INSTRUMENT FOR MEASURING PHYSICAL PROPERTY OF SAMPLE
    11.
    发明申请
    INSTRUMENT FOR MEASURING PHYSICAL PROPERTY OF SAMPLE 审中-公开
    用于测量样品物理性质的仪器

    公开(公告)号:WO01061323A1

    公开(公告)日:2001-08-23

    申请号:PCT/JP2000/004033

    申请日:2000-06-21

    Abstract: An instrument for measuring a physical property of a sample by optically detecting the response of the sample to projection of an ultra-short optical pulse. A Sagnac common-path optical interferometer for measuring a physical property at a vertical input angle is provided. The interferometer is a one-arm Sagnac type and has two beam splitters. A sample (14) is excited by an ultra-short optical pulse, and changes of the strength and phase of the optical beam caused by the excitation are measured. Therefore it is possible to measure a physical property in a wide range such as the thickness of an object, a sound speed, or a thermal property.

    Abstract translation: 通过光学检测样品对超短光脉冲的投影的响应来测量样品的物理性质的仪器。 提供了用于测量垂直输入角的物理特性的Sagnac公共路径光学干涉仪。 干涉仪是单臂Sagnac型,并具有两个分束器。 样品(14)被超短光脉冲激发,并且测量由激发引起的光束的强度和相位的变化。 因此,可以在物体的厚度,声速或热性质等广泛范围内测量物理性质。

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