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公开(公告)号：CA2087360C
公开(公告)日：2005-04-12
申请号：CA2087360
申请日：1993-01-15
Applicant: PERKIN ELMER CORP
Inventor： TRACY DAVID H , GANZ ALAN M , HOULT ROBERT A
Abstract: A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.
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公开(公告)号：CA2087821C
公开(公告)日：2002-11-26
申请号：CA2087821
申请日：1993-01-21
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H
Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non- vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.
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公开(公告)号：AT198511T
公开(公告)日：2001-01-15
申请号：AT95917064
申请日：1995-04-19
Applicant: PERKIN ELMER CORP
Inventor： WOUDENBERG TIMOTHY M , BODNER KEVIN S , CONNELL CHARLES R , GANZ ALAN M , MCBRIDE LINCOLN J , SAVIANO PAUL G , SHIGEURA JOHN , TRACY DAVID H , YOUNG EUGENE F , LEE LINDA G
IPC: C12N15/09 , C12P19/34 , C12Q1/68 , C12Q1/6818 , C12Q1/6851 , C12Q1/686 , G01N21/03 , G01N21/64 , G01N21/75 , G01N21/78 , G01N33/50 , G01N33/58
Abstract: An apparatus is provided which includes a sample holder for holding a reaction chamber which includes an optical interface, a fiber optic cable for delivering an excitation beam to a sample housed within the reaction chamber and for receiving light emitted by the sample, and a lens co-axially disposed with the fiber optic cable and positioned outside the reaction chamber for focusing the excitation beam through the optical interface and within a volume of the sample and for collecting and transmitting to the fiber optic cable light emitted within the volume of the sample.
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公开(公告)号：DE69309504T2
公开(公告)日：1997-11-06
申请号：DE69309504
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H
Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.
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公开(公告)号：DE69309504D1
公开(公告)日：1997-05-15
申请号：DE69309504
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H
Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.
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Patent Agency Ranking
公开(公告)号：CA2159830A1
公开(公告)日：1995-10-30
申请号：CA2159830
申请日：1995-04-19
Applicant: PERKIN ELMER CORP
Inventor： WOUDENBERG TIMOTHY M , BODNER KEVIN S , CONNELL CHARLES R , GANZ ALAN M , MCBRIDE LINCOLN J , SAVIANO PAUL G , SHIGEURA JOHN , TRACY DAVID H , YOUNG EUGENE F , LEE LINDA G
IPC: C12N15/09 , C12P19/34 , C12Q1/68 , C12Q1/6818 , C12Q1/6851 , C12Q1/686 , G01N21/03 , G01N21/64 , G01N21/75 , G01N21/78 , G01N33/50 , G01N33/58 , G01J3/28 , C12M1/34 , C12M1/40 , G01N21/77
Abstract: A system is provided for carrying out real time fluorescence-based measurements of nucleic acid amplification products. In a preferred embodiment of the invention, an excitation beam is focused into a reaction mixture through a surface, the reaction mixture containing: (i) a first fluorescent indicator capable of generating a first fluorescent signal whose intensity is proportional to the amount of an amplification product in the volume of the reaction mixture illuminated by the excitation beam and (ii) a second fluorescent indicator homogeneously distributed throughout the reaction mixture capable of generating a second fluorescent signal proportional to the volume of reaction mixture illuminated by the excitation beam. Preferably, the excitation beam is focused into the reaction mixture by a lens through a portion of a wall of a closed reaction chamber containing the reaction mixture. The same lens is used to collect the first and second fluorescent signals generated by the first and second fluorescent indicators, respectively, in response to the excitation beam. The ratio of the fluorescent intensities of the first and second fluorescent signals provides a stable quantitative indicator of the amount of amplification product synthesized in the course of the amplification reaction.
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公开(公告)号：DE69333054D1
公开(公告)日：2003-07-24
申请号：DE69333054
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H , HOULT ROBERT A
Abstract: A method of establishing a precision wavelength point in a spectrometric instrument with a calibration source of a spectral peak of precisely identified wavelength and a nominal calibration of spectral wavelength versus spectral locations. A calibration profile representative of the at least one spectral peak is produced from which a centroid wavelength of the calibration profile with respect to the spectral locations is estimated. The calibration profile is reversed about the centroid wavelength to create a reversed profile. A combined profile is produced by addition. The calibration data are fitted to the combined profile to determine an offset between the estimated centroid wavelength and the primary spectral peak, whereby the offset defines the primary peak location with respect to the spectral locations.
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公开(公告)号：AU698953B2
公开(公告)日：1998-11-12
申请号：AU2389695
申请日：1995-04-19
Applicant: PERKIN ELMER CORP
Inventor： WOUDENBERG TIMOTHY M , BODNER KEVIN S , CONNELL CHARLES R , GANZ ALAN M , MCBRIDE LINCOLN J , SAVIANO PAUL G , SHIGEURA JOHN , TRACY DAVID H , YOUNG EUGENE F , LEE LINDA G
IPC: C12N15/09 , C12P19/34 , C12Q1/68 , C12Q1/6818 , C12Q1/6851 , C12Q1/686 , G01N21/03 , G01N21/64 , G01N21/75 , G01N21/78 , G01N33/50 , G01N33/58
Abstract: An apparatus is provided which includes a sample holder for holding a reaction chamber which includes an optical interface, a fiber optic cable for delivering an excitation beam to a sample housed within the reaction chamber and for receiving light emitted by the sample, and a lens co-axially disposed with the fiber optic cable and positioned outside the reaction chamber for focusing the excitation beam through the optical interface and within a volume of the sample and for collecting and transmitting to the fiber optic cable light emitted within the volume of the sample.
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公开(公告)号：DE69412221D1
公开(公告)日：1998-09-10
申请号：DE69412221
申请日：1994-12-15
Applicant: PERKIN ELMER CORP
Inventor： CAHILL JERRY E , GANZ ALAN M , SAVIANO PAUL , TRACY DAVID , WANG YONGDON
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公开(公告)号：DE69315607D1
公开(公告)日：1998-01-22
申请号：DE69315607
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H , HOULT ROBERT A
Abstract: A method of establishing a precision wavelength point in a spectrometric instrument with a calibration source of a spectral peak of precisely identified wavelength and a nominal calibration of spectral wavelength versus spectral locations. A calibration profile representative of the at least one spectral peak is produced from which a centroid wavelength of the calibration profile with respect to the spectral locations is estimated. The calibration profile is reversed about the centroid wavelength to create a reversed profile. A combined profile is produced by addition. The calibration data are fitted to the combined profile to determine an offset between the estimated centroid wavelength and the primary spectral peak, whereby the offset defines the primary peak location with respect to the spectral locations.
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