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1.发明专利Detector and method for detecting weak fluorescence radiation by microscope system 审中-公开用于通过微观系统检测弱荧光辐射的检测器和方法
公开(公告)号：JP2005055429A
公开(公告)日：2005-03-03
申请号：JP2004214313
申请日：2004-07-22
Inventor： OLSCHEWSKI FRANK
CPC classification number: G01N21/6458 , G01N21/64 , G02B21/16
Abstract: PROBLEM TO BE SOLVED: To highly reliably detect even a weak fluorescence signal, and to accurately count photons.
SOLUTION: This microscope system 100 is constituted to sense the individual photons of a detected light beam 17 each as one event 50, and to provide an output signal in the form of a characteristic function 52. A filter circuit 61 forms a new characteristic function 55 transmitted to a discriminator 60, from the characteristic function 52.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：为了高度可靠地检测弱荧光信号，并精确地计数光子。 解决方案：该显微镜系统100构成为检测光束17的各个光子作为一个事件50，并且以特征函数52的形式提供输出信号。滤波器电路61形成新的 特征功能55从特征功能52发送到鉴别器60.
版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：DE10108240B4
公开(公告)日：2018-06-28
申请号：DE10108240
申请日：2001-02-21
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK , NICKEL JOCHEN
Abstract: Verfahren zur Abbildung und Vermessung mikroskopischer dreidimensionaler Strukturen mit folgenden Schritten:• Darstellen eines Datensatzes in 3-dimensionaler Form auf einem einem Mikroskop zugeordneten Display (27);• Vorgeben mindestens einer beliebigen Schnittposition und beliebiger Drehwinkel;• Drehen der 3-dimensionalen Darstellung auf dem Display (27) bis eine in der 3-dimensionalen Form enthaltene Struktur eine einem Benutzer geeignet erscheinende Darstellung auf dem Display wiedergibt; und• Durchführen eines Analysevorgangs an der Struktur, dadurch gekennzeichnet, dass bei der Vorgabe des Drehwinkels eine Transformationsmatrix berechnet wird und bei Vorgabe der Schnittposition entsprechende Schnittebenen berechnet werden, wobei die entsprechenden Schnittebenen auf dem Display (27) dargestellt werden und die Darstellung der Schnittgeometrie in Form eines Drahtgittermodells aus einem äußeren und inneren Quader (60, 62) realisiert wird.
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公开(公告)号：DE10315592B4
公开(公告)日：2009-01-02
申请号：DE10315592
申请日：2003-04-05
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK , SEYFRIED VOLKER
Abstract: The method and the system simplify moving interactions by means of virtual reference subjects and flux-based coordinate transformations in order to generate a changeable frame of reference.
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公开(公告)号：DE502004004630D1
公开(公告)日：2007-09-27
申请号：DE502004004630
申请日：2004-11-19
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
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公开(公告)号：DE10315592A1
公开(公告)日：2004-10-28
申请号：DE10315592
申请日：2003-04-05
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK , SEYFRIED VOLKER
Abstract: The method and the system simplify moving interactions by means of virtual reference subjects and flux-based coordinate transformations in order to generate a changeable frame of reference.
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Patent Agency Ranking
公开(公告)号：DE10250100A1
公开(公告)日：2004-05-13
申请号：DE10250100
申请日：2002-10-28
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: A microscope system and a method that record spectra ( 60 a , 61 a , 62 a , 63 a, and 66 a) of the dyes present in the specimen ( 15 ) using an SP module ( 20 ) are disclosed. A transformation of the data of the ascertained spectra, and of the dye spectra ( 60 b , 61 b , 62 b , 63 b, and 66 b) stored in a database, is performed. The spectra are entered into a correspondingly into a divided transformation space. Allocation of the dye spectra ( 60 b , 61 b , 62 b , 63 b, and 66 b) to the measured spectra ( 60 a , 61 a , 62 a , 63 a, and 66 a) is accomplished by way of a comparison in the transformation space.
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公开(公告)号：DE10227111A1
公开(公告)日：2003-12-24
申请号：DE10227111
申请日：2002-06-17
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: A spectral scanning microscope and a method for data acquisition using a spectral scanning microscope are disclosed. A computer system is provided that encompasses a memory and a database. In combination with the computer system and/or the database, a continuous wavelength subregion that serves to illuminate the specimen can be selected from a continuous wavelength region using the spectral selection means. Also in combination with the computer system together with the spectral selection means, a detection band can be selected from the detected light beam.
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公开(公告)号：DE50304624D1
公开(公告)日：2006-09-28
申请号：DE50304624
申请日：2003-02-17
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
IPC: G02B21/00
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公开(公告)号：DE10335471A1
公开(公告)日：2005-03-03
申请号：DE10335471
申请日：2003-08-02
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: A detector for detecting weak fluorescent radiation with a microscope system (100) is disclosed. The microscope system (100) is configured in such a way that it senses individual photons of the detected light beam (17) each as one event (50), and furnishes therefrom an output signal in the form of a characteristic function (52). A filter circuit (61) forms, from the characteristic function (52), a new characteristic function (55) that is conveyed to a discriminator (60).
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公开(公告)号：DE10235656A1
公开(公告)日：2004-02-19
申请号：DE10235656
申请日：2002-08-02
Applicant: LEICA MICROSYSTEMS
Inventor： OLSCHEWSKI FRANK
Abstract: Microscopy method has the following steps: recording of an image and determination of a region of interest within a sample (15) shown within the image and; automatic recording of the whole marked sample spatial area. An Independent claim is made for a microscope arrangement for automatic three-dimensional (3D) recording of an area of interest within a sample, said arrangement comprising a microscope (13) with at least an objective and a detector unit (19) with which images of the sample (15) are recorded. A computer (23) has means (25) for automatic recording of a whole marked probe area. The computer controls image recording and microscope operation.
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