公开(公告)号：US11500189B2

公开(公告)日：2022-11-15

申请号：US17599646

申请日：2020-03-25

Applicant: Leica Microsystems CMS GmbH

Inventor： Alexander Weiss ,  Christian Schumann ,  Ronja Capellmann

IPC: G02B21/00 ,  G02B21/33 ,  G01N21/55 ,  G02B21/02 ,  G02B21/08 ,  G02B21/34

Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.

公开(公告)号：US20210349298A1

公开(公告)日：2021-11-11

申请号：US17285103

申请日：2019-10-18

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Alexander Weiss ,  Christian Schumann ,  Ronja Capellmann

IPC: G02B21/34 ,  G02B21/02 ,  G01B11/06

Abstract: A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.

公开(公告)号：US20190391380A1

公开(公告)日：2019-12-26

申请号：US16326937

申请日：2017-08-17

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Benjamin Deissler ,  Albrecht Weiss ,  Alexander Weiss

IPC: G02B21/36 ,  G06T5/20

Abstract: A method for imaging in a microscope with oblique illumination includes illuminating an object by an illumination beam path that is obliquely incident on an object plane of the microscope. A microscopic image of the object and a corresponding digital image signal are produced. The digital image signal is processed by digital image processing using a convolution kernel to increase contrast. An increased-contrast digital image is produced from the processed digital image signal.