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公开(公告)号：JPH10206235A
公开(公告)日：1998-08-07
申请号：JP35355097
申请日：1997-12-22
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , WANG YONGDONG , TRACY DAVID H , HOULT ROBERT A , CAHILL JERRY E , HUPPLER DAVID A
Abstract: PROBLEM TO BE SOLVED: To generate standardized spectral information by detecting spectral beams so as to generate signal data representing the spectral beams and computing in accordance with spectral information representing a sample. SOLUTION: A spectrum means 14 is comprised of a light interference system which is combined with a means applying a Fourier transform computing. Accordingly, an interference pattern can be converted to spectral data. A spectrum acts to a sample 18, whereby spectral beam 20 are generated. The spectral beams 20 respond to the sample 18 are therefore characterize the sample spectrally. A detector 24 receives the spectral beams and generates signal data on an electric wire 26. The data represent a beam spectrum changed by the sample. A computer 28, upon receiving a data signal, calculates spectral information corresponding to the sample.
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公开(公告)号：JPH10206236A
公开(公告)日：1998-08-07
申请号：JP35374897
申请日：1997-12-22
Applicant: PERKIN ELMER CORP
Inventor： WANG YONGDONG , GANZ ALAN M , TRACY DAVID H , HUPPLER DAVID A , COATES JOHN P
Abstract: PROBLEM TO BE SOLVED: To compare FTIR spectral information with dispersion spectrometric spectral information, by applying a conversion factor to a first spectral information and comparing converted information with a second spectral information. SOLUTION: A sample space 20 for a liquid is set in a probe. A light 22 passes the liquid and is partly filtered selectively. The filtered light 22 is brought into a second optical fiber 24. A bypass filter 26 having an optical switching 28 bypasses the liquid passing the fiber, whereby a standard for comparison of the filtered light is formed. The optical fiber 24 guides the light to a spectrometer 32 with the utilization of a concave holographic grating 33. The grating 33 disperses a light 35 to a detector 11. A signal showing a spectrum from the detector 11 is supplied to a computer 37, stored in a disk or the like memory and processed.
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公开(公告)号：JPH10142054A
公开(公告)日：1998-05-29
申请号：JP27105097
申请日：1997-10-03
Applicant: PERKIN ELMER CORP
Inventor： TRACY DAVID H , GANZ ALAN M , WANG YONGDONG , HUPPLER DAVID A , IVALDI JUAN C , CHRISTOPHER B HANNA
Abstract: PROBLEM TO BE SOLVED: To correctly measure a spectrum by obtaining a spectral shift to an optionally selected sub array position from a difference of offset functions calculated from two offset data of different times. SOLUTION: A first spectral data 40 is collected 42 to a first time 43 of a drift standard. Peak points are compared 46 at a zero position, thereby obtaining a first offset data 50. A first offset function 52 as an xy coordinate function of a sub array is obtained from the data 50 by a computer 54. Thereafter, a second spectral data 56 is collected 42 to a second time 60, and a second offset function 64 is calculated. A difference function 68 of an xy positions in the interval is obtained from a difference 66 of the offset functions 52 and 64, which is interpolated at 70, whereby a spectral shift 72 is obtained. The spectral shift 72 is applied to an optional sample data 76 collected to an optional time 80, and standardized to an optional base time, e.g. the first time 43.
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公开(公告)号：DE69333054T2
公开(公告)日：2004-04-29
申请号：DE69333054
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H , HOULT ROBERT A
Abstract: A method of establishing a precision wavelength point in a spectrometric instrument with a calibration source of a spectral peak of precisely identified wavelength and a nominal calibration of spectral wavelength versus spectral locations. A calibration profile representative of the at least one spectral peak is produced from which a centroid wavelength of the calibration profile with respect to the spectral locations is estimated. The calibration profile is reversed about the centroid wavelength to create a reversed profile. A combined profile is produced by addition. The calibration data are fitted to the combined profile to determine an offset between the estimated centroid wavelength and the primary spectral peak, whereby the offset defines the primary peak location with respect to the spectral locations.
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公开(公告)号：DE69315607T2
公开(公告)日：1998-04-30
申请号：DE69315607
申请日：1993-01-07
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H , HOULT ROBERT A
Abstract: A method of establishing a precision wavelength point in a spectrometric instrument with a calibration source of a spectral peak of precisely identified wavelength and a nominal calibration of spectral wavelength versus spectral locations. A calibration profile representative of the at least one spectral peak is produced from which a centroid wavelength of the calibration profile with respect to the spectral locations is estimated. The calibration profile is reversed about the centroid wavelength to create a reversed profile. A combined profile is produced by addition. The calibration data are fitted to the combined profile to determine an offset between the estimated centroid wavelength and the primary spectral peak, whereby the offset defines the primary peak location with respect to the spectral locations.
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Patent Agency Ranking
公开(公告)号：DE69729360T2
公开(公告)日：2005-06-16
申请号：DE69729360
申请日：1997-10-02
Applicant: PERKIN ELMER CORP
Inventor： TRACY DAVID H , GANZ ALAN M , WANG YONGDONG , HUPPLER DAVID A , IVALDI JUAN C
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公开(公告)号：DE69729360D1
公开(公告)日：2004-07-08
申请号：DE69729360
申请日：1997-10-02
Applicant: PERKIN ELMER CORP
Inventor： TRACY DAVID H , GANZ ALAN M , WANG YONGDONG , HUPPLER DAVID A , IVALDI JUAN C
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公开(公告)号：DE69412221T2
公开(公告)日：1998-12-10
申请号：DE69412221
申请日：1994-12-15
Applicant: PERKIN ELMER CORP
Inventor： CAHILL JERRY E , GANZ ALAN M , SAVIANO PAUL , TRACY DAVID , WANG YONGDON
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公开(公告)号：CA2087360A1
公开(公告)日：1993-08-13
申请号：CA2087360
申请日：1993-01-15
Applicant: PERKIN ELMER CORP
Inventor： TRACY DAVID H , GANZ ALAN M , HOULT ROBERT A
Abstract: ID-4045 A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.
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公开(公告)号：CA2455136C
公开(公告)日：2009-04-14
申请号：CA2455136
申请日：1993-01-15
Applicant: PERKIN ELMER CORP
Inventor： GANZ ALAN M , TRACY DAVID H , HOULT ROBERT A
Abstract: A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.
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