Abstract:
A sense-amplifier circuit (1) for a non-volatile memory is provided with: a comparison stage (15, 16a-16b) that executes, during a comparison step, a comparison between a cell current (I cell ) that flows in a memory cell (2) and through an associated bitline (BL), and a reference current (I raf ), for supplying an output signal (Out sense) indicating the state of the memory cell (2); and a precharging stage (18a-18b, 22a-22b), which supplies, during a precharging step prior to the comparison step, a precharging current to the bitline (BL) so as to charge a capacitance thereof; the comparison stage is formed by a first comparison transistor (16a) and by a second comparison transistor (16b), which are coupled in current-mirror configuration respectively to a first differential output (Out1) and to a second differential output (Out2), through which a biasing current flows. The precharging stage diverts, during the precharging step, the biasing current towards the bitline (BL) as precharging current, and allows, during the comparison step, passage of part of the biasing current towards the first differential output, enabling operation of the current mirror.
Abstract:
Described herein is a method for biasing an EEPROM array (10) formed by memory cells (2) arranged in rows and columns, each operatively coupled to a first switch (3) and to a second switch (4) and having a first current-conduction terminal selectively connectable to a bitline (BL) through the first switch (3) and a control terminal selectively connectable to a gate-control line (Cgt) through the second switch (4), wherein associated to each row are a first wordline (WL seltr) and a second wordline (WL bsw), connected to the control terminals of the first switches (3) and, respectively, of the second switches (4) operatively coupled to the memory cells (2) of the same row. The method envisages selecting at least one memory cell (2) for a given memory operation, biasing the first wordline and the second wordline of the row associated thereto, and in particular biasing the first and second wordlines with voltages different from one another and having values that are higher than an internal supply voltage (V DD ) and are a function of the given memory operation.