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公开(公告)号：DE10218706A1
公开(公告)日：2003-11-20
申请号：DE10218706
申请日：2002-04-26
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.
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公开(公告)号：GB2370441B
公开(公告)日：2003-11-19
申请号：GB0118350
申请日：2001-07-27
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: The present invention concerns a method, an arrangement, and a software program for controlling analytical and adjustment operations of a microscope. The arrangement has an electronic acquisition system ( 50 ) which converts the electrical signals coming from the detectors ( 19 ) into digital signals and preprocesses them. A PC ( 34 ) receives the digital signals from the electronic acquisition system ( 50 ) and identifies from the digital signals a graphical depiction. On a display ( 27 ), the graphical depiction is displayed and moreover the user is offered the opportunity to select adjustment functions. An input unit ( 33 ), with which selection of the adjustment functions and selection of at least one structure of interest can be achieved, is provided for selection. An electronic control system ( 67 ), with which the adjusting elements of the microscope can be controlled, is connected to the PC ( 34 ).
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公开(公告)号：DE10161613A1
公开(公告)日：2003-06-18
申请号：DE10161613
申请日：2001-12-15
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: Method involves transmission of the selected optical configuration to a control computer; recording of sample image with the scanning microscope; calculation of the Fourier transform for the image; determination of the optical transfer function that matches the selected optical configuration; comparison of the resolution limits of the image Fourier transform with the optical transfer function; and evaluation and display of the comparison result. Independent claims are made for a laser scanning microscope and software with a capability for self- monitoring of resolution limits.
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公开(公告)号：DE10227111B4
公开(公告)日：2007-09-27
申请号：DE10227111
申请日：2002-06-17
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: A spectral scanning microscope and a method for data acquisition using a spectral scanning microscope are disclosed. A computer system is provided that encompasses a memory and a database. In combination with the computer system and/or the database, a continuous wavelength subregion that serves to illuminate the specimen can be selected from a continuous wavelength region using the spectral selection means. Also in combination with the computer system together with the spectral selection means, a detection band can be selected from the detected light beam.
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公开(公告)号：DE60017240T2
公开(公告)日：2005-12-29
申请号：DE60017240
申请日：2000-11-11
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
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Patent Agency Ranking
公开(公告)号：DE102004020064A1
公开(公告)日：2005-11-17
申请号：DE102004020064
申请日：2004-04-24
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: A model reservoir (31) which is used to store an expected model of an object (15) is provided in a device, in particular in a microscope (10), which is used to capture static and functional data of an object (15). In order to visualise an image (35) of the object (15), image data of the object is sorted in a sorting device (33) according to the selected model such that the image (35) of the object (15) can be visualised.
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公开(公告)号：DE10361327A1
公开(公告)日：2005-07-21
申请号：DE10361327
申请日：2003-12-27
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
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公开(公告)号：DE10041165B4
公开(公告)日：2005-07-07
申请号：DE10041165
申请日：2000-08-21
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: The present invention concerns a method, an arrangement, and a software program for controlling analytical and adjustment operations of a microscope. The arrangement has an electronic acquisition system ( 50 ) which converts the electrical signals coming from the detectors ( 19 ) into digital signals and preprocesses them. A PC ( 34 ) receives the digital signals from the electronic acquisition system ( 50 ) and identifies from the digital signals a graphical depiction. On a display ( 27 ), the graphical depiction is displayed and moreover the user is offered the opportunity to select adjustment functions. An input unit ( 33 ), with which selection of the adjustment functions and selection of at least one structure of interest can be achieved, is provided for selection. An electronic control system ( 67 ), with which the adjusting elements of the microscope can be controlled, is connected to the PC ( 34 ).
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公开(公告)号：DE10338590A1
公开(公告)日：2005-03-17
申请号：DE10338590
申请日：2003-08-22
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: As a user works at a microscope, image details are constantly present in the user's field of view. The user usually analyzes those image details, marks them with a suitable graphical software mechanism on the screen, and selects a desired function. According to the present invention, the user is offered a user interface that is based substantially on the user's knowledge of the world. A suitable combination of automated adjustment operations, automatic and semiautomatic image analysis, appropriate visualization technology, and integration is automatically used for image depiction.
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20.发明专利
公开(公告)号：DE10234404A1
公开(公告)日：2004-02-12
申请号：DE10234404
申请日：2002-07-29
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: Monitoring procedure is activated by user pressing button (41) on screen (36) to start checking and monitoring of microscope image. Image information content is analyzed by processor (23) using predetermined ideal information content and predetermined variants as tolerance values. Correcting values are determined from the analysis and provided to actuators (38) to keep image inside tolerance limits. Warning is provided if information content varies out of the tolerance limits. Independent claim included for software on data carrier.
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