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公开(公告)号:US20180059269A1
公开(公告)日:2018-03-01
申请号:US15591165
申请日:2017-05-10
Applicant: Nuctech Company Limited
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/36
Abstract: The present disclosure provides an apparatus for processing signals for a plurality of energy regions, and a system and method for detecting radiation of a plurality of energy regions. The apparatus for processing signals for a plurality of energy regions may comprise: a first processor, configured to receive a signal from a detector and process the received signal to generate a gated signal, wherein a turn-on period of the gated signal represents magnitude of the received signal; and a second processor, configured to receive the gated signal from the first processor, and determine one of the plurality of energy regions to which the received signal belongs according to the turn-on period of the gated signal, so as to count signals within the determined energy region.
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公开(公告)号:US20180059265A1
公开(公告)日:2018-03-01
申请号:US15606394
申请日:2017-05-26
Applicant: NUCTECH COMPANY LIMITED
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/0296 , H01L31/08 , H01L31/18
CPC classification number: G01T1/247 , G01T1/241 , G01T1/2928 , H01L31/0296 , H01L31/085 , H01L31/1832 , H04N5/378 , H04N5/379
Abstract: A semiconductor detector and a packaging method thereof. The semiconductor detector includes: a cathode circuit board including a read out chip, a high voltage side top layer of the cathode circuit board, a bottom connection layer of the cathode circuit board and a dielectric filled between the high voltage side top layer and the bottom connection layer, wherein the high voltage side top layer is connected to the bottom connection layer through a via hole; and a detector crystal including a crystal body, an anode and a cathode, the anode is connected to the read out chip of the cathode circuit board, the high voltage side top layer is connected to an input terminal of the semiconductor detector and the bottom connection layer directly contacts the cathode of the detector crystal to connect the cathode to the cathode circuit board.
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公开(公告)号:US20180059264A1
公开(公告)日:2018-03-01
申请号:US15602478
申请日:2017-05-23
Applicant: Nuctech Company Limited
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
CPC classification number: G01T1/241 , G06T7/11 , G06T7/70 , G06T2207/10116
Abstract: The disclosure provides a detector, and a detecting system and method for dividing energy regions intelligently. The detecting method may comprise: collecting, by a detector, rays transmitted through a detected object and generating a detection signal according to the rays; wherein each column of pixels of the detector comprises one class-A electrode and a plurality of class-B electrodes, and the class-A electrode and the class-B electrodes are arranged sequentially in a moving direction of the detected object, such that the rays transmitted through the detected object firstly enter into the class-A electrode and then into the class-B electrodes; obtaining image data of the detected object based on the detection signal corresponding to the class-A electrode, and estimating a material component of the detected object based on the image data; adjusting one or more thresholds for dividing the energy regions according to the estimated material component; and determining energy regions to which the detection signal corresponding to the class-B electrodes belongs, according to the adjusted one or more thresholds, and calculating a number of signals in each energy region, so as to obtain the image data of the detected object and determine components of the detected object accurately.
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公开(公告)号:US20180059261A1
公开(公告)日:2018-03-01
申请号:US15606071
申请日:2017-05-26
Applicant: Nuctech Company Limited
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/119 , H01L31/0296 , H01L31/02 , H05K1/11 , H05K1/02 , H05K1/18
CPC classification number: G01T1/24 , G01T1/241 , H01L31/02005 , H01L31/0224 , H01L31/02966 , H01L31/115 , H01L31/119 , H05K1/0233 , H05K1/028 , H05K1/115 , H05K1/181 , H05K2201/10151 , H05K2201/10287 , H05K2201/10522
Abstract: The present disclosure provides a semiconductor detector. The semiconductor detector comprises: a detector crystal including a crystal body, an anode and a cathode; a field enhance electrode for applying a voltage to the detector crystal; an insulating material disposed between the field enhanced electrode and a surface of the detector crystal. The semiconductor detector further comprises a field enhanced electrode circuit board having a bottom connection layer in contact with the surface of the detector crystal and a top layer opposite to the bottom connection layer, wherein the top layer is connected to a high voltage input terminal of the semiconductor detector, and an insulating material is provided between the bottom connection layer and the detector surface of the detector crystal.
