Abstract:
An integrated semiconductor apparatus (300) (such as, but not limited to, a radio frequency power device) is comprised of a plurality of active device cells (302, 303), a plurality of temperature detectors (304, 305), and a controller (308). The active device cells are preferably each comprised of a plurality of active devices having a common signal input and a common signal output. The temperature detectors are preferably configured and arranged such that each of the temperature detectors detects a temperature indicator (such as infrared radiation) as corresponds to at least one of the active device cells but not, at least in substantial measure, other of the active device cells. The controller preferably operably couples to these temperature detectors and receives their detected output and generates control signals that operate on the inputs to the active device cells in a manner that changes the relative active device cell temperatures.
Abstract:
In a hybrid matrix amplifier array (100), a configurable digital transform matrix (116) is initialize with a matrix of transform coefficients. A plurality of digital input signals (M1-M4) are received at inputs of the configurable digital transform matrix (116). The plurality of digital input signals are transformed to produce a plurality of transform digital signals (A1-A4) using the matrix of transform coefficients. The plurality of transform digital signals are converted to a plurality of transformed analoged signals (206) to produce a plurality of transformed analog signals. The transformed analog signals are amplified (104, 208) to produce amplified transformed signals. Finally, the amplified transformed signals are inverse transformed (102, 210) to produce output signals that correspond to a respective digital input signal (M1-M4). Upon sensing a failure in an amplifier array (104,126) a controller (128) recalls matrix transform coefficients from a memory (130) and write and reconfigures the digital transform matrix (116) to minimize the effects of the amplifier failure at the hybrid matrix amplifier outputs (132).
Abstract:
In a hybrid matrix amplifier array (100), a configurable digital transform matrix (116) is initialize with a matrix of transform coefficients. A plurality of digital input signals (M1-M4) are received at inputs of the configurable digital transform matrix (116). The plurality of digital input signals are transformed to produce a plurality of transform digital signals (A1-A4) using the matrix of transform coefficients. The plurality of transform digital signals are converted to a plurality of transformed analoged signals (206) to produce a plurality of transformed analog signals. The transformed analog signals are amplified (104, 208) to produce amplified transformed signals. Finally, the amplified transformed signals are inverse transformed (102, 210) to produce output signals that correspond to a respective digital input signal (M1-M4). Upon sensing a failure in an amplifier array (104,126) a controller (128) recalls matrix transform coefficients from a memory (130) and write and reconfigures the digital transform matrix (116) to minimize the effects of the amplifier failure at the hybrid matrix amplifier outputs (132).
Abstract:
An apparatus (100) utilizes a shift register (107) to select which of multiple synthesizers (115, 117) is to receive programming information. This allows multiple synthesizers (115, 117) to be programmed based on input from a single programing line group (102). The number of devices that can be programmed is limited by the number of parallel outputs available from the shift register (107).