-
公开(公告)号：US12038570B2
公开(公告)日：2024-07-16
申请号：US17369972
申请日：2021-07-08
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Christian Schulz , Alexander Weiss
CPC classification number: G02B21/33 , G02B21/0048 , G02B21/006
Abstract: A microscope includes: an optical system including an immersion objective for an immersion medium of a predetermined refractive index; an aperture stop; and a processor for setting an immersion-free imaging mode in which the optical system is operated without immersion medium. The processor controls the aperture stop in the immersion-free imaging mode to set a numerical aperture of the immersion objective to a reduced value which is lower than a nominal value of the numerical aperture, the numerical aperture being equal to the nominal value when the optical system is operated using the immersion medium without reducing the numerical aperture by the aperture stop. The processor controls the optical system in accordance with the reduced value of the numerical aperture in the immersion-free imaging mode to generate at least one image representing the overview image of the sample.
-
公开(公告)号：US11635608B2
公开(公告)日：2023-04-25
申请号：US17285481
申请日：2019-10-11
Applicant: Leica Microsystems CMS GmbH
Inventor： Alexander Weiss , Christian Schumann , Ronja Capellmann
Abstract: A method is useable for determining a refractive index of an optical medium in a microscope, which has an objective facing toward a sample chamber. The optical medium is one of two optical media, which border two opposing surfaces of a cover slip or object carrier in the sample chamber and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected at each of the interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering intensities by the position-sensitive detector; and determining the refractive index of the optical medium based on the registered intensities.
-
公开(公告)号：US10823951B2
公开(公告)日：2020-11-03
申请号：US16326937
申请日：2017-08-17
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Benjamin Deissler , Albrecht Weiss , Alexander Weiss
Abstract: A method for imaging in a microscope with oblique illumination includes illuminating an object by an illumination beam path that is obliquely incident on an object plane of the microscope. A microscopic image of the object and a corresponding digital image signal are produced. The digital image signal is processed by digital image processing using a convolution kernel to increase contrast. An increased-contrast digital image is produced from the processed digital image signal.
-
公开(公告)号：US20210341735A1
公开(公告)日：2021-11-04
申请号：US17285479
申请日：2019-10-11
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Ronja Capellmann , Alexander Weiss
Abstract: A method is useable for correcting a spherical aberration of a microscope having an objective and a cover slip or object carrier, the objective having a correction element for correcting the spherical aberration. The method includes: ascertaining, by the microscope, an index of refraction of an optical medium bordering the cover slip or object carrier and/or a thickness of the cover slip or object carrier along an optical axis of the objective, ascertaining the spherical aberration based on the index of refraction of the optical medium and/or the thickness of the cover slip or object carrier, and ascertaining, based on the spherical aberration, a positioning variable, by which the correction element is adjusted so that the spherical aberration is corrected.
-
公开(公告)号：US20210341721A1
公开(公告)日：2021-11-04
申请号：US17285481
申请日：2019-10-11
Applicant: Leica Microsystems CMS GmbH
Inventor： Alexander Weiss , Christian Schumann , Ronja Capellmann
Abstract: A method is useable for determining a refractive index of an optical medium in a microscope, which has an objective facing toward a sample chamber. The optical medium is one of two optical media, which border two opposing surfaces of a cover slip or object carrier in the sample chamber and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected at each of the interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering intensities by the position-sensitive detector; and determining the refractive index of the optical medium based on the registered intensities.
-
Patent Agency Ranking
公开(公告)号：US12099185B2
公开(公告)日：2024-09-24
申请号：US17285479
申请日：2019-10-11
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Ronja Capellmann , Alexander Weiss
CPC classification number: G02B27/0068 , G02B21/02
Abstract: A method is useable for correcting a spherical aberration of a microscope having an objective and a cover slip or object carrier, the objective having a correction element for correcting the spherical aberration. The method includes: ascertaining, by the microscope, an index of refraction of an optical medium bordering the cover slip or object carrier and/or a thickness of the cover slip or object carrier along an optical axis of the objective, ascertaining the spherical aberration based on the index of refraction of the optical medium and/or the thickness of the cover slip or object carrier, and ascertaining, based on the spherical aberration, a positioning variable, by which the correction element is adjusted so that the spherical aberration is corrected.
-
公开(公告)号：US11971531B2
公开(公告)日：2024-04-30
申请号：US17285103
申请日：2019-10-18
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Alexander Weiss , Christian Schumann , Ronja Capellmann
CPC classification number: G02B21/34 , G01B11/06 , G02B21/02 , G02B21/0088
Abstract: A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.
-
公开(公告)号：US11415789B2
公开(公告)日：2022-08-16
申请号：US17080874
申请日：2020-10-27
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Alexander Weiss , Andreas Lotter
Abstract: A microscope includes an optical imaging system with an adjustable corrector, a microscope drive, a position sensitive detector, an optical measuring system and a control unit. The optical measuring system configured to form first and second measuring light beams, direct the measuring light beams into an entrance pupil of the optical imaging system eccentrically with first and second distances to the optical axis thereof, receive first and second reflection light beams, and direct the reflection light beams onto the position sensitive detector. The control unit is configured to record positions of the reflection light beams on the position sensitive detector, and determine an aberration based on the recorded positions.
-
公开(公告)号：US20220206281A1
公开(公告)日：2022-06-30
申请号：US17599646
申请日：2020-03-25
Applicant: Leica Microsystems CMS GmbH
Inventor： Alexander Weiss , Christian Schumann , Ronja Capellmann
Abstract: A light sheet microscope includes a sample chamber in which a cover slip or slide is arrangeable, which has a surface that defines a partially reflective interface and which has a further surface that defines a further partially reflective interface. The two interfaces are arranged at different distances from an objective. The light sheet microscope further includes an optical system having the objective facing toward the cover slip or slide, an illumination apparatus, which is designed to generate a light sheet, a sensor, and a processor. The two interfaces are formed in that two optical media are applicable in the sample chamber. The light sheet microscope forms a measuring device for acquiring a measured variable. The sensor is designed to acquire the intensities and/or the incidence locations of the two reflection light beams.
-
公开(公告)号：US11216017B2
公开(公告)日：2022-01-04
申请号：US16835449
申请日：2020-03-31
Applicant: Leica Microsystems CMS GmbH
Inventor： Alexander Weiss , Sebastian Hitzler , Christian Schumann
Abstract: A feed device for an immersion medium for use with an objective enabling a specimen to be imaged microscopically includes a cap fitted releasably or fixedly to the objective and delimiting a receptacle space for the immersion medium. The cap has an exit opening aligned with an optical element of the objective facing the specimen. The immersion medium held in the receptacle space is feedable through the exit opening to a target space situated between the optical element of the objective and the specimen. A sensor is integrated in the cap and has an electrode structure configured to detect an amount of the immersion medium fed through the exit opening to the target space. The electrode structure at least partly encloses the exit opening and has a spatial detection region extending away from the exit opening in a radial direction.
-
-
-
-
-
-
-
-
-
Search Results
13
records
(took 0.026 seconds)
