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公开(公告)号：US09766179B2
公开(公告)日：2017-09-19
申请号：US15053946
申请日：2016-02-25
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
CPC classification number: G01N21/4738 , G01N21/95 , G01N2021/4764 , G01N2021/4792 , G01N2201/0635 , G01N2201/0683
Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
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公开(公告)号：US20170030831A1
公开(公告)日：2017-02-02
申请号：US15293000
申请日：2016-10-13
Applicant: Seagate Technology LLC
Inventor： David M. Tung , Joachim W. Ahner
CPC classification number: G01N21/4738 , G01N21/8806 , G01N21/95 , G01N2021/8809 , G01N2201/062 , G01N2201/12
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article at a number of azimuthal angles; and a processing element configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为以多个方位角将光子发射到制品的表面上的光子发射器; 以及处理元件，被配置为处理对应于从物品的表面特征散射的光子的光子检测器阵列信号，并从对应于从表面散射的光子的光子检测器阵列信号生成物品的一个或多个表面特征图 文章的特点。
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公开(公告)号：US09513215B2
公开(公告)日：2016-12-06
申请号：US14096001
申请日：2013-12-03
Applicant: Seagate Technology LLC
Inventor： David M. Tung , Joachim W. Ahner
CPC classification number: G01N21/4738 , G01N21/8806 , G01N21/95 , G01N2021/8809 , G01N2201/062 , G01N2201/12
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article at a number of azimuthal angles; and a processing element configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为以多个方位角将光子发射到制品表面上的光子发射器; 以及处理元件，被配置为处理对应于从物品的表面特征散射的光子的光子检测器阵列信号，并从对应于从表面散射的光子的光子检测器阵列信号生成物品的一个或多个表面特征图 文章的特点。
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公开(公告)号：US09488594B2
公开(公告)日：2016-11-08
申请号：US15004730
申请日：2016-01-22
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung
Abstract: Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature.
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公开(公告)号：US20150285743A1
公开(公告)日：2015-10-08
申请号：US14280343
申请日：2014-05-16
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： David M. Tung , Joachim Walter Ahner
CPC classification number: G11B20/1816 , G01B9/02 , G01B2290/70 , G01N21/21 , G01N21/55 , G01N21/8806 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8848 , G01N2201/06113
Abstract: Provided herein is an apparatus including an imaging lens assembly configured to collect reflected light from a surface of an article; an image sensor configured to receive reflected light from the imaging lens assembly, wherein the imaging lens assembly and the image sensor are each arranged at different angles for focusing on substantially an entire surface of an article; and a processing means configured to process signals from the image sensor corresponding to polarized reflected light and subsequently generate one or more features maps.
Abstract translation: 本文提供了一种装置，包括：成像透镜组件，被配置为收集来自物品表面的反射光; 被配置为接收来自所述成像透镜组件的反射光的图像传感器，其中所述成像透镜组件和所述图像传感器各自以不同的角度布置，用于聚焦在制品的基本上整个表面上; 以及处理装置，被配置为处理来自与偏振反射光相对应的图像传感器的信号，并且随后生成一个或多个特征图。
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Patent Agency Ranking
公开(公告)号：US20140354982A1
公开(公告)日：2014-12-04
申请号：US14193808
申请日：2014-02-28
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Joachim Walter Ahner , David M. Tung , Stephen Keith McLaurin
IPC: G01N21/94
CPC classification number: G01N21/8806 , G01N21/4738 , G01N21/95
Abstract: Provided herein are apparatuses and methods related thereto, wherein at least one apparatus includes: a photon emitting means configured to emit photons, wherein the photons are scattered from magnetic features of an article; a photon detector array configured to receive scattered photons; and a processing means configured to differentiate the magnetic features from the scattered photons.
Abstract translation: 这里提供的装置和方法，其中至少一个装置包括：配置成发射光子的光子发射装置，其中光子从物品的磁特征散射; 构造成接收散射光子的光子检测器阵列; 以及配置成将磁特征与散射光子区分开的处理装置。
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公开(公告)号：US20140098370A1
公开(公告)日：2014-04-10
申请号：US14046596
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/55
CPC classification number: G01N21/55 , G01N21/4738 , G01N21/95
Abstract: Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
Abstract translation: 本文提供了一种装置，其包括被配置为从制品的周边缘将光子发射到制品中的第一光子发射器，以及被配置为检测从制品的特征散射的光子的光子检测器阵列。
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公开(公告)号：US09863892B2
公开(公告)日：2018-01-09
申请号：US15166091
申请日：2016-05-26
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/00 , G01N21/94 , G01N21/95 , G01N21/956
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
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公开(公告)号：US09377394B2
公开(公告)日：2016-06-28
申请号：US14032186
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.
Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置，其被配置用于处理光子检测器阵列信号，所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面，其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。
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公开(公告)号：US20160169802A1
公开(公告)日：2016-06-16
申请号：US15047563
申请日：2016-02-18
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/6456 , G01N21/47 , G01N21/63 , G01N21/64 , G01N21/8851 , G01N21/94 , G01N21/95 , G01N21/9501 , G01N21/9506 , G01N2021/8864 , G01N2201/06153 , G01N2201/0683
Abstract: Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article.
Abstract translation: 本文提供了一种装置，包括被配置为将光子发射到物品的表面上的光子发射器，被配置为从制品的表面特征接收光子的光子检测器阵列; 以及处理装置，其被配置用于处理对应于从所述表面特征散射的光子和从所述表面特征发荧光的光子的光子检测器阵列信号，其中所述处理装置还被配置为对所述物品的表面特征进行分类。
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