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公开(公告)号:US11112528B2
公开(公告)日:2021-09-07
申请号:US16314093
申请日:2017-09-12
Applicant: Nuctech Company Limited
Inventor: Guangming Xu , Bicheng Liu , Ziran Zhao , Jianping Gu , Qiang Li , Lan Zhang
IPC: G01V5/00 , G01N23/087 , G01R23/18
Abstract: The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue. Compared with the conventional dual-energy X-ray system, the multi-spectrum imaging can significantly improve the system's ability to identify substances in theory, especially in the field of security applications. The improvement of substance identification is important for contraband inspection, such as, drugs, explosives.
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公开(公告)号:US10670743B2
公开(公告)日:2020-06-02
申请号:US15606394
申请日:2017-05-26
Applicant: NUCTECH COMPANY LIMITED
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
Abstract: A semiconductor detector and a packaging method thereof. The semiconductor detector includes: a cathode circuit board including a read out chip, a high voltage side top layer of the cathode circuit board, a bottom connection layer of the cathode circuit board and a dielectric filled between the high voltage side top layer and the bottom connection layer, wherein the high voltage side top layer is connected to the bottom connection layer through a via hole; and a detector crystal including a crystal body, an anode and a cathode, the anode is connected to the read out chip of the cathode circuit board, the high voltage side top layer is connected to an input terminal of the semiconductor detector and the bottom connection layer directly contacts the cathode of the detector crystal to connect the cathode to the cathode circuit board.
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公开(公告)号:US10388818B2
公开(公告)日:2019-08-20
申请号:US15625473
申请日:2017-06-16
Applicant: NUCTECH COMPANY LIMITED
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: H01L31/118 , G01T1/24 , G01T1/02 , H01L27/144 , H01L31/0224 , H01L31/028 , H01L31/0296 , H01L31/0304 , H01L31/032
Abstract: There is provided a semiconductor detector. According to an embodiment, the semiconductor detector may include a semiconductor detection material including a first side and a second side opposite to each other. One of the first side and the second side is a ray incident side that receives incident rays. The detector may further include a plurality of pixel cathodes disposed on the first side and a plurality of pixel anodes disposed on the second side. The pixel anodes and the pixel cathodes correspond to each other one by one. The detector may further include a barrier electrode disposed on a periphery of respective one of the pixel cathodes or pixel anodes on the ray incident side. According to the embodiment of the present disclosure, it is possible to effectively suppress charge sharing between the pixels and thus to improve an imaging resolution of the detector.
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公开(公告)号:US20190197721A1
公开(公告)日:2019-06-27
申请号:US16226645
申请日:2018-12-20
Applicant: NUCTECH COMPANY LIMITED
Inventor: Bicheng Liu , Haoran Zhang , Guangming Xu , Qi Wang , Qiangqiang Zhu , Yuan Wo
CPC classification number: G06T7/70 , G01V5/0016 , G06T15/005 , G06T19/006 , G06T2200/04
Abstract: The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.
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公开(公告)号:US20180156741A1
公开(公告)日:2018-06-07
申请号:US15716921
申请日:2017-09-27
Applicant: Nuctech Company Limited , Tsinghua University
Inventor: Kejun Kang , Jianping Cheng , Zhiqiang Chen , Ziran Zhao , Junli Li , Xuewu Wang , Zhi Zeng , Ming Zeng , Yi Wang , Qingjun Zhang , Jianping Gu , Xi Yi , Bicheng Liu , Guangming Xu , Yongqiang Wang
CPC classification number: G01N23/04 , G01N23/046 , G01N23/06 , G01N23/20008 , G01N2223/304 , G01N2223/33 , G01N2223/401 , G01N2223/419 , G01N2223/652 , G01V5/0016 , G01V5/0025 , G01V5/0091
Abstract: Inspection devices and inspection methods are disclosed. The inspection method includes: performing X-ray scanning on an object being inspected so as to generate an image of the object being inspected; dividing the image of the object being inspected to determine at least one region of interest; detecting interaction between a cosmic ray and the region of interest to obtain a detection value; calculating a scattering characteristic value and/or an absorption characteristic value of the cosmic ray in the region of interest based on size information of the region of interest and the detection value; and discriminating a material attribute of the region of interest by means of the scattering characteristic value and/or the absorption characteristic value. With the above technical solutions, inspection accuracy and inspection efficiency may be improved.
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