thermal management setting to valid configuration information. In addition, the thermal management setting may be modified if it does not comply with the valid configuration information, wherein the modification can cause the thermal management setting to comply with the valid configuration information. Additionally, a threat risk notification can be initiated in order to notify users of the non-compliance.
Abstract:
An apparatus is described. The apparatus includes a semiconductor chip package assembly having a spring element to be coupled between a first mechanical element and a second mechanical element to apply a loading force that pulls the first and second mechanical elements toward each other in the assembly's nominal assembled state. The first and second elements to support a cooling mass, the assembly further comprising a dampener that is coupled to at least one of the first and second mechanical elements to reduce oscillation amplitude of the cooling mass